公开(公告)号：US20230006088A1

公开(公告)日：2023-01-05

申请号：US17782242

申请日：2020-12-10

Applicant: Brolis Sensor Technology, UAB

Inventor： Kristijonas Vizbaras ,  Augustinas Vizbaras

IPC: H01L31/173 ,  H01L31/0232 ,  H01L33/58 ,  H01S5/026

Abstract: A solid-state device, and use and formation thereof. The device includes a light emitter (102) that emits light with abeam propagation direction and includes an emitter epitaxial layer stack (940); a light routing medium (103) in optical communication with the light emitter; and a light detector (104) in optical communication with the light routing medium, which detects light emitted by the light emitter and includes a detector epitaxial stack (945). The light emitter and detector are monolithically formed on a semiconductor substrate. The emitter and detector epitaxial layer stacks include different pluralities of layers of a single epitaxial layer stack. The beam propagation direction is either in-plane with the single epitaxial layer stack and the light detector detects light out of plane with the single epitaxial layer stack, or out of plane with the single epitaxial layer stack and the light detector detects light in plane with the single epitaxial layer stack.

公开(公告)号：US20210351567A1

公开(公告)日：2021-11-11

申请号：US17370668

申请日：2021-07-08

Applicant: Brolis Sensor Technology, UAB

Inventor： Augustinas Vizbaras ,  Ieva Simonyte ,  Andreas De Groote ,  Kristijonas Vizbaras

IPC: H01S5/0687 ,  G01N21/39 ,  H01S5/14

Abstract: Methods for wavelength determination of widely tunable lasers and systems thereof may be implemented with solid-state laser based photonic systems based on photonic integrated circuit technology as well as discrete table top systems such as widely-tunable external cavity lasers and systems. The methods allow integrated wavelength control enabling immediate system wavelength calibration without the need for external wavelength monitoring instruments. Wavelength determination is achieved using a monolithic solid-state based optical cavity with a well-defined transmission or reflection function acting as a wavelength etalon. The solid-state etalon may be used with a wavelength shift tracking component, e.g., a non-balanced interferometer, to calibrate the entire laser emission tuning curve within one wavelength sweep. The method is particularly useful for integrated photonic systems based on Vernier-filter mechanism where the starting wavelength is not known a-priori, or for compact widely tunable external cavity lasers eliminating the need for calibration of wavelength via external instruments.

公开(公告)号：US20210021099A1

公开(公告)日：2021-01-21

申请号：US16965867

申请日：2019-01-31

Applicant: Brolis Sensor Technology, UAB

Inventor： Augustinas Vizbaras ,  Ieva Simonyte ,  Andreas De Groote ,  Kristijonas Vizbaras

IPC: H01S5/0687 ,  H01S5/14 ,  G01N21/39

Abstract: Methods for wavelength determination of widely tunable lasers and systems thereof may be implemented with solid-state laser based photonic systems based on photonic integrated circuit technology as well as discrete table top systems such as widely-tunable external cavity lasers and systems. The methods allow integrated wavelength control enabling immediate system wavelength calibration without the need for external wavelength monitoring instruments. Wavelength determination is achieved using a monolithic solid-state based optical cavity with a well-defined transmission or reflection function acting as a wavelength etalon. The solid-state etalon may be used with a wavelength shift tracking component, e.g., a non-balanced interferometer, to calibrate the entire laser emission tuning curve within one wavelength sweep. The method is particularly useful for integrated photonic systems based on Vernier-filter mechanism where the starting wavelength is not known a-priori, or for compact widely tunable external cavity lasers eliminating the need for calibration of wavelength via external instruments.