Method, apparatus, and computer program for evaluating noise immunity of a semiconductor device
    11.
    发明授权
    Method, apparatus, and computer program for evaluating noise immunity of a semiconductor device 有权
    用于评估半导体器件的抗噪声性的方法,装置和计算机程序

    公开(公告)号:US07233889B2

    公开(公告)日:2007-06-19

    申请号:US10278507

    申请日:2002-10-23

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5036

    摘要: A method of evaluating noise immunity of a semiconductor device is provided. An actual circuit including the semiconductor device is represented by an equivalent circuit which has a target equivalent circuit, a noise source equivalent circuit, and an external equivalent circuit connected in parallel. The target equivalent circuit represents the semiconductor device. The noise source equivalent circuit represents a noise source outside the semiconductor device, and supplies noise to the target equivalent circuit. The external equivalent circuit represents a circuit outside the semiconductor device. The noise immunity is evaluated based on a voltage or current which arises in the target equivalent circuit by the noise. In this way, the immunity of the semiconductor device against extraneous noise can be evaluated in consideration of the effects of the circuitry outside the semiconductor device.

    摘要翻译: 提供了一种评估半导体器件的抗噪声性的方法。 包括半导体器件的实际电路由具有并联连接的目标等效电路,噪声源等效电路和外部等效电路的等效电路表示。 目标等效电路表示半导体器件。 噪声源等效电路表示半导体器件外部的噪声源,并且将噪声提供给目标等效电路。 外部等效电路表示半导体器件外部的电路。 基于由噪声在目标等效电路中产生的电压或电流来评估噪声抗扰度。 以这种方式,可以考虑半导体器件外的电路的影响来评估半导体器件对外来噪声的抗扰性。