Abstract:
A method for testing a memory device. The method can include coupling the memory device to a test apparatus and determining whether each of the memory cells in the memory device is within a first specification range. Each of the cells that fall outside of the first range can be identified. Each of the cells that meet the second specification range can be tested. The method can include selecting a tile associated with a highest number of cells that fall outside of the second range. A resource can then be used to repair each of the cells that fall outside of the second range for a tile associated with a fewer number of cells that fall outside of the second range such that a first number of tiles meets the first range and a second number of tiles meets the second range such that the first number the second number.
Abstract:
A buffer integrated circuit device. The device comprising an output driver formed on the substrate member, the output driver having at least a command bus and an address bus. The device has a protocol and parity checking block (“Block”). The device has a table configured in the block. The table is programmable with a plurality of timing parameters. The device has a memory state block coupled to the table and a command history table coupled to the table to process protocol information for all commands that pass through the Block. The buffer integrated circuit device utilizes the protocol checking functionality to prevent failure propagation and enables data protection even in the case of host memory controller failure or system-level failure of any signal or signals on the command, control and address bus from the host memory controller to the buffer integrated device.