公开(公告)号：US09052294B2

公开(公告)日：2015-06-09

申请号：US11421273

申请日：2006-05-31

Applicant: Steven R. Walton

Inventor： Steven R. Walton

IPC: G06K9/00 ,  G01N21/88 ,  G06T7/00 ,  G01N21/84

CPC classification number: G01N21/8806 ,  G01N2021/8472 ,  G01N2201/0626 ,  G01N2201/0627 ,  G06T7/0004 ,  G06T2207/10152 ,  G06T2207/30164

Abstract: A system and method for inspecting a workpiece are provided. According to one embodiment, the system includes a plurality of illumination sources positioned proximate to the workpiece and each operable to generate at least one respective illumination beam to illuminate at least a portion of the workpiece, wherein each beam has a different respective color. The system also includes at least one camera positioned proximate to the workpiece and operable to capture at least one image of at least a portion of the workpiece including the illumination beams incident thereon. In addition, the system includes a data system capable of providing simultaneous two-dimensional and three-dimensional information indicative of the workpiece based on the image acquired by the camera.

Abstract translation: 提供了一种用于检查工件的系统和方法。 根据一个实施例，系统包括靠近工件定位的多个照明源，每个照明源可操作以产生至少一个相应的照明光束以照亮工件的至少一部分，其中每个光束具有不同的相应颜色。 该系统还包括位于工件附近的至少一个摄像机，其可操作以捕获包括入射在其上的照明光束的工件的至少一部分的至少一个图像。 此外，该系统包括能够基于由照相机获取的图像提供表示工件的同时二维和三维信息的数据系统。

公开(公告)号：US07495758B2

公开(公告)日：2009-02-24

申请号：US11470403

申请日：2006-09-06

Applicant: Steven R. Walton

Inventor： Steven R. Walton

IPC: G01N21/00

CPC classification number: G01N21/8901 ,  B29C70/386 ,  G01N2021/8472

Abstract: Apparatus and methods for inspecting a workpiece are provided. According to one embodiment, a method for inspecting a workpiece comprises illuminating at least a portion of the workpiece with at least one illumination beam and capturing at least one image including at least on line signature formed by illuminating the workpiece with the illumination beam. The method further includes performing two-dimensional and three-dimensional processes on the captured image and classifying at least one feature associated with the workpiece based at least in part on data generated by the two-dimensional and three-dimensional processes.

Abstract translation: 提供了用于检查工件的装置和方法。 根据一个实施例，一种用于检查工件的方法包括用至少一个照明光束照射至少一部分工件，并且捕获至少一个图像，该至少一个图像至少包括通过用照明光束照射工件而形成的线上签名。 该方法还包括至少部分地基于由二维和三维过程产生的数据，对所捕获的图像执行二维和三维处理并对与工件相关联的至少一个特征进行分类。

公开(公告)号：US20080055591A1

公开(公告)日：2008-03-06

申请号：US11470403

申请日：2006-09-06

Applicant: Steven R. Walton

Inventor： Steven R. Walton

IPC: G01N21/00

CPC classification number: G01N21/8901 ,  B29C70/386 ,  G01N2021/8472

Abstract: Apparatus and methods for inspecting a workpiece are provided. According to one embodiment, a method for inspecting a workpiece comprises illuminating at least a portion of the workpiece with at least one illumination beam and capturing at least one image including at least on line signature formed by illuminating the workpiece with the illumination beam. The method further includes performing two-dimensional and three-dimensional processes on the captured image and classifying at least one feature associated with the workpiece based at least in part on data generated by the two-dimensional and three-dimensional processes.

Abstract translation: 提供了用于检查工件的装置和方法。 根据一个实施例，一种用于检查工件的方法包括用至少一个照明光束照射至少一部分工件，并且捕获至少一个图像，该至少一个图像至少包括通过用照明光束照射工件而形成的线上签名。 该方法还包括至少部分地基于由二维和三维过程生成的数据，对拍摄的图像执行二维和三维处理并对与工件相关联的至少一个特征进行分类。