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公开(公告)号:US12216144B2
公开(公告)日:2025-02-04
申请号:US18340678
申请日:2023-06-23
Applicant: Samsung Display Co., Ltd.
Inventor: Eunsol Seo , Hyun-Wook Cho , Sangkook Kim , Taejoon Kim , Eungkwan Lee , Jaewoo Choi
Abstract: In a method for testing an electronic device, the method includes: providing an electronic device including a display layer and a sensor layer on the display layer and configured to operate at a touch drive frequency, the sensor layer including a plurality of first electrodes and a plurality of second electrodes insulatively intersecting the plurality of first electrodes; providing a test signal having a test frequency higher than the touch drive frequency to the plurality of first electrodes; measuring mutual capacitance with the plurality of first electrodes through the plurality of second electrodes; and determining whether or not the sensor layer is defective, based on the mutual capacitance.
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12.
公开(公告)号:US11995265B2
公开(公告)日:2024-05-28
申请号:US17955794
申请日:2022-09-29
Applicant: Samsung Display Co., Ltd.
Inventor: Jiyeong Lee , Hyun-Wook Cho , Sangkook Kim , Taejoon Kim , Hyungbae Kim , Jaehyun Park
CPC classification number: G06F3/04166 , G06F3/0412 , G06F3/0446 , H10K59/12
Abstract: A display device includes a display panel that displays an image, an input sensor that senses an external input, and a sensing controller that controls the driving of the input sensor. The input sensor includes a plurality of scanning electrodes and a plurality of sensing electrodes. The sensing controller simultaneously transmits input scanning signals to at least two scanning electrodes of the plurality of scanning electrodes during a group scanning period. The group scanning period includes a plurality of scanning periods. The sensing controller transmits a compensating signal having a phase different from a phase of at least one of the input scanning signals to at least one sensing electrode of the plurality of sensing electrodes during at least one scanning period of the plurality of scanning periods.
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公开(公告)号:US11797142B2
公开(公告)日:2023-10-24
申请号:US18054939
申请日:2022-11-14
Applicant: SAMSUNG DISPLAY CO., LTD.
Inventor: Hyungbae Kim , Hyun-Wook Cho , Sangkook Kim , Taejoon Kim , Jaehyun Park , Jiyeong Lee
CPC classification number: G06F3/0446 , G06F3/0412
Abstract: A display device includes a display panel and an input sensing panel. The input sensing panel includes pluralities of first and second sensing electrodes and electrostatic induction patterns, each of which is connected to a sensing electrode from one of the pluralities of sensing electrodes and overlaps another sensing electrode from the other one of the pluralities of sensing electrodes. The input sensing panel includes a first area where deviations of mutual capacitances between the first and second sensing electrodes are small and a second area where the deviations are large. The electrostatic induction patterns include first electrostatic induction patterns disposed in the first area and second electrostatic induction patterns disposed in the second area, the second electrostatic induction patterns having a different area from the first electrostatic induction patterns, or the number of second electrostatic induction patterns being different from the number of first electrostatic induction patterns.
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公开(公告)号:US20220253168A1
公开(公告)日:2022-08-11
申请号:US17487165
申请日:2021-09-28
Applicant: Samsung Display Co., Ltd.
Inventor: Bongil Kang , Sangkook Kim , Gayeon Yun
Abstract: A method of testing an electronic device includes providing an electronic device. The electronic device includes a display layer that includes a common electrode. The electronic device also includes a sensor layer disposed on the display layer and that includes a first sensing electrode and a second sensing electrode. The first sensing electrode and the second sensing electrode cross each other and are electrically disconnected. The method further includes providing a test signal that includes a test frequency to the first sensing electrode, measuring a capacitance of a capacitor disposed between the first and second sensing electrodes based on the test signal, and testing the common electrode based on the capacitance.
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