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公开(公告)号:US09838027B2
公开(公告)日:2017-12-05
申请号:US15615719
申请日:2017-06-06
Applicant: Renesas Electronics Corporation
Inventor: Yoshihiro Funato , Yasuo Morimoto , Kazuaki Kurooka
CPC classification number: H03M1/0617 , H03M1/1023 , H03M1/1038 , H03M1/1057 , H03M1/12 , H03M1/145
Abstract: An analog-to-digital (AD) convertor includes: a capacitance digital-to-analog (DA) convertor circuit; a comparator circuit coupled to the capacitance DA convertor circuit; and a calibration circuit that calculates a correction value for the AD convertor, wherein the capacitance DA convertor circuit includes a first capacitor, a second capacitor, n number of capacitors (n being integer equal to or larger than 3), each of the capacitors from first to n-th to be activated based on input digital data, wherein each of the first and second capacitors is designed for having a first capacitance value, wherein the n-th capacitor is designed for having twice the capacitance value of the (n−1)-th capacitor, wherein the calibration circuit calculates the correction value based on first and second results of the AD convertor, and wherein the first result is generated using the n-th capacitor and the second result is generated using the capacitors from first to (n−1)-th.