公开(公告)号：US09279856B2

公开(公告)日：2016-03-08

申请号：US13656761

申请日：2012-10-22

Applicant: Infineon Technologies AG

Inventor： Peter Laackmann ,  Marcus Janke

IPC: G01R31/3187 ,  H01L21/50 ,  H01L23/544 ,  G01R31/317

CPC classification number: G01R31/31719 ,  H01L2924/0002 ,  H01L2924/00

Abstract: In various embodiments, a die is provided. The die may include a physical unclonable function circuit configured to provide an output signal, wherein the output signal is dependent on at least one physical characteristic specific to the die; and a self-test circuit integrated with the physical unclonable function circuit on the die, wherein the self-test circuit is configured to provide at least one test input signal to the physical unclonable function circuit and to determine as to whether the output signal provided in response to the at least one test input signal fulfills a predefined criterion.

Abstract translation: 在各种实施例中，提供了一个模具。 芯片可以包括被配置为提供输出信号的物理不可克隆功能电路，其中输出信号取决于芯片特有的至少一个物理特性; 以及与所述管芯上的所述物理不可克隆功能电路集成的自检电路，其中所述自检电路被配置为向所述物理不可克隆功能电路提供至少一个测试输入信号，并且确定所提供的输出信号是否 对至少一个测试输入信号的响应满足预定义的标准。

公开(公告)号：US09183413B2

公开(公告)日：2015-11-10

申请号：US14149613

申请日：2014-01-07

Applicant: Infineon Technologies AG

Inventor： Jurijus Cizas ,  Shrinath Eswarahally ,  Peter Laackmann ,  Berndt Gammel ,  Mark Stafford ,  Joerg Borchet

IPC: G06F21/76 ,  G06F21/85 ,  G06F21/44

CPC classification number: G06F21/76 ,  G06F21/445 ,  G06F21/85 ,  G06F2221/2107

Abstract: A system and method for controlling a device. Data that was encrypted using a first encryption scheme is decrypted, then re-encrypted using a second encryption scheme. The re-encrypted data is then decrypted.

Abstract translation: 一种用于控制设备的系统和方法。 使用第一加密方案加密的数据被解密，然后使用第二加密方案重新加密。 然后再重新加密的数据被解密。

公开(公告)号：US20140111234A1

公开(公告)日：2014-04-24

申请号：US13656761

申请日：2012-10-22

Applicant: INFINEON TECHNOLOGIES AG

Inventor： Peter Laackmann ,  Marcus Janke

IPC: G01R31/3187 ,  H01L21/50 ,  H01L23/544

CPC classification number: G01R31/31719 ,  H01L2924/0002 ,  H01L2924/00

Abstract: In various embodiments, a die is provided. The die may include a physical unclonable function circuit configured to provide an output signal, wherein the output signal is dependent on at least one physical characteristic specific to the die; and a self-test circuit integrated with the physical unclonable function circuit on the die, wherein the self-test circuit is configured to provide at least one test input signal to the physical unclonable function circuit and to determine as to whether the output signal provided in response to the at least one test input signal fulfills a predefined criterion.

Abstract translation: 在各种实施例中，提供了一个模具。 芯片可以包括被配置为提供输出信号的物理不可克隆功能电路，其中输出信号取决于芯片特有的至少一个物理特性; 以及与所述管芯上的所述物理不可克隆功能电路集成的自检电路，其中所述自检电路被配置为向所述物理不可克隆功能电路提供至少一个测试输入信号，并且确定所提供的输出信号是否 对至少一个测试输入信号的响应满足预定义的标准。