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11.发明公开公开(公告)号：US20240119357A1
公开(公告)日：2024-04-11
申请号：US18276809
申请日：2021-02-25
Applicant: NEC Corporation
Inventor： Keita SAKUMA , Tomoya SAKAI , Yoshio KAMEDA , Hiroshi TAMANO
IPC: G06N20/00
CPC classification number: G06N20/00
Abstract: Provided are an analysis device, an analysis method, and a program capable of easily identifying a factor of a prediction error in prediction using a prediction model on the basis of various viewpoints. An analysis device (1) includes: a metric evaluation unit (2) that calculates and evaluates a plurality of types of metrics with respect to a prediction model, data of explanatory variables used in the prediction model, or data of target variables used in the prediction model; and a factor identification unit (3) that identifies a factor of an error in prediction by the prediction model according to a combination of evaluation results of the plurality of types of metrics.
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公开(公告)号：US20220100819A1
公开(公告)日：2022-03-31
申请号：US17424087
申请日：2020-01-24
Inventor： Keiichi KISAMORI , Yoshio KAMEDA , Takashi WASHIO
IPC: G06F17/18
Abstract: A search device includes: a relationship calculation means for calculating a relationship by using a plurality of sets, each set including a parameter value and a numerical value indicating a degree of occurrence of a target event in a case of the parameter value, the relationship being a relationship between the parameter value and the numerical value; a frequency calculation means for calculating, for a plurality of bins obtained by dividing up a range that can be taken by the numerical value, a frequency at which the numerical value is included in a bin; a number setting means for performing, for at least some bins of the plurality of bins, a setting relating to a number of the parameter value such that the lower the frequency of the bin, the greater a number of the parameter value serving as calculation subjects of the numerical value, by using the frequency; and a parameter setting means for setting parameter values by the set number.
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Patent Agency Ranking
13.发明申请公开(公告)号：US20210383157A1
公开(公告)日：2021-12-09
申请号：US17289154
申请日：2019-10-29
Inventor： Keiichi KISAMORI , Yuto KOMORI , Takashi WASHIO , Yoshio KAMEDA
Abstract: An analysis device applies, for each of a plurality of candidates for an updated parameter value set according to an update target parameter value, the update target parameter value and the candidate to a plurality of machine learning results to acquire, for each machine learning result, information indicating a degree of difference of an evaluation target value in a case of the candidate with respect to an evaluation target value in a case of the update target parameter value; calculate, for each candidate and for each machine learning result, an evaluation target value in the case of the candidate based on the degree of difference and the evaluation target value in the case of the update target parameter value; and calculate a selection index value for each candidate using a variation in the evaluation target values for each machine learning result, compare the selection index value of each candidate.
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公开(公告)号：US20200249637A1
公开(公告)日：2020-08-06
申请号：US16639821
申请日：2017-09-22
Applicant: NEC Corporation
Inventor： Wemer WEE , Riki ETO , Yoshio KAMEDA
Abstract: An ensemble control system 80 combines different types of plant control. A plurality of subcontrollers 81 output actions for the plant control based on a prediction result by a predictor. A combiner or switch 82 combines or switches actions to maximize prediction or control performance as best control action based on the actions output by each subcontroller 81. Subcontrollers 81 include at least two types of subcontrollers. A first type subcontroller is an optimization-based subcontroller which optimizes an objective function that is a cost function to be minimized for calculating actions and outputs a control action. A second type subcontroller is a prediction-subcontroller which predicts based on machine learning models and outputs a predicted action.
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15.发明申请公开(公告)号：US20190385082A1
公开(公告)日：2019-12-19
申请号：US16479248
申请日：2018-01-23
Applicant: NEC Corporation
Inventor： Yoshio KAMEDA
Abstract: An information processing device for enabling acquisition of a simulation output with high precision or in a short time, as compared with the technique disclosed in PTL 1 or 2, is provided. The information processing device includes an acquisition unit and a learning unit. The acquisition unit acquires a value of an input variable used for executing a simulation, an updated value of an internal variable updated during execution of the simulation, and a value of an output variable indicating a result of the simulation. The learning unit learns an estimation model for estimating a simulation result by using the input variable and the updated internal variable acquired by the acquisition unit as explanatory variables and the output variable acquired by the acquisition unit as an objective variable.
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16.发明申请公开(公告)号：US20190196419A1
公开(公告)日：2019-06-27
申请号：US16307531
申请日：2016-06-10
Applicant: NEC Corporation
Inventor： Wemer WEE , Yoshio KAMEDA , Riki ETO
CPC classification number: G05B13/028 , G05B13/024 , G06N20/20
Abstract: An expert model unit 81 generates predicted expert control actions based on an expert model which is a machine learning model trained using data collected when an expert operated a plant which is a control target or a plant of the same or similar characteristics. A transformer 82 constructs metrics or error measures involving the predicted expert control actions from the expert model unit 81 as an objective term. A combiner 83 collects different objective terms from the transformer 82 and a learner which outputs machine-learning models as objective terms and computes an optimal set of weights or combinations of the objective terms to construct an aggregated cost function for use in an optimizer.
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17.发明申请公开(公告)号：US20180225843A1
公开(公告)日：2018-08-09
申请号：US15742982
申请日：2016-07-19
Applicant: NEC Corporation
Inventor： Kenichiro FUKUSHI , Manabu KUSUMOTO , Yoshio KAMEDA , Hisashi ISHIDA , Chenpin HSU , Takeo NOZAKI
Abstract: Provided are a reference scale and dimension measurement system that make it possible to maintain accurate measurement even if the reference scale is not disposed or projected on a measurement surface. A dimension measurement device according to the present invention is provided with: a reference scale extraction means for extracting, from photographed image data including a reference scale that includes a film that has a pattern for displaying a length reference formed on the surface thereof and a lens that is in contact with the film, an image in which an image of the length reference is formed on the basis of the relationship between a pattern function expressing the length reference projected onto the lens according to variation in a prescribed angle between the reference scale and the optical axis of a photography device and an image formation color function indicating the image of the length reference formed on the imaging device; an object of measurement extraction means for extracting an object of measurement image from photographed image data including the reference scale; and a dimension calculation means for calculating a dimension of the object of measurement on the basis of a dimension of the image in which the image of the length reference is formed and the image of the object of measurement.
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