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公开(公告)号:US20190250208A1
公开(公告)日:2019-08-15
申请号:US15892739
申请日:2018-02-09
Applicant: QUALCOMM Incorporated
Inventor: Vijayakumar DHANASEKARAN , Qubo ZHOU , Lennart Karl-Axel MATHE
CPC classification number: G01R31/2884 , G01R31/2856 , G01R31/2858 , G01R31/2896 , H01L22/32 , H01L22/34 , H01L23/585 , H01L28/20 , H01L29/92
Abstract: Various features relate to a test ring including an integrated circuit. The test ring is located around a periphery of the integrated circuit. The test ring includes a first terminal, a second terminal, and a first circuit element, wherein the first terminal is coupled to the first circuit element, and the first circuit element is coupled to the second terminal, wherein the first terminal, the first circuit element and the second terminal are coupled together in series.
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公开(公告)号:US20180310921A1
公开(公告)日:2018-11-01
申请号:US16021369
申请日:2018-06-28
Applicant: QUALCOMM Incorporated
Inventor: Sameer WADHWA , Lennart Karl-Axel MATHE
CPC classification number: A61B8/5269 , A61B8/14 , A61B8/4494 , G06K9/0002
Abstract: Apparatus and method for generating a DC pixel voltage are disclosed. The apparatus includes an amplifier configured to amplify an input signal to generate a voltage signal, wherein the input signal is generated in response to an ultrasonic wave reflecting off an item-to-be-imaged and propagating via a piezoelectric layer; a noise reduction circuit configured to pass the voltage signal from an output of the amplifier to a node, while reducing a propagation of noise from the output of the amplifier to the node; and a circuit configured to generate a DC pixel voltage based on the reduced-noise voltage signal.
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