Semiconductor device and method for fabricating the same
    11.
    发明授权
    Semiconductor device and method for fabricating the same 有权
    半导体装置及其制造方法

    公开(公告)号:US06589827B2

    公开(公告)日:2003-07-08

    申请号:US09911618

    申请日:2001-07-25

    IPC分类号: H01L2184

    摘要: A silicon germanium layer is deposited over a semiconductor substrate with a gate insulating film interposed between the substrate and the silicon germanium layer. Then, an upper silicon layer in an amorphous state is deposited on the silicon germanium layer. Thereafter, a gate electrode is formed by patterning the silicon germanium layer and the upper silicon layer.

    摘要翻译: 在半导体衬底上沉积硅锗层,其中栅极绝缘膜置于衬底和硅锗层之间。 然后,将非晶态的上硅层沉积在硅锗层上。 此后,通过图案化硅锗层和上硅层形成栅电极。

    Method and apparatus for measuring concentration by light projection
    12.
    发明授权
    Method and apparatus for measuring concentration by light projection 失效
    用于通过光投影测量浓度的方法和装置

    公开(公告)号:US6147749A

    公开(公告)日:2000-11-14

    申请号:US817085

    申请日:1997-04-29

    摘要: To project measuring light with good reproducibility onto the measuring part of a measured object so that measurement conditions can always be constant. An optical measuring apparatus is equipped with a spectroscopic analyzer that detects the spectral intensity of the reflected light of measuring light projected onto a human hand. Spectroscopic analyzer moves in the direction" of the X-axis, Y axis, and Z axis, and around the Z axis by a moving mechanism. During the registration of the measuring part of the human hand, a CCD camera takes a picture of the human hand, and the operator selects a part having a feature from the pattern of the taken image. During the spectrometry, the CCD camera again takes a picture of the human hand. The optical measuring apparatus then detects the registered feature part on the currently taken image, moves spectroscopic analyzer by moving mechanism, and projects measuring light onto the registered feature part.

    摘要翻译: PCT No.PCT / JP96 / 02223 Sec。 371日期1997年4月7日 102(e)日期1997年4月7日PCT 1996年8月7日PCT PCT。 出版物WO97 / 06423 日期1997年2月20日将测量对象的重复性重新测量投影到测量对象的测量部位,以便测量条件始终保持不变。 光学测量装置配备有光谱分析仪,其检测投射到人手上的测量光的反射光的光谱强度。 光谱分析仪通过移动机构沿X轴,Y轴和Z轴方向移动,Z轴周围移动,在人体测量部位的配准期间,CCD摄像机拍摄 人手,操作员从拍摄图像的图案中选择具有特征的部分,在光谱测定期间,CCD照相机再次拍摄人手的照片,然后光学测量装置检测当前拍摄的注册特征部分 图像,通过移动机构移动光谱分析仪,并将测量光投射到注册的特征部分上。