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    SYSTEMS AND METHODS FOR METAL ARTIFACT REDUCTION
    12.
    发明申请
    SYSTEMS AND METHODS FOR METAL ARTIFACT REDUCTION 有权
    金属制品减少的系统和方法

    公开(公告)号：US20160117850A1

    公开(公告)日：2016-04-28

    申请号：US14920991

    申请日：2015-10-23

    Applicant: GENERAL ELECTRIC COMPANY

    Inventor： Yannan Jin ,  Bruno Kristiaan Bernard De Man ,  Ge Wang ,  Yan Xi

    IPC: G06T11/00 ,  G06T5/00 ,  A61B6/00

    CPC classification number: A61B6/5258 ,  A61B6/03 ,  A61B6/482 ,  A61B6/5205 ,  G06T5/005 ,  G06T5/50 ,  G06T11/005 ,  G06T2207/10081 ,  G06T2207/10144 ,  G06T2207/20221 ,  G06T2207/30004 ,  G06T2211/408

    Abstract: A method includes receiving, with at least one processor, a first projection dataset corresponding to X-rays at a first energy level projected towards a subject at a first set of view angles and receiving, with the at least one processor, a second projection dataset corresponding to X-rays at a second energy level projected towards the subject at a second set of view angles. The method further includes identifying, with the at least one processor, a metal trace from at least one of the first projection dataset and the second projection dataset. Moreover, the method includes converting, with the at least one processor, at least a portion of the first projection dataset to a pseudo dataset at the second energy level. The method also includes generating, with the at least one processor, a final image of the subject based on the second projection dataset, the pseudo dataset, and the metal trace.

    Abstract translation: 一种方法包括：利用至少一个处理器，以在第一组视角投射到对象的第一能级对应于对应于X射线的第一投影数据集，并且与所述至少一个处理器接收第二投影数据集 对应于在第二组视角下朝向对象投射的第二能级的X射线。 该方法还包括用至少一个处理器识别来自第一投影数据集和第二投影数据集中的至少一个的金属迹线。 而且，该方法包括：利用至少一个处理器将第一投影数据集的至少一部分转换为第二能级的伪数据集。 该方法还包括基于第二投影数据集，伪数据集和金属迹线与至少一个处理器生成对象的最终图像。

    SYSTEMS AND METHODS FOR CORRECTING DETECTOR ERRORS IN COMPUTED TOMOGRAPHY IMAGING
    13.
    发明申请
    SYSTEMS AND METHODS FOR CORRECTING DETECTOR ERRORS IN COMPUTED TOMOGRAPHY IMAGING 有权
    用于校正计算机图像成像中检测器错误的系统和方法

    公开(公告)号：US20150182176A1

    公开(公告)日：2015-07-02

    申请号：US14145018

    申请日：2013-12-31

    Applicant: General Electric Company

    Inventor： Yannan Jin ,  Peter Michael Edic ,  Vladimir A. Lobastov ,  Hewei Gao ,  Geng Fu

    IPC: A61B6/00 ,  A61B6/03

    CPC classification number: A61B6/4241 ,  A61B6/032 ,  A61B6/482 ,  G01T1/171

    Abstract: A system includes an energy-discriminating, photon-counting X-ray detector, comprising a plurality of detector cells providing measurements corresponding to at least two energy bins and being adapted to produce projection data in response to X-ray photons that reach the X-ray detector and to produce an electrical signal having a recorded count for the energy bins and a total energy intensity. The system also includes data processing circuitry adapted to receive the electrical signal from one or more of the plurality of detector cells, to generate a simulated count rate for each of the energy bins by using the total energy intensity in a detector pile-up model, to determine a set of energy intensity dependent material decomposition vectors, and, for the projection data measured by one or more of the plurality of detector cells, to perform material decomposition by modeling the simulated count rate for each of the energy bins and utilizing a material decomposition vector selected from the set of energy intensity dependent material decomposition vectors and corresponding to the measured energy intensity from one or more of the plurality of detector cells.

    Abstract translation: 一种系统包括能量鉴别光子计数X射线检测器，其包括多个检测器单元，其提供对应于至少两个能量箱的测量值，并且适于响应于到达X射线的X射线光子产生投影数据， 并且产生具有用于能量箱的记录计数和总能量强度的电信号。 该系统还包括适于从多个检测器单元中的一个或多个接收电信号的数据处理电路，通过使用检测器堆积模型中的总能量强度来产生每个能量箱的模拟计数率， 以确定一组依赖于能量强度的材料分解向量，并且对于由多个检测器单元中的一个或多个检测器单元测量的投影数据，通过对每个能量箱的模拟计数率进行建模并利用材料来执行材料分解 所述分解矢量选自所述一组能量强度依赖材料分解向量，并对应于来自所述多个检测器单元中的一个或多个的所测量的能量强度。

    SYSTEM AND METHOD FOR MULTI-MATERIAL CORRECTION OF IMAGE DATA
    14.
    发明申请
    SYSTEM AND METHOD FOR MULTI-MATERIAL CORRECTION OF IMAGE DATA 审中-公开
    用于图像数据的多重校正的系统和方法

    公开(公告)号：US20140328448A1

    公开(公告)日：2014-11-06

    申请号：US14332020

    申请日：2014-07-15

    Applicant: General Electric Company

    Inventor： Xiaoye Wu ,  Jiang Hsieh ,  Paavana Sainath ,  Dan Xu ,  Yannan Jin ,  Girijesh Kumar Yadava ,  Adam Israel Cohen ,  Hewei Gao

    IPC: A61B6/03

    CPC classification number: A61B6/03 ,  G06T7/0012 ,  G06T11/008 ,  G06T2211/408

    Abstract: A method is provided. The method includes acquiring projection data of an object from a plurality of pixels, reconstructing the acquired projection data from the plurality of pixels into a reconstructed image, performing material characterization and decomposition of an image volume of the reconstructed image to reduce a number of materials analyzed in the image volume to two basis materials. The method also includes generating a re-mapped image volume for at least one basis material of the two basis materials, and performing forward projection on at least the re-mapped image volume for the at least one basis material to produce a material-based projection. The method further includes generating multi-material corrected projections based on the material-based projection and a total projection attenuated by the object, which represents both of the two basis materials, wherein the multi-material corrected projections include linearized projections.

    Abstract translation: 提供了一种方法。 该方法包括从多个像素获取对象的投影数据，将所获取的投影数据从多个像素重建成重建图像，对重建图像执行材料表征和分解，以减少分析的材料数量 在图像体积为两个基础材料。 所述方法还包括为所述两种基础材料的至少一种基础材料生成重新映射的图像体积，以及针对所述至少一种基础材料至少对所述重新映射的图像体积执行向前投影以产生基于材料的投影 。 该方法还包括基于基于材料的投影和由对象衰减的总投影来生成多材料校正投影，其表示两种基础材料，其中多材料校正投影包括线性化投影。

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