公开(公告)号：US20200209105A1

公开(公告)日：2020-07-02

申请号：US16725605

申请日：2019-12-23

Applicant: IonQ, Inc.

Inventor： Jonathan Albert MIZRAHI ,  Kai HUDEK

IPC: G01M11/02

Abstract: The disclosure describes various aspects of different for automated testing of optical assemblies. A system is described that includes an arm (e.g., a motorized arm) configured to be positioned over an optical assembly having a base plate with multiple optical elements that form one or more optical beam paths. The system also includes at least one optical tool that is configured to be removably attached to the arm and has a measurement instrument to perform a specified test on at least one of the optical beam paths. The arm is configured to adjust its position over the optical assembly to move the optical tool to the correct place to perform the specified test. The system may also include an optical tool changer configured to hold the optical tool in a tool holder when not attached to the arm and to hold additional optical tools in respective tool holders.

公开(公告)号：US20200033511A1

公开(公告)日：2020-01-30

申请号：US16524637

申请日：2019-07-29

Applicant: IonQ, Inc. ,  Duke University

Inventor： Jungsang KIM ,  David WONG-CAMPOS ,  Kai HUDEK

IPC: G02B3/06 ,  G02F1/33 ,  G02B15/14 ,  G06N10/00

Abstract: The disclosure describes various aspects of techniques for elliptical beam design using cylindrical optics that may be used in different applications, including in quantum information processing (QIP) systems. In an aspect, the disclosure describes an optical system having a first optical component having a first focal length, a second optical component having a second focal length and aligned with a first direction, and a third optical component having a third focal length and aligned with a second direction orthogonal to the first direction. The optical system is configured to receive one or more optical beams (e.g., circular or elliptical) and apply different magnifications in the first direction and the second direction to the one or more optical beams to image one or more elliptical Gaussian optical beams. A method for generating elliptical optical beams using a system as the one described above is also disclosed.

公开(公告)号：US20200023462A1

公开(公告)日：2020-01-23

申请号：US16515508

申请日：2019-07-18

Applicant: University of Maryland, College Park ,  IonQ, Inc.

Inventor： Jason Madjdi AMINI ,  Jonathan MIZRAHI ,  Kai HUDEK ,  Michael GOLDMAN

IPC: B23K26/064 ,  G06N10/00 ,  G02F1/33

Abstract: The disclosure describes various aspects of acousto-optic modulator (AOM) configurations for quantum processing. A method is described including generating, by a first AOM from a laser beam, first and second diffracted laser beams at different angles based on first and second radio frequency (RF) tones. An optical component focuses the diffracted laser beams onto a second AOM, which generates third and fourth diffracted laser beams based on the first RF tone and a third RF tone and the second RF tone and a fourth RF tone respectively, wherein the third and fourth diffracted laser beams are substantially parallel when incident on a respective ion in a chain of ions in a trap. Quantum information in the ion is controlled to perform quantum processing based on the third and fourth diffracted laser beams. Another method is described including generating, by an AOM, a small polarization rotation of an undiffracted laser beam.

公开(公告)号：US20240047166A1

公开(公告)日：2024-02-08

申请号：US18355165

申请日：2023-07-19

Applicant: IonQ, Inc.

Inventor： Kai HUDEK ,  Jason Madjdi AMINI

IPC: H01J29/70 ,  G06N10/00 ,  H01J29/96 ,  G06N10/40 ,  B82Y10/00 ,  H05H3/02

CPC classification number: H01J29/70 ,  G06N10/00 ,  H01J29/96 ,  G06N10/40 ,  B82Y10/00 ,  H05H3/02

Abstract: Aspects of the present disclosure describe an atomic oven including a cathode, an anode that comprises a source material, and a power supply that provides a voltage between the cathode and the anode, wherein applying the voltage causes multiple electrons from the cathode to ablate the source material from the anode or locally heat the anode to cause source material to evaporate from the anode and, in both case, to produce a stream of ablated or evaporated particles that passes through an opening in the cathode.

公开(公告)号：US20220137390A1

公开(公告)日：2022-05-05

申请号：US17374127

申请日：2021-07-13

Applicant: IonQ, Inc. ,  Duke University

Inventor： Jungsang KIM ,  Kai HUDEK ,  Jaime David WONG-CAMPOS

IPC: G02B23/12 ,  G02B23/02 ,  G06N10/00

Abstract: Aspects of the present disclosure describe techniques for independently controlling an angle (e.g., change in tilt) and/or position (e.g., change in lateral position) of an optical beam. For example, an optical beam control system may include a telescope with rotatable mirrors and lenses configured to provide a path to an optical beam to produce an output optical beam, which in turn is made into parallel optical beams following a diffractive optical element. The optical beam control system may also include a detector system to a beam angle and/or a beam position of one of the parallel optical beams to generate feedback signal or signals to control a rotation of one or more of the mirrors in the telescope such as to adjust the beam angle, the beam position, or both of the parallel optical beams. The optical beam control system may be part of a quantum information processing (QIP) system.

公开(公告)号：US20200028311A1

公开(公告)日：2020-01-23

申请号：US16506873

申请日：2019-07-09

Applicant: University of Maryland, College Park ,  IonQ, Inc.

Inventor： Kai HUDEK

IPC: H01S3/02 ,  H01S3/10 ,  H01S3/00 ,  G02B27/10

Abstract: The disclosure describes aspects of laser cavity optical alignment, and more particularly, in situ alignment of optical devices in an optical system for replacement or upgrade. In one aspect, a method for optical alignment in an optical system is described that includes providing, via a positioning system, an optical beam to measure surface features and position of a first device under test (DUT), removing the first DUT from the optical system, placing a second DUT in the optical system at substantially the same position from which the first DUT was removed, providing, via the positioning system, an optical beam to measure surface features and position of the second DUT, aligning the second DUT based on the measurements made of the first DUT and the second DUT, and verifying operation of the second DUT in the optical system. The DUT can be an optical device such as an output optical coupler.