摘要:
A system and method for analyzing a sample is disclosed. At least a portion of the sample is illuminated with modulated light from a light source, such as an infrared light source. Infrared energy from the sample is monitored with an infrared detector as the sample is being illuminated with the modulated light. The AC response of the infrared energy is analyzed to determine at least one of emission data or reflection data about the sample. The emission data or the reflection data can be used to enhance chemical contrast between varying substances on the sample.
摘要:
For imaging, an electromagnetic radiation sensor is used to produce an output when illuminated by a modulated laser light. In use, the output is determined by a laser Doppler signal illuminating the sensor. Various examples are described for achieving integration of on-chip processing onto the substrate providing the sensor. In one example, the output of the sensor is a logarithmic function of the illuminating laser Doppler signal. In another example, the output of the sensor is normalized. In another example, an amplifier arrangement is provided to amplify the output of the sensor, the amplifier gain being lower at DC than at the frequency range of the laser Doppler signal. In another example, a filter is integrated into the semiconductor device. In another example, a bandpass filter and frequency weighted filter are provided, and their outputs are processed to average values over time.
摘要:
A mechanism is provided that aggregates data in a way that permits data to be deleted efficiently, while minimizing the overhead necessary to support bulk deletion of data. A request is received for automatic deletion of segments in a container and a waterline is determined for the container. A determination is made if at least one segment in the container falls below the waterline. Finally, in response to one segment falling below the waterline, the segment from the container is deleted. Each object has an associated creation time, initial retention value, and retention decay curve (also known as a retention curve). At any point, based on these values and the current time, the object's current retention value may be computed. The container system continually maintains a time-varying waterline: at any point, objects with a retention value below the waterline may be deleted.