Adjustable length Rogowski coil measurement device with non-contact voltage measurement

    公开(公告)号:US10746767B2

    公开(公告)日:2020-08-18

    申请号:US15975187

    申请日:2018-05-09

    申请人: Fluke Corporation

    摘要: Systems and methods are provided for measuring electrical parameters in an insulated conductor without requiring a galvanic connection. A non-contact, electrical parameter sensor probe may be operative to measure both current and voltage in an insulated conductor. The sensor probe includes a body, a Rogowski coil coupled to the body, and a non-contact voltage sensor coupled to the body or the Rogowski coil. The size of the loop of the Rogowski coil is selectively adjustable, such that the loop may be tightened around the conductor under test until the conductor is positioned adjacent a portion of the body or Rogowski coil that includes the non-contact voltage sensor. Measured electrical parameters may be provided to a user, e.g., via a display, or may be transmitted to one or more external systems via a suitable wired or wireless connection.

    Sensor subsystems for non-contact voltage measurement devices

    公开(公告)号:US10605832B2

    公开(公告)日:2020-03-31

    申请号:US15695998

    申请日:2017-09-05

    申请人: Fluke Corporation

    摘要: Systems and methods for measuring alternating current (AC) voltage of an insulated conductor are provided, without requiring a galvanic connection between the conductor and a test electrode. A non-galvanic contact voltage measurement device includes a conductive sensor, an internal ground guard, and a reference shield. A reference voltage source is electrically coupleable between the guard and the reference shield to generate an AC reference voltage which causes a reference current to pass through the conductive sensor. Sensor subsystems may be arranged in layers (e.g., stacked layers, nested layers, or components) of conductors and insulators. The sensor subsystems may be packaged as formed sheets, flexible circuits, integrated circuit (IC) chips, nested components, printed circuit boards (PCBs), etc. The sensor subsystems may be electrically coupled to suitable processing or control circuitry of a non-contact voltage measurement device to allow for measurement of voltages in insulated conductors.