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    APPARATUS FOR GENERATING X-RAY IMAGING DATA
    1.
    发明申请
    APPARATUS FOR GENERATING X-RAY IMAGING DATA 有权

    公开(公告)号：US20210298704A1

    公开(公告)日：2021-09-30

    申请号：US17263570

    申请日：2019-08-01

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： THOMAS KOEHLER ,  GEREON VOGTMEIER ,  ANDRIY YAROSHENKO

    IPC: A61B6/00 ,  A61B6/03

    Abstract: The present invention relates to an apparatus (10) for generating X-ray imaging data. It is described to position (210) a first grating between an X-ray source and a second grating. The second grating is positioned (220) between the first grating and a third grating. A third grating is positioned (230) between the second grating and an X-ray detector. An object is positioned (240) between the first grating and the third grating. At least one of the three gratings has a pitch attribute of having a constant grating pitch. At least one of the three gratings has a pitch attribute of having a varying grating pitch. Both gratings of an adjacent pair of gratings are bent such that a distance between the two adjacent gratings is constant as a function of fan angle. Both gratings of the adjacent pair of gratings that are bent have the same pitch attribute. An X-ray detector detects (250) at least some of the X-rays transmitted by the three gratings and the object.

    X-RAY IMAGING REFERENCE SCAN
    2.
    发明申请
    X-RAY IMAGING REFERENCE SCAN 审中-公开

    公开(公告)号：US20200232937A1

    公开(公告)日：2020-07-23

    申请号：US16650220

    申请日：2018-09-21

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： ANDRIY YAROSHENKO ,  THOMAS KOEHLER ,  PETER BENJAMIN THEODOR NÖEL ,  FABIO DE MARCO ,  LUKAS BENEDICT GROMANN ,  KONSTANTIN WILLER

    IPC: G01N23/041 ,  A61B6/00

    Abstract: The present invention relates to acquiring reference scan data for X-ray phase-contrast imaging and/or X-ray dark-field imaging. Therefore an X-ray detector (26) is arranged opposite an X-ray source (12) across an examination region (30) with a grating arrangement (18) arranged between the X-ray source (12) and the X-ray detector (26). During an imaging operation without an object in the examination region (30) the grating arrangement (18) is moved in a scanning motion to a number of different positions (a) relative to the X-ray detector (26) whilst the X-ray detector (26) remains stationary relative to the examination region (30) such that in the scanning motion a series of fringe patterns is detected by the X-ray detector (26). The scanning motion is repeated for a different series of fringe patterns. This allows acquiring reference scan data required for calibration of an X-ray imaging device (10′″) with less scanning motions.

    SYSTEM FOR X-RAY DARK FIELD, PHASE CONTRAST AND ATTENUATION TOMOSYNTHESIS IMAGE ACQUISITION
    4.
    发明申请
    SYSTEM FOR X-RAY DARK FIELD, PHASE CONTRAST AND ATTENUATION TOMOSYNTHESIS IMAGE ACQUISITION 有权

    公开(公告)号：US20220146439A1

    公开(公告)日：2022-05-12

    申请号：US17435049

    申请日：2020-02-27

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： THOMAS KOEHLER ,  ANDRIY YAROSHENKO ,  BERNHARD JOHANNES BRENDEL

    IPC: G01N23/041 ,  G01N23/083 ,  G01N23/044 ,  G01N23/20

    Abstract: The present invention relates to a system (10) for X-ray dark field, phase contrast and attenuation tomosynthesis image acquisition. The system comprises an X-ray source (20), an interferometer arrangement (30), an X-ray detector (40), a control unit (50), and an output unit. A first axis is defined extending from a centre of the X-ray source to a centre of the X-ray detector. An examination region is located between the X-ray source and the X-ray. The first axis extends through the examination region, and the examination region is configured to enable location of an objection to be examined. The interferometer arrangement is located between the X-ray source and the X-ray detector. The interferometer arrangement comprises a first grating (32) and a second grating (34). A second axis is defined that is perpendicular to a plane that is defined with respect to a centre of the first grating and/or a centre of the second grating. The control unit is configured to control movement of the X-ray source and/or movement of the X-ray detector to provide a plurality of image acquisition states, wherein the X-ray source and X-ray detector are configured to operate to acquire image data. For each of the plurality of image acquisition states the first axis extends through the examination region at a different angle. The control unit is configured to control movement of the first grating or movement of the second grating in a lateral position direction perpendicular to the second axis. For each of the acquisition states the first grating or second grating is at a different lateral position of a plurality of lateral positions. The output unit is configured to output one or more of: dark field image data, phase contrast image data, and attenuation image data.

    TESTING OF CURVED X-RAY GRATINGS
    5.
    发明申请
    TESTING OF CURVED X-RAY GRATINGS 审中-公开

    公开(公告)号：US20200305810A1

    公开(公告)日：2020-10-01

    申请号：US16955978

    申请日：2018-12-11

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： ANDRIY YAROSHENKO ,  THOMAS KOEHLER ,  HANNS-INGO MAACK ,  MATTHIAS TEDERS

    IPC: A61B6/00 ,  A61B6/08 ,  A61B6/03 ,  G21K1/06

    Abstract: The present invention relates to a method, and a corresponding device, for testing a radius of curvature and/or for detecting inhomogeneities of a curved X-ray grating for a grating-based X-ray imaging device. The method comprises generating a beam of light diverging from a source point, propagating along a main optical axis and having a line-shaped beam profile. The method comprises reflecting the beam off a concave reflective surface of the grating. A principal axis of the concave reflective surface coincides with the main optical axis and the source point is at a predetermined distance from a point where the main optical axis intersects the concave reflective surface. The method comprises determining whether a projection of the reflected beam in a plane at or near the source point is present outside a central region around the source point, in which an absence of this projection outside the central region indicates that a radius of curvature of the concave reflective surface corresponds to the predetermined distance and/or that the reflective surface is substantially homogeneously curved along a curve formed by the beam impinging on the concave reflective surface.

    SENSITIVITY OPTIMIZED PATIENT POSITIONING SYSTEM FOR DARK-FIELD X-RAY IMAGING
    6.
    发明申请
    SENSITIVITY OPTIMIZED PATIENT POSITIONING SYSTEM FOR DARK-FIELD X-RAY IMAGING 审中-公开

    公开(公告)号：US20200015767A1

    公开(公告)日：2020-01-16

    申请号：US16497066

    申请日：2018-02-27

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： THOMAS KOEHLER ,  ANDRIY YAROSHENKO

    IPC: A61B6/00 ,  A61B6/08

    Abstract: The present invention relates to grating based Dark-Field and/or phase-contrast X-ray imaging. In order to improve the quality of an image, a radiography system (10) for grating based Dark-Field and/or phase-contrast X-ray imaging for imaging a patient by irradiating the patient is provided. The system comprises a source unit (12), a detection unit (14) and a patient support unit (16) with a patient abutting surface (18). The source unit (12) and the detection unit (14) are arranged along an optical axis (13) and the patient support unit (16) is arranged in between. Further, an abutting distance (dA) between the source unit (12) and the patient abutting surface (18) along the optical axis (13) is adaptable. The abutting distance (dA) and an actual sensitivity, based on the abutting distance (dA), are taken into account for imaging, such that a trade-off between sensitivity and field of view in a patient specific manner is achievable, e.g. the best trade-off.

    ACTIVE GRATINGS POSITION TRACKING IN GRATINGS-BASED PHASE-CONTRAST AND DARK-FIELD IMAGING
    7.
    发明申请
    ACTIVE GRATINGS POSITION TRACKING IN GRATINGS-BASED PHASE-CONTRAST AND DARK-FIELD IMAGING 有权

    公开(公告)号：US20220268573A1

    公开(公告)日：2022-08-25

    申请号：US17607084

    申请日：2020-11-06

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： SVEN PETER PREVRHAL ,  THOMAS KOEHLER ,  ANDRIY YAROSHENKO

    IPC: G01B11/27 ,  G01N23/041

    Abstract: The invention relates to a system and a method for active grating position tracking in X-ray differential phase contrast imaging and dark-field imaging. The alignment of at least one grating positioned in an X-ray imaging device is measured by illuminating a reflection area located on the grating with a light beam, and detecting a reflection pattern of the light beam reflected by the reflection area. The reflection pattern is compared with a reference pattern corresponding to an alignment optimized for X-ray differential phase contrast imaging, and the X-ray imaging device is controlled upon the comparison of the reflection pattern and the reference pattern.

    APPLICATION FOR X-RAY DARK-FIELD AND/OR X-RAY PHASE CONTRAST IMAGING USING STEPPING AND MOIRÉ IMAGING
    8.
    发明申请
    APPLICATION FOR X-RAY DARK-FIELD AND/OR X-RAY PHASE CONTRAST IMAGING USING STEPPING AND MOIRÉ IMAGING 有权

    公开(公告)号：US20220218296A1

    公开(公告)日：2022-07-14

    申请号：US17608513

    申请日：2020-05-08

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： ANDRIY YAROSHENKO ,  THOMAS KOEHLER

    IPC: A61B6/00 ,  G01N23/041 ,  G01N23/20

    Abstract: Disclosed is an apparatus for X-ray dark-field and/or X-ray phase-contrast imaging The apparatus has an imaging system, which includes a first and a second X-ray optical grating and an X-ray sensitive image detector having an ordered array of X-ray sensitive pixels. When no object is present, the first grating generates a fringe pattern in an entrance plane of the second grating. The second grating is configured to generate a Moiré pattern from the fringe pattern so that the Moiré pattern has a pitch which is less than 20 times a pixel pitch of the pixels of the X-ray sensitive image detector. The imaging system further comprises a controller, which is configured to control a relative movement between the second grating and the fringe pattern to acquire a Moiré-image at each of a plurality of different relative image acquisition positions when the object is present.

    SYSTEM, METHOD AND COMPUTER PROGRAM FOR ACQUIRING PHASE IMAGING DATA OF AN OBJECT
    9.
    发明申请
    SYSTEM, METHOD AND COMPUTER PROGRAM FOR ACQUIRING PHASE IMAGING DATA OF AN OBJECT 有权

    公开(公告)号：US20220133257A1

    公开(公告)日：2022-05-05

    申请号：US17431559

    申请日：2020-02-10

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： ANDRIY YAROSHENKO ,  THOMAS KOEHLER ,  HANNS-INGO MAACK

    IPC: A61B6/00 ,  G01N23/041

    Abstract: The invention relates to a control module for controlling an x-ray system (140) during the acquisition of step images for phase imaging. The control module comprises a step image quantity providing unit (111) for providing a step image quantity, a detector dose providing unit (112) for providing a target detector dose, an applied detector dose determination unit (113) for determining an applied detector dose absorbed by a part of the detector (144) during the acquisition of a step image, and a step image acquisition control unit (114) for controlling the x-ray imaging system (140) during the acquisition of each step image based on the applied detector dose, the target detector dose and the step image quantity. The control module allows to control the x-ray imaging system such that the target detector dose is not exceeded while at the same time ensuring a sufficient quality of the step images.

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