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    DEVICE AND METHOD FOR MONITORING AN EMISSION TEMPERATURE OF A RADIATION EMITTING ELEMENT
    11.
    发明公开
    DEVICE AND METHOD FOR MONITORING AN EMISSION TEMPERATURE OF A RADIATION EMITTING ELEMENT 审中-公开

    公开(公告)号：US20240192059A1

    公开(公告)日：2024-06-13

    申请号：US18554076

    申请日：2022-05-06

    Applicant: trinamiX GmbH

    Inventor： Tobias BAUMGARTNER ,  Sourabh KULKARNI ,  Celal Mohan OEGUEN

    IPC: G01J5/28 ,  G01J5/06 ,  G01J5/52

    CPC classification number: G01J5/28 ,  G01J5/06 ,  G01J5/52 ,  G01J2005/065 ,  G01J2005/283

    Abstract: The present invention refers to a device (112) for monitoring an emission temperature of at least one radiation emitting element (114), a heating system (110) for heating at the least one radiation emitting element (114) to emit thermal radiation at an emission temperature, a method for monitoring an emission temperature of at least one radiation emitting element (114) and method for heating the at least one radiation emitting element (114) to emit thermal radiation at an emission temperature. Herein, the device (112) for monitoring an emission temperature of at least one radiation emitting element (114) comprises—at least one light source (125), wherein the light source is configured to emit optical radiation at least partially towards the at least one radiation emitting element (114); —at least one radiation sensitive element (126), wherein the at least one radiation sensitive element (126) has at least one sensor region (128), wherein the at least one sensor region (128) comprises at least one photosensitive material selected from at least one photoconductive material, wherein the at least one sensor region (128) is designated for generating at least one sensor signal depending on an intensity of the thermal radiation emitted by the at least one radiation emitting element (114) and received by the sensor region (128) within at least one wavelength range, wherein the sensor region (128) is further designated for generating at least one further sensor signal depending on an intensity of the optical radiation emitted by the at least one light source (125) and received by the sensor region (128) within at least one further wavelength range, wherein the at least one radiation sensitive element (126) is arranged in a manner that the thermal radiation travels through at least one transition material (116) prior to being received by the at least one radiation sensitive element (126), wherein at least one of the at least one light source (125) and the at least one radiation sensitive element (126) is arranged in a manner that the optical radiation travels through the at least one transition material (116) and impinges the at least one radiation emitting element (114) prior to being received by the at least one radiation sensitive element (126); and—at least one evaluation unit (138), wherein the at least one evaluation unit (138) is configured to determine the emission temperature of the at least one radiation emitting element (114) by using values for the intensity of the thermal radiation and the optical radiation.

    Spectrometer Device and Method for Measuring Optical Radiation
    12.
    发明公开
    Spectrometer Device and Method for Measuring Optical Radiation 审中-公开

    公开(公告)号：US20230266234A1

    公开(公告)日：2023-08-24

    申请号：US18006438

    申请日：2021-07-23

    Applicant: TRINAMIX GMBH

    Inventor： Celal Mohan OEGUEN ,  Stefan HOOS ,  Robert GUST ,  Sebastian VALOUCH ,  Patrick SCHINDLER

    IPC: G01N21/31

    CPC classification number: G01N21/31

    Abstract: Disclosed herein are a spectrometer device, a method for measuring optical radiation, and a spectrometer system including the spectrometer device. The spectrometer device includes



    at least one radiation emitting element,
    at least one photosensitive detector,
    at least one control circuit, and
    at least one readout circuit.




    The spectrometer system is a mixed spectrometer which employs the advantages of a scanning spectrometer and a dispersive spectrometer. Compared to both, the mixed spectrometer constitutes a simplified spectrometer system by including a reduced number of required components and exhibiting a miniaturized mechanical set-up.

    Temperature Detection Through Differential Dual Detectors
    13.
    发明申请
    Temperature Detection Through Differential Dual Detectors 有权

    公开(公告)号：US20230068316A1

    公开(公告)日：2023-03-02

    申请号：US17904359

    申请日：2021-02-05

    Applicant: TRINAMIX GMBH

    Inventor： Celal Mohan OEGUEN ,  Robert GUST

    IPC: G01J5/22 ,  G01N21/31 ,  G01N33/00

    Abstract: Disclosed herein is a sensor system including four interconnected resistors, where two of the resistors are photoconductive detectors, where the photoconductive detectors are illuminated with light at least at two different wavelengths, where two of the resistors does not change their resistance due to the illumination, where an external voltage is applicable to the sensor system, where a differential voltage is measurable, which depends on the resistance changes of the illuminated photoconductive detectors, where the differential voltage gives a mathematical ratio of the four respective resistances.

    Photoconductor Readout Circuit
    14.
    发明申请
    Photoconductor Readout Circuit 有权

    公开(公告)号：US20220326075A1

    公开(公告)日：2022-10-13

    申请号：US17754468

    申请日：2020-10-08

    Applicant: TRINAMIX GMBH

    Inventor： Bernd SCHERWATH ,  Peter FEJES ,  Celal Mohan OEGUEN ,  Robert GUST ,  Robert SEND ,  Stefan HOOS

    IPC: G01J1/44 ,  G01K7/16

    Abstract: Disclosed herein is a device including at least one photoconductor configured for exhibiting an electrical resistance Rphoto dependent on an illumination of a light-sensitive region of the photoconductor; and at least one photoconductor readout circuit, where the photoconductor readout circuit is configured for determining the electrical resistance Rphoto of the photoconductor, where the photoconductor readout circuit includes at least one bias voltage source configured for applying at least one modulated bias voltage to the photoconductor.

    METHOD OF CALIBRATING A SPECTRAL SENSING DEVICE
    15.
    发明申请
    METHOD OF CALIBRATING A SPECTRAL SENSING DEVICE 有权

    公开(公告)号：US20250164315A1

    公开(公告)日：2025-05-22

    申请号：US18833952

    申请日：2023-02-24

    Applicant: TRINAMIX GMBH

    Inventor： Sourabh KULKARNI ,  Celal Mohan OEGUEN ,  Tobias BAUMGARTNER ,  Michael HANKE

    IPC: G01J3/42 ,  G01J3/02 ,  G01J3/10

    Abstract: Disclosed herein is a method of calibrating a spectral sensing device. The spectral sensing device includes: a. at least one detector element; b. at least one wavelength-selective element; c. at least one light source: d. at least one sample interface; e. at least one first optical path; and f. at least one second optical path. The method includes: I. illuminating the detector element via the at least one first optical path; II. illuminating the detector element via the at least one second optical path with no sample applied to the sample interface; III. illuminating the detector element via the at least one second optical path with at least one calibration sample applied to the sample interface; and IV. determining at least one item of calibration information by using the first detector signal, the open port detector signal and the calibration detector signal. Further disclosed herein are a method of determining at least one calibrated optical property of at least one sample, a spectral sensing device and computer programs and computer-readable storage media for performing the methods.

    PHOTODETECTOR FOR MEASURING OPTICAL RADIATION
    16.
    发明申请
    PHOTODETECTOR FOR MEASURING OPTICAL RADIATION 有权

    公开(公告)号：US20250003801A1

    公开(公告)日：2025-01-02

    申请号：US18709539

    申请日：2022-12-14

    Applicant: TRINAMIX GMBH

    Inventor： Bernd SCHERWATH ,  Celal Mohan OEGUEN ,  Thomas HUPFAUER ,  Christoph PROKOP

    IPC: G01J3/42 ,  G01J3/02 ,  G01J3/28

    Abstract: Disclosed herein is a photodetector for measuring optical radiation. The photodetector includes: at least one active pixel including an active photosensitive region, where the active pixel is configured for generating at least one active signal by using the active photosensitive region, where the active signal is dependent on an illumination of the active pixel by the optical radiation; and at least one dark pixel including: a dark photosensitive region, where the dark pixel is configured for generating at least one dark signal by using the dark photosensitive region, where the dark signal is independent on an illumination of the dark pixel by the optical radiation; and a temperature equalizing cover configured for covering the dark photosensitive region at least against the optical radiation.

    MULTI SINGLE DETECTOR APPLICATION SPECIFIC SPECTROMETER
    17.
    发明申请
    MULTI SINGLE DETECTOR APPLICATION SPECIFIC SPECTROMETER 有权

    公开(公告)号：US20240377315A1

    公开(公告)日：2024-11-14

    申请号：US18692859

    申请日：2022-09-30

    Applicant: TRINAMIX GMBH

    Inventor： Christoph PROKOP ,  Celal Mohan OEGUEN ,  Sourabh KULKARNI

    IPC: G01N21/31

    Abstract: Disclosed herein is a spectral measurement device for measuring optical radiation provided by at least one measurement object in at least one classification based spectral measurement. The spectral measurement device includes: at least one radiation source configured for emitting optical radiation at least partially towards the measurement object; at least two photodetectors, wherein each photodetector includes at least one pixel; at least one read-out device configured for measuring the photodetector signals and generating at least one item of spectral data; and at least one evaluation device comprising at least one processor and at least one memory storage. The evaluation device is configured for generating at least one item of measurement information by applying the classification model and the transfer function to the item of spectral data.

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