公开(公告)号：US20210190670A1

公开(公告)日：2021-06-24

申请号：US17127972

申请日：2020-12-18

Applicant: IMEC VZW

Inventor： Ziduo LIN ,  Abdulkadir YURT ,  Richard STAHL ,  Geert VANMEERBEECK ,  Andy LAMBRECHTS

IPC: G01N15/14

Abstract: The inventive concept relates to a collector for collecting particles in air and a device for detecting particles in air comprising said collector. Said collector comprises a substrate, which is adapted to enable imaging of the particles, an adhesive layer arranged on a collector side of the substrate, said adhesive layer being formed by an adhesive material. The collector further comprises a protection element, which is configured to protect the adhesive layer before collection of particles. The collector is configured to allow release of protection of the adhesive layer by the protection element to expose an adhesive surface of the adhesive layer to ambient air for collecting particles on the adhesive surface. The collector is further configured for presenting a particle sample carrier having a smooth top surface and a smooth bottom surface for preventing light from being diffusely scattered by the particle sample carrier.

公开(公告)号：US20210190663A1

公开(公告)日：2021-06-24

申请号：US17127800

申请日：2020-12-18

Applicant: IMEC VZW

Inventor： Geert VANMEERBEECK ,  Ziduo LIN ,  Abdulkadir YURT ,  Richard STAHL

IPC: G01N15/06 ,  G03H1/08 ,  G01N15/02

Abstract: The inventive concept relates to a device for detecting particles in air, said device comprising a receiver for receiving a flow of air comprising particles, a sample carrier, and a particle capturing arrangement. The particle capturing arrangement is configured to separate the particles from the flow of air for and to collect a set of particles on a surface of the sample carrier. The device further comprises a light source configured to illuminate the particles on the sample carrier, such that an interference pattern is formed by interference between light being scattered by the particles and non-scattered light from the light source. The device further comprises an image sensor configured to detect the interference pattern. The device further comprises a cleaner configured for cleaning the surface of the sample carrier for enabling re-use of the surface for collection of a subsequent set of particles.