INSPECTION SYSTEM AND INSPECTION METHOD

    公开(公告)号:US20240377553A1

    公开(公告)日:2024-11-14

    申请号:US18574638

    申请日:2022-07-06

    Abstract: Provided are an inspection method, and an inspection system including: at least one ray source; a detector assembly and a conveying device. At least one ray source and the detector assembly may move in a traveling direction relative to the conveying device, so that the to-be-inspected object may enter an inspection region. When viewed along a central axis of the inspection region, at least one ray source may translate between scanning positions, and a translation distance of at least one ray source between two adjacent scanning positions is greater than a spacing between adjacent target spots of each ray source. When at least one ray source is located at one scanning position, at least one ray source and the detector assembly move in the traveling direction and at least one ray source emits X-rays. After moving a predetermined distance, at least one ray source translates to another scanning position.

    STATIC CT DETECTION DEVICE
    12.
    发明申请

    公开(公告)号:US20220357288A1

    公开(公告)日:2022-11-10

    申请号:US17661257

    申请日:2022-04-28

    Abstract: The present disclosure relates to a static CT detection device, including: a shielding body, formed with a detection channel through which an object under detection can pass; a ray source, emitting rays for detecting the object under detection when the object under detection passes through the detection channel; and a detector, for acquiring the rays emitted by the ray source and having passed through the detection channel, wherein the shielding body is formed with an opening portion, and the opening portion extends from an inlet of the detection channel to an outlet of the detection channel.

    RAY SCANNING APPARATUS
    13.
    发明申请

    公开(公告)号:US20240369499A1

    公开(公告)日:2024-11-07

    申请号:US18575789

    申请日:2022-07-01

    Abstract: A ray scanning apparatus, including: a conveying device for conveying an object under inspection to pass through a scanning area; a ray source assembly including a plurality of ray source modules arranged around the scanning area on an upper side of the conveying device and fixed in a plane perpendicular to a conveying direction of the object under inspection; and a detector assembly including a plurality of detector sets fixed in a plane perpendicular to the conveying direction of the object under inspection; the detector assembly is located between the ray source assembly and the scanning area in a direction perpendicular to the conveying direction of the object under inspection, the ray source assembly and the detector assembly are arranged to overlap at least partially in the conveying direction of the object under inspection, and the plurality of ray source modules are mounted and detached independently of each other.

    INSPECTION SYSTEM AND INSPECTION METHOD
    14.
    发明公开

    公开(公告)号:US20240310304A1

    公开(公告)日:2024-09-19

    申请号:US18574578

    申请日:2022-07-06

    Abstract: An inspection system and method, the system includes: a ray source rotatable between at least two scanning positions around a rotation axis, a rotation angle of the ray source between two adjacent scanning positions being greater than an angle of adjacent target spots of the ray source relative to the rotation axis; a detector assembly; and a conveying device for carrying an object. The ray source and the detector assembly are movable in a traveling direction relative to the conveying device so that the object enters an inspection region. When the ray source is at one of the scanning positions, the ray source and the detector assembly move in the traveling direction and the ray source emits X-rays; and when the ray source and the detector assembly move a predetermined distance in the traveling direction, the ray source rotates around the rotation axis to another one of the scanning positions.

    INSPECTION SYSTEM AND INSPECTION METHOD
    15.
    发明公开

    公开(公告)号:US20240142658A1

    公开(公告)日:2024-05-02

    申请号:US18574633

    申请日:2022-07-06

    CPC classification number: G01V5/226 G01N23/046

    Abstract: An inspection system, including: at least one ray source rotatable between at least two scanning positions around a rotation axis, and a rotation angle of at least one ray source between two adjacent scanning positions is greater than an angle of adjacent target spots of each ray source relative to the rotation axis; a detector assembly, and a conveying device configured to carry an object to be inspected. At least one ray source and the detector assembly are movable in a traveling direction relative to the conveying device, so that the object to be inspected may enter an inspection region. When at least one ray source is located at one scanning positions, at least one ray source and the detector assembly move in the traveling direction relative to the conveying device and at least one ray source emits X-rays; after moving a predetermined distance, at least one ray source rotates around the rotation axis to another scanning position.

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