公开(公告)号：US20210190660A1

公开(公告)日：2021-06-24

申请号：US17128093

申请日：2020-12-19

Applicant: IMEC VZW

Inventor： Richard STAHL ,  Abdulkadir YURT ,  Ziduo LIN ,  Geert VANMEERBEECK ,  Andy LAMBRECHTS

IPC: G01N15/02 ,  G03H1/08

Abstract: A device for detecting particles in air; said device comprising: a flow channel configured to allow a flow of air comprising particles through the flow channel; a light source configured to illuminate the particles, such that an interference pattern is formed by interference between light being scattered by the particles and non-scattered light from the light source; an image sensor configured to detect incident light, detect the interference pattern, and to acquire a time-sequence of image frames, each image frame comprising a plurality of pixels, each pixel representing a detected intensity of light; and a frame processor configured to filter information in the time-sequence of image frames, wherein said filtering comprises: identifying pixels of interest in the time-sequence of image frames, said pixels of interest picturing an interference pattern potentially representing a particle in the flow of air, and outputting said identified pixels of interest for performing digital holographic reconstruction.

公开(公告)号：US20220197003A1

公开(公告)日：2022-06-23

申请号：US17555792

申请日：2021-12-20

Applicant: IMEC VZW

Inventor： Ziduo LIN ,  Murali JAYAPALA ,  Geert VANMEERBEECK ,  Abdulkadir YURT

IPC: G02B21/36 ,  G02B21/06 ,  H01L27/146

Abstract: According to an aspect of the present inventive concept there is provided a device for imaging of a microscopic object, the device comprising: an array of light sensitive areas sensitive to detect light spanning a wavelength range of at least 400-1200 nm; at least one light source comprising at least a first point of operation in which the at least one light source is configured to generate visible light, and a second point of operation in which the at least one light source is configured to generate infrared light, and being arranged to illuminate the microscopic object such that light is scattered by the microscopic object; wherein the array of light sensitive areas is configured to detect an interference pattern formed between the scattered light and non-scattered light; the device being configured to be set in a selected point of operation from the at least first and second points of operation, for detecting the interference pattern for imaging the microscopic object at a wavelength defined by the selected point of operation.

公开(公告)号：US20230176390A1

公开(公告)日：2023-06-08

申请号：US18071750

申请日：2022-11-30

Applicant: IMEC VZW

Inventor： Ziduo LIN ,  Richard STAHL ,  Geert VANMEERBEECK ,  Abdulkadir YURT

IPC: G02B27/10 ,  G03H1/04 ,  G02B27/09 ,  G01N15/02

CPC classification number: G02B27/10 ,  G03H1/0465 ,  G02B27/0916 ,  G01N15/0205 ,  G02B2207/101 ,  G03H2210/30 ,  G03H2222/42 ,  G03H2222/43

Abstract: Embodiments of the present disclosure provide an imaging device for holographic imaging of a sample, the imaging device comprising a light source generating a light beam, a beam splitter splitting the light beam into an object beam along an object beam path and a reference beam along a reference beam path, and a detector. The imaging device defines a sample position. The object beam is propagated through the sample position, and the detector is arranged to prevent non-scattered object light, passing through the sample position without being scattered by the sample, from being incident onto the detector. The reference beam is propagated through the sample position, and the detector is arranged so that non-scattered reference light, passing through the sample position without being scattered by the sample, is incident onto the detector. The detector detects an interference pattern formed by scattered object light and the non-scattered reference light.

公开(公告)号：US20180275604A1

公开(公告)日：2018-09-27

申请号：US15936489

申请日：2018-03-27

Applicant: IMEC VZW

Inventor： Ziduo LIN ,  Richard STAHL ,  Abdulkadir YURT

IPC: G03H1/02 ,  G02B27/09 ,  G02B27/22

CPC classification number: G03H1/02 ,  G02B27/0977 ,  G02B27/22 ,  G03H1/0244 ,  G03H1/0443 ,  G03H1/0465 ,  G03H2001/0212 ,  G03H2001/0447 ,  G03H2001/045 ,  G03H2001/0454 ,  G03H2001/2655 ,  G03H2001/266 ,  G03H2222/13 ,  G03H2222/34 ,  G03H2222/35 ,  G03H2223/23 ,  G03H2226/11

Abstract: A device in holographic imaging comprises: at least two light sources, wherein each of the at least two light sources is arranged to output light of a unique wavelength; and at least one holographic optical element, wherein the at least two light sources and the at least one holographic optical element are arranged in relation to each other such that light from the at least two light sources incident on the at least one holographic optical element interacts with the at least one holographic optical element to form wavefronts of similar shape for light from the different light sources.

公开(公告)号：US20220341853A1

公开(公告)日：2022-10-27

申请号：US17725871

申请日：2022-04-21

Applicant: IMEC VZW

Inventor： Ziduo LIN ,  Abdulkadir YURT ,  Murali JAYAPALA ,  Geert VANMEERBEECK

IPC: G01N21/90

Abstract: According to an aspect there is provided an illumination system for illumination of a sample in a container, such as a well of a microplate or a petri dish, the container comprising a bottom surface and side walls which together define a volume for receiving the sample, the illumination system comprising: at least one light source; a mask comprising an opaque portion, preventing light from passing through the mask, and an at least partially transparent portion, allowing light to pass through the mask; wherein the illumination system is adapted to be positioned such that the light generated by the light source, passing through the mask, illuminates the sample in the container; and wherein the light source and the mask are configured such that a shape, a size, and a position of a projection of the light passing through the mask, onto a plane of the bottom surface, match a shape, a size, and a position of the bottom surface.

公开(公告)号：US20220196475A1

公开(公告)日：2022-06-23

申请号：US17555785

申请日：2021-12-20

Applicant: IMEC VZW

Inventor： Geert VANMEERBEECK ,  Ziduo LIN ,  Murali JAYAPALA ,  Abdulkadir YURT

IPC: G01J3/28

Abstract: According to an aspect of the present inventive concept there is provided a device for imaging of a microscopic object, the device comprising: an array of light sensitive areas, each being sensitive to detect light spanning a wavelength range of at least 400-1200 nm; at least one light source configured to generate light at a plurality of wavelengths within the wavelength range, comprising at least one wavelength in a visible part of the wavelength range and at least one wavelength in a short-wave infrared, SWIR, part of the wavelength range, and arranged to illuminate the microscopic object with the generated light such that at least part of the light is scattered by the microscopic object; wherein the device is configured to transmit the scattered light and non-scattered light, from the same light source, to the array of light sensitive areas configured to detect an interference pattern formed between the scattered light and the non-scattered light, for each wavelength.

公开(公告)号：US20210190671A1

公开(公告)日：2021-06-24

申请号：US17127980

申请日：2020-12-18

Applicant: IMEC VZW

Inventor： Geert VANMEERBEECK ,  Ziduo LIN ,  Abdulkadir YURT ,  Richard STAHL ,  Andy LAMBRECHTS

IPC: G01N15/14 ,  G03H1/08

Abstract: A device for detecting particles in air; said device comprising: a receiver for receiving a flow of air comprising particles; a particle capturing arrangement configured to transfer the particles from the flow of air to a liquid for collection of a set of particles in the liquid; a flow channel configured to pass a flow of the liquid comprising the set of particles through the flow channel; a light source configured to illuminate the set of particles in the flow channel, such that an interference pattern is formed by interference between light being scattered by the set of particles and non-scattered light from the light source; and an image sensor comprising a plurality of photo-sensitive elements configured to detect incident light, the image sensor being configured to detect the interference pattern.

公开(公告)号：US20210190670A1

公开(公告)日：2021-06-24

申请号：US17127972

申请日：2020-12-18

Applicant: IMEC VZW

Inventor： Ziduo LIN ,  Abdulkadir YURT ,  Richard STAHL ,  Geert VANMEERBEECK ,  Andy LAMBRECHTS

IPC: G01N15/14

Abstract: The inventive concept relates to a collector for collecting particles in air and a device for detecting particles in air comprising said collector. Said collector comprises a substrate, which is adapted to enable imaging of the particles, an adhesive layer arranged on a collector side of the substrate, said adhesive layer being formed by an adhesive material. The collector further comprises a protection element, which is configured to protect the adhesive layer before collection of particles. The collector is configured to allow release of protection of the adhesive layer by the protection element to expose an adhesive surface of the adhesive layer to ambient air for collecting particles on the adhesive surface. The collector is further configured for presenting a particle sample carrier having a smooth top surface and a smooth bottom surface for preventing light from being diffusely scattered by the particle sample carrier.

公开(公告)号：US20210190663A1

公开(公告)日：2021-06-24

申请号：US17127800

申请日：2020-12-18

Applicant: IMEC VZW

Inventor： Geert VANMEERBEECK ,  Ziduo LIN ,  Abdulkadir YURT ,  Richard STAHL

IPC: G01N15/06 ,  G03H1/08 ,  G01N15/02

Abstract: The inventive concept relates to a device for detecting particles in air, said device comprising a receiver for receiving a flow of air comprising particles, a sample carrier, and a particle capturing arrangement. The particle capturing arrangement is configured to separate the particles from the flow of air for and to collect a set of particles on a surface of the sample carrier. The device further comprises a light source configured to illuminate the particles on the sample carrier, such that an interference pattern is formed by interference between light being scattered by the particles and non-scattered light from the light source. The device further comprises an image sensor configured to detect the interference pattern. The device further comprises a cleaner configured for cleaning the surface of the sample carrier for enabling re-use of the surface for collection of a subsequent set of particles.