公开(公告)号：US11257205B2

公开(公告)日：2022-02-22

申请号：US15384713

申请日：2016-12-20

Applicant: MITUTOYO CORPORATION

Inventor： Gyokubu Cho ,  Koichi Komatsu ,  Akira Takada ,  Hiroyuki Yoshida ,  Takashi Hanamura ,  Takuho Maeda ,  Makoto Kaieda ,  Isao Tokuhara

IPC: G01B11/02 ,  G01B11/08 ,  G06T7/00 ,  G06T7/62

Abstract: An image measuring method performed with an image measuring device measuring a dimension of a measured object from an image of the measured object captured by an image capturer. The method executes a standard reference object measurement measuring a dimension of the standard reference object with the image measuring device; a standard reference dimension input inputting a dimension of the standard reference object specified by a device other than the image measuring device; a preset value calculation calculating a preset value from the dimension of the measured standard reference object and from a dimension of the standard reference object measured by a predetermined measurement tool; a measurement measuring a dimension of a measured object other than the standard reference object using the image measuring device; and a correction correcting the dimension of the measured object other than the standard reference object measured by the image measuring device.