Abstract:
In some embodiments, a processing system includes at least one hardware block configured to change operation as a function of configuration data, a non-volatile memory including the configuration data for the at least one hardware block, and a configuration module configured to read the configuration data from the non-volatile memory and provide the configuration data read from the non-volatile memory to the at least one hardware block. The configuration module is configured to: receive mode configuration data; read the configuration data from the non-volatile memory; test whether the configuration data contain errors by verifying whether the configuration data are corrupted and/or invalid; and activate a normal operation mode or an error operation mode based on whether the configuration data contain or do not contain errors.
Abstract:
A Voltage regulator includes a first input terminal configured to receive an input supply voltage, includes a second input terminal configured to receive a regulated output supply voltage as a function of the input supply voltage or to receive a test supply voltage and comprises a power transistor including an input terminal configured to receive the input supply voltage and including an output terminal configured to generate the regulated output supply voltage. The Voltage regulator is configured, during a start-up phase of a test operation mode, to receive a control signal equal to the input supply voltage, is configured to receive the input supply voltage having a substantially increasing trend, detect that the input supply voltage is equal to a first voltage threshold and generate, as a function of the detected signal and of the control signal, a by-pass signal having a transition from a first logic value to a second logic value for indicating a by-pass status of the Voltage regulator, and is configured to receive the by-pass signal having the second logic value and open the power transistor. The second input terminal is configured, during the test operation mode, to receive the test supply voltage having a test value different from a nominal value of the regulated output supply voltage.