公开(公告)号：US06775809B1

公开(公告)日：2004-08-10

申请号：US10097133

申请日：2002-03-14

Applicant: Frank Lambrecht ,  Ching-Chao Huang ,  Michael Fox

Inventor： Frank Lambrecht ,  Ching-Chao Huang ,  Michael Fox

IPC: G06F1750

CPC classification number: G01R31/31924 ,  G01R31/31937 ,  H04L1/24

Abstract: A technique for determining performance characteristics of electronic systems is disclosed. In one exemplary embodiment, the technique may be realized as a method for determining performance characteristics of electronic systems. The method includes the steps of measuring a first response on a transmission medium from a falling edge transmitted on the transmission medium, and measuring a second response on the transmission medium from a rising edge transmitted on the transmission medium. The method also includes the step of determining worst case bit patterns for transmission on the transmission medium based upon the first response and the second response.

Abstract translation: 公开了一种用于确定电子系统性能特征的技术。 在一个示例性实施例中，该技术可以被实现为用于确定电子系统的性能特征的方法。 该方法包括以下步骤：从传输介质上发送的下降沿测量传输介质上的第一响应，以及从传输介质上发送的上升沿测量传输介质上的第二响应。 该方法还包括基于第一响应和第二响应来确定在传输介质上传输的最差情况比特模式的步骤。