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11.
公开(公告)号:US20220015734A1
公开(公告)日:2022-01-20
申请号:US17294448
申请日:2019-11-13
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor: HANNS-INGO MAACK
Abstract: The present disclosure relates to a system for adjusting, for each of a plurality of subjects under inspection, a relative position and/or a relative orientation between an interior body portion of the respective subject and an X-ray sensitive surface of an X-ray sensitive device. The system comprises a data processing system which is configured to read, for each of the subjects, position data which are indicative of one or more parameters of a position of the respective subject. The data processing system is further configured to determine one or more position parameters of an interior body portion of the respective subject. The data processing system is further configured to determine the position parameters of the interior body portions of the subjects further depending on model data which are indicative of one or more parameters of an interior position of an interior body portion of a model subject within a body of the model subject.
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公开(公告)号:US20200205765A1
公开(公告)日:2020-07-02
申请号:US16633719
申请日:2018-07-26
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor: THOMAS KOEHLER , HANNS-INGO MAACK , ANDRIY YAROSHENKO , KLAUS JUERGEN ENGEL , BERND MENSER
Abstract: An image processing system and related method. The system comprises an input interface (IN) for receiving dark-field image data obtained from imaging of an object (OB) with an X-ray imaging apparatus (XI). A corrector module (CM) of the system (IPS) is configured to perform a correction operation to correct said dark-field image data for Compton scatter to obtain Compton-Scatter corrected image data. The so Compton scatter corrected image data is output by an output interface (OUT) of the system.
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公开(公告)号:US20190180416A1
公开(公告)日:2019-06-13
申请号:US16098248
申请日:2017-05-04
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor: HANNS-INGO MAACK
Abstract: The present invention relates to an apparatus (10) for feature suppression in dark field or phase contrast X-ray imaging. The apparatus comprises an input unit (20), a processing unit (30) and an output unit (40). The input unit is configured to provide the processing unit with an X-ray attenuation image of a region of interest of an object. The input unit is also configured to provide the processing unit with a dark field or phase contrast X-ray image of the region of interest of the object. The processing unit is further configured to identify a first feature in the X-ray attenuation image; to identify a second anatomical feature in the X-ray attenuation image; and to identify the second anatomical feature in the dark field or phase contrast X-ray image. The first feature is an obscuring anatomical feature depicted in the X-ray attenuation image with higher contrast than in the dark field or phase contrast X-ray image. The processing unit is also further configured to register the dark field or phase contrast X-ray image to the X-ray attenuation image based on the identified second anatomical feature. The processing unit is configured to determine a location of the first feature in the X-ray attenuation image; and to locate the first feature in the dark field or phase contrast X-ray image comprising utilization of information relating to the first feature identified in the X-ray attenuation image by transferring the determined location to the dark field or phase contrast X-ray image. The processing unit is still further configured to suppress the first feature in the dark field or phase contrast X-ray image to generate a feature suppressed dark field or phase contrast X-ray image. And the output unit is configured to output data representative of the feature suppressed dark field or phase contrast X-ray image.
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公开(公告)号:US20220361836A1
公开(公告)日:2022-11-17
申请号:US17767184
申请日:2020-09-25
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor: JOHANNES KOEPNICK , HANNS-INGO MAACK , EUGEN HERMANN , BERND KUHRMANN
IPC: A61B6/00
Abstract: An X-ray imaging detector (102) is proposed, wherein the X-ray imaging detector comprises an X-ray converter (103) for converting X-ray radiation into electrical charges. The X-ray imaging detector further comprises a detector plate (104) for collecting the electrical charges generated by the X-ray converter and for generating an image. In addition, the X-ray imaging detector comprises a structured plate (105) for modulating the intensity of backscattered X-ray radiation, wherein the structured plate is arranged at a side of the detector plate opposite the side of the X-ray converter. Moreover, the X-ray imaging detector comprises a data processing system, which is configured for mitigating image distortions caused by backscattered X-ray radiation. Thereto, the data processing system uses information about the structured plate.
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公开(公告)号:US20210153833A1
公开(公告)日:2021-05-27
申请号:US16614075
申请日:2018-05-14
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor: HANNS-INGO MAACK , BERND MENSER , DETLEF MENTRUP
IPC: A61B6/00
Abstract: The present invention relates to processing X-ray images of an object. In order to improve the accuracy for interactive geometrical measurements, a device (10) for processing of an X-ray image of an object (30) is provided. The device comprises an input unit (12) and a processing unit (14). The input unit is configured to provide a shape related information (16) from an object (30) to be irradiated. The input unit is also configured to provide a generic object model (20), and to provide an actual X-ray image (18) of the object. The processing unit is configured to adapt the generic object model based on the shape related information in order to generate an individual object model (22). The processing unit is also configured to determine, based on the individual object model, an individual image processing modificator (24) for processing at least one part of the X-ray image, and to apply the individual image processing modificator for further processing of the X-ray image.
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公开(公告)号:US20200305810A1
公开(公告)日:2020-10-01
申请号:US16955978
申请日:2018-12-11
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor: ANDRIY YAROSHENKO , THOMAS KOEHLER , HANNS-INGO MAACK , MATTHIAS TEDERS
Abstract: The present invention relates to a method, and a corresponding device, for testing a radius of curvature and/or for detecting inhomogeneities of a curved X-ray grating for a grating-based X-ray imaging device. The method comprises generating a beam of light diverging from a source point, propagating along a main optical axis and having a line-shaped beam profile. The method comprises reflecting the beam off a concave reflective surface of the grating. A principal axis of the concave reflective surface coincides with the main optical axis and the source point is at a predetermined distance from a point where the main optical axis intersects the concave reflective surface. The method comprises determining whether a projection of the reflected beam in a plane at or near the source point is present outside a central region around the source point, in which an absence of this projection outside the central region indicates that a radius of curvature of the concave reflective surface corresponds to the predetermined distance and/or that the reflective surface is substantially homogeneously curved along a curve formed by the beam impinging on the concave reflective surface.
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公开(公告)号:US20200229785A1
公开(公告)日:2020-07-23
申请号:US16342696
申请日:2018-07-09
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor: HANNS-INGO MAACK
Abstract: The present invention relates to a device for scatter correction in an X-ray image, the X-ray image (30, 40) having a superimposed structured pattern, the device (1) comprising: an X-ray image receiving element (10); a pattern remover (11); and a first subtraction module (12); wherein the X-ray image receiving element (10) is configured to receive an X-ray image (30, 40) comprising a superimposed structured pattern (31); wherein the pattern remover (11) is configured to remove the structured pattern (31) from the X-ray image (30, 40) resulting in a pattern corrected X-ray image (43); wherein the first subtraction module (12) is configured to subtract the pattern corrected X-ray image (33, 43) from the X-ray image (40) resulting in a structured pattern image (32, 42); and wherein a contrast measurement unit (13) is configured to apply a local structure contrast measurement function to the structured pattern image (32, 42) resulting in a structure contrast image (34, 44). The invention improves the scatter correction of an X-ray image.
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公开(公告)号:US20170325774A1
公开(公告)日:2017-11-16
申请号:US15531634
申请日:2015-11-23
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor: DETLEF MENTRUP , HANNS-INGO MAACK
Abstract: The present invention relates to a device for signal compensation in medical X-ray images. The device (100) comprises a generation module (10) configured to generate an X-ray ghosting image based on an X-ray detector read-out subsequent to a last X- ray exposure of a plurality of X-ray exposures; a scaling module (20) configured to scale the X-ray ghosting image into a scaled X-ray ghosting image; and a subtraction module (30) configured to subtract the scaled X-ray ghosting image from any subsequent X-ray image recorded during a respective subsequent X-ray exposure of the plurality of X-ray exposures.
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公开(公告)号:US20170049412A1
公开(公告)日:2017-02-23
申请号:US15037457
申请日:2015-05-06
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor: HANNS-INGO MAACK
CPC classification number: A61B6/548 , A61B6/06 , A61B6/4233 , A61B6/4266 , A61B6/4405 , A61B6/4411 , A61B6/54 , A61B6/542 , A61B6/56
Abstract: The present invention relates to a system (1) for controlling an X-ray detector (11) for detection of X-ray radiation, an X-ray imaging arrangement (3) comprising such system (1) and a method for controlling an X-ray detector (11) for detection of X-ray radiation. The system (1) for detection of X-ray radiation comprises a trigger device (12). The trigger device (12) is configured to be arranged remotely from the X-ray detector (11). The trigger device (12) is furthermore configured to be data-linked to the X-ray detector (11). The trigger device (12) is configured to determine a start of an X-ray exposure of an X-ray tube (2), to generate an activation signal and to communicate such signal the X-ray detector (11) to activate image detection.
Abstract translation: 本发明涉及一种用于控制用于检测X射线辐射的X射线检测器(11)的系统(1),包括该系统(1)的X射线成像装置(3)和用于控制X射线 射线检测器(11),用于检测X射线辐射。 用于检测X射线辐射的系统(1)包括触发装置(12)。 触发装置(12)被配置为远离X射线检测器(11)布置。 触发装置(12)还被配置为与X射线检测器(11)数据链接。 触发装置(12)被配置为确定X射线管(2)的X射线曝光的开始,以产生激活信号,并且将X射线检测器(11)进行信号传送以激活图像检测 。
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公开(公告)号:US20250139766A1
公开(公告)日:2025-05-01
申请号:US18692428
申请日:2022-08-25
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor: SVEN KROENKE-HILLE , HANNS-INGO MAACK , JENS VON BERG
Abstract: The present invention relates to an apparatus (10) for training a medical image analysis algorithm, comprising an input unit (20); and a processing unit (30). The input unit is configured to receive a medical image of a body part of a patient. The input unit is configured to provide the medical image to the processing unit. The processing unit is configured to generate a modified medical image. The generation comprises a modification of two or more spatial frequency bands associated with the medical image. The processing unit is configured to train a medical image analysis machine learning algorithm comprising utilization of the modified medical image.
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