公开(公告)号：US20240011841A1

公开(公告)日：2024-01-11

申请号：US18237002

申请日：2023-08-23

Applicant: NEC Corporation

Inventor： Mayumi KOSAKA

IPC: G01J5/20 ,  H10N15/10

CPC classification number: G01J5/20 ,  H10N15/15 ,  G01J2005/202

Abstract: A bolometer having low resistance and a method for manufacturing the same are provided.
The present invention relates to a bolometer comprising two electrodes provided on a substrate and a bolometer film comprising carbon nanotubes, wherein



the bolometer film is provided to connect an area of the top surfaces of the two electrodes, an area in contact with the electrode walls of the two electrodes, and an area between the two electrodes on the substrate; and
the area density of the area of the bolometer film in contact with the electrode wall is less than or equal to the area density of the area between the electrodes on the substrate, or the film thickness of the area of the bolometer film in contact with the electrode wall is less than or equal to the film thickness of the area between the electrodes on the substrate.

公开(公告)号：US20230384166A1

公开(公告)日：2023-11-30

申请号：US18201540

申请日：2023-05-24

Applicant: NEC Corporation

Inventor： Mayumi KOSAKA

IPC: G01J5/22 ,  H10N15/10

CPC classification number: G01J5/22 ,  H10N15/15 ,  G01J2005/202

Abstract: One object of the present invention is to provide a bolometer having low resistance.
The present invention relates to a bolometer including two electrodes and a bolometer film lying between the two electrodes to connect the two electrodes, wherein the bolometer film includes semiconducting carbon nanotubes in a proportion of 90% by mass or more to the total amount of carbon nanotubes and includes p-type semiconducting carbon nanotubes, and one or both of the two electrodes include(s) a monometal or alloy having lower work function than the p-type semiconducting carbon nanotubes at least in a part of the electrode.

公开(公告)号：US20220364931A1

公开(公告)日：2022-11-17

申请号：US17731784

申请日：2022-04-28

Applicant: NEC Corporation

Inventor： Mayumi KOSAKA

IPC: G01J5/20 ,  C01B32/174

Abstract: An object of the present invention is to provide a method for manufacturing a microscopic bolometer film and a bolometer using the same via a simple method.
The present invention relates to a bolometer manufacturing method including: forming an interlayer having a function that enhances binding between a substrate and a semiconducting carbon nanotube, in a predetermined pattern shape on the substrate; and providing a droplet of a semiconducting carbon nanotube dispersion liquid on the formed interlayer.