公开(公告)号：US20220365132A1

公开(公告)日：2022-11-17

申请号：US17549005

申请日：2021-12-13

Applicant: Samsung Electronics Co., Ltd.

Inventor： Kijae SONG ,  Jongkook KIM ,  Dongho LEE ,  Seonmi LEE

IPC: G01R31/28 ,  G01R1/04

Abstract: A test board for testing a semiconductor apparatus includes a first board configured to support a plurality of first Devices Under Test (DUTs) such that the plurality of first DUTs are mounted on the first board, a plurality of first inter-board connectors arranged on the first board, and a plurality of second boards stacked on the first board through the plurality of first inter-board connectors, each second board of the plurality of second boards having a surface configured to support a separate second DUT of a plurality of second DUTs such that the plurality of second DUTs are mounted on separate, respective second boards of the plurality of second board.

公开(公告)号：US20210318061A1

公开(公告)日：2021-10-14

申请号：US16950744

申请日：2020-11-17

Applicant: Samsung Electronics Co., Ltd.

Inventor： Dongho LEE ,  Youngil SONG ,  Jisu RHIE

IPC: F25D29/00 ,  F25D23/02

Abstract: The refrigerator includes a door including a door body and a front panel coupled to a front surface of the door so to cover a front surface of the door body. The front panel includes a display including a screen on which an image is displayed, and a glass panel provided in front of the display. The glass panel includes a glass member and a decorative layer formed in an area other than an area corresponding to the screen of the display among an entire area of the glass member. The front panel includes a support plate coupled to the glass panel and including a display mounting portion on which the display is mounted.