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11.
公开(公告)号:US20240155703A1
公开(公告)日:2024-05-09
申请号:US18412250
申请日:2024-01-12
Applicant: Samsung Electronics Co., Ltd.
Inventor: Lisi LI , Weiwei WANG , Lixiang XU , Hong WANG
Abstract: The present disclosure relates to a communication method and system for converging a 5th-Generation (5G) communication system for supporting higher data rates beyond a 4th-Generation (4G) system with a technology for Internet of Things (IoT). The present disclosure may be applied to intelligent services based on the 5G communication technology and the IoT-related technology, such as smart home, smart building, smart city, smart car, connected car, health care, digital education, smart retail, security and safety services. A method performed by a first entity in a wireless communication system is provided. The method includes transmitting connection assistance information to a second entity in the wireless communication system.
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公开(公告)号:US20230247466A1
公开(公告)日:2023-08-03
申请号:US18103029
申请日:2023-01-30
Applicant: Samsung Electronics Co., Ltd.
Inventor: Lisi LI , Lixiang Xu , Hong Wang
Abstract: The present application discloses a node, a UE and methods thereof. A method performed by a third node in a communication system includes receiving information about a first measurement from a first node; and in response, sending configuration information of the first measurement to the first node; or sending a first measurement report received from a UE to a fourth node.
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公开(公告)号:US20220225142A1
公开(公告)日:2022-07-14
申请号:US17574762
申请日:2022-01-13
Applicant: Samsung Electronics Co., Ltd.
Inventor: Lisi LI , Hong WANG , Xiaoning MA , Weiwei WANG
Abstract: A measurement method is provided herein, which includes a first node transmitting a first message to a second node. The first message includes configuration related to a second measurement for assisting a first measurement. The second node starts the second measurement according to the configuration related to the second measurement, or obtains information used for aligning the first measurement with the second measurement according to the configuration related to the second measurement.
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