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公开(公告)号:US09841509B2
公开(公告)日:2017-12-12
申请号:US14949972
申请日:2015-11-24
Applicant: General Electric Company
Inventor: Jie Jerry Liu , Kwang Hyup An , Gautam Parthasarathy
CPC classification number: G01T1/2018 , H01L27/308 , H01L51/0002 , H01L51/0026 , H01L51/441
Abstract: A process for fabricating an organic x-ray detector is presented. The process includes forming a multilayered structure that includes disposing a first electrode layer on a thin film transistor array, disposing an organic absorber layer on the first electrode layer, and disposing a second electrode layer on the organic absorber layer. The process further includes disposing a scintillator layer on the second electrode layer and thermally treating the multilayered structure after the step of disposing the second electrode layer. An organic x-ray detector fabricated by the process is further presented. An x-ray system including the organic x-ray detector is also presented.
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公开(公告)号:US20170301735A1
公开(公告)日:2017-10-19
申请号:US15132542
申请日:2016-04-19
Applicant: General Electric Company
Inventor: Jie Jerry Liu , Gautam Parthasarathy , Ri-An Zhao , Kwang Hyup An
CPC classification number: H01L27/308 , G01T1/2018 , H01L51/0046
Abstract: An organic charge integrating device is presented. The organic charge integrating device includes a thin film transistor (TFT) array, a first electrode layer disposed on the TFT array, an organic photoactive layer disposed on the first electrode layer, and a second electrode layer disposed on the organic photoactive layer. The organic photoactive layer has a thickness in a range from about 700 nanometers to about 3 microns. An organic x-ray detector is presented. An imaging system including the organic x-ray detector is also presented.
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13.
公开(公告)号:US20170148853A1
公开(公告)日:2017-05-25
申请号:US15084855
申请日:2016-03-30
Applicant: General Electric Company
Inventor: Jie Jerry Liu , Gautam Parthasarathy , Ri-An Zhao , Kwang Hyup An
CPC classification number: H01L27/308 , G01T1/2018 , H01L51/0026 , H01L51/0035 , H01L51/0036 , H01L51/0046 , H01L51/0047 , H01L51/4253 , H01L51/44 , H01L51/448 , H01L2251/301 , H01L2251/303
Abstract: A process for fabricating an organic x-ray detector is presented. The process includes forming a layered structure that includes disposing a first electrode layer on a thin film transistor array, disposing an organic photoactive layer on the first electrode layer and disposing a second electrode layer on the organic photoactive layer. The organic photoactive layer includes a fullerene or a fullerene derivative having a carbon cluster of at least 70 carbon atoms. The process further includes disposing a scintillator layer on the layered structure at a temperature greater than 50 degrees Celsius. An organic x-ray detector fabricated by the process is further presented. An x-ray system including the organic x-ray detector is also presented.
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公开(公告)号:US20210186442A1
公开(公告)日:2021-06-24
申请号:US16725532
申请日:2019-12-23
Applicant: General Electric Company
Inventor: Gautam Parthasarathy , Bruno Kristiaan Bernard De Man , Ronald Andrew von Jako , Ross Christopher Stalter
IPC: A61B6/00
Abstract: Various embodiments discussed herein utilize a C-shaped imager to provide images with a minimal footprint, such as may be suitable in a surgical context. In addition the systems and methods described herein allow for suitable angular (i.e., azimuthal) scan coverage about the patient. To provide real-time 3D imaging, multiple X-ray tubes or a distributed X-ray source may be employed, coupled with an extended detector or multiple detectors. To reconstruct high-quality volumes, in some implementations reconstruction techniques may be employed that utilize pre-operative (pre-op) computed tomography (CT), magnetic resonance imaging (MRI), ultrasound (U/S), or other suitable modality images or data as prior information.
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15.
公开(公告)号:US09929216B2
公开(公告)日:2018-03-27
申请号:US15084855
申请日:2016-03-30
Applicant: General Electric Company
Inventor: Jie Jerry Liu , Gautam Parthasarathy , Ri-An Zhao , Kwang Hyup An
CPC classification number: H01L27/308 , G01T1/2018 , H01L51/0026 , H01L51/0035 , H01L51/0036 , H01L51/0046 , H01L51/0047 , H01L51/4253 , H01L51/44 , H01L51/448 , H01L2251/301 , H01L2251/303
Abstract: A process for fabricating an organic x-ray detector is presented. The process includes forming a layered structure that includes disposing a first electrode layer on a thin film transistor array, disposing an organic photoactive layer on the first electrode layer and disposing a second electrode layer on the organic photoactive layer. The organic photoactive layer includes a fullerene or a fullerene derivative having a carbon cluster of at least 70 carbon atoms. The process further includes disposing a scintillator layer on the layered structure at a temperature greater than 50 degrees Celsius. An organic x-ray detector fabricated by the process is further presented. An x-ray system including the organic x-ray detector is also presented.
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公开(公告)号:US09515276B2
公开(公告)日:2016-12-06
申请号:US14474761
申请日:2014-09-02
Applicant: General Electric Company
Inventor: Kwang Hyup An , Gautam Parthasarathy , Jie Jerry Liu , James Edward Pickett
CPC classification number: H01L51/448 , G01N23/04 , G01T1/2018 , G01T1/202 , H01L27/307 , H01L27/308 , H01L51/0032 , H01L51/0034 , H01L51/0036 , H01L51/0039 , H01L51/0043 , H01L51/005 , H01L51/4253 , H01L51/5259
Abstract: An organic x-ray detector is presented. The organic x-ray detector includes a layered structure. The layered structure includes a thin-film transistor (TFT) array disposed on a substrate, an organic photodiode disposed on the TFT array, and a scintillator layer disposed on the organic photodiode. The organic x-ray detector further includes an encapsulation cover at least partially encapsulating the layered structure; and an oxygen getter layer disposed between the organic photodiode and the encapsulation cover, wherein the oxygen getter layer includes an ether-containing material. X-ray system including the organic x-ray detector is also presented.
Abstract translation: 提出了一种有机x射线探测器。 有机X射线检测器包括层状结构。 分层结构包括设置在基板上的薄膜晶体管(TFT)阵列,设置在TFT阵列上的有机光电二极管和设置在有机光电二极管上的闪烁体层。 有机x射线检测器还包括至少部分地封装分层结构的封装盖; 以及设置在有机光电二极管和封装盖之间的吸氧剂层,其中吸氧剂层包括含醚材料。 还介绍了包括有机x射线探测器在内的X射线系统。
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公开(公告)号:US09362341B2
公开(公告)日:2016-06-07
申请号:US14100419
申请日:2013-12-09
Applicant: GENERAL ELECTRIC COMPANY
Inventor: Aaron Judy Couture , Gautam Parthasarathy
IPC: H01L21/00 , H01L27/30 , H01L27/146 , G01T1/20 , H01L51/44
CPC classification number: H01L27/308 , G01T1/2018 , H01L27/14663 , H01L51/441 , H01L51/447
Abstract: There is set forth herein a method for making an apparatus for use in X ray detection comprising fabricating a first layered assembly 10 comprising a scintillator and first electrode layer, and laminating the first layered assembly 10 onto a second layered assembly 20 wherein the second layered assembly has a thin film transistor (TFT) array, wherein the TFT array includes a second electrode layer, wherein at least one of the first layered assembly and the second layered assembly includes an organic photodiode (OPD) absorber layer and wherein the laminating is absent use of an adhesive.
Abstract translation: 这里提出了一种用于制造用于X射线检测的装置的方法,包括制造包括闪烁体和第一电极层的第一层状组件10,并将第一层状组件10层压到第二层状组件20上,其中第二分层组件 具有薄膜晶体管(TFT)阵列,其中所述TFT阵列包括第二电极层,其中所述第一层状组件和所述第二层叠组件中的至少一个包括有机光电二极管(OPD)吸收层,并且其中所述层叠不存在 的粘合剂。
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