摘要:
Disclosed is a nozzle block for electrospinning which is able to simultaneously electrically spin two or more different types of polymer spinning dopes, wherein a single-layer distribution plate for dividing a planar space within the nozzle block into two or more segments is installed within the nozzle block. The apparatus is simple because a single-layer distribution plate is installed instead of a conventional multi layer distribution plate. A hybrid nano fiber laminate can be prepared without any additional laminating procedure because two or more different polymer spinning dopes can be simultaneously electrically spun through different nozzles arranged within the same nozzle block. It is possible to prepare a hybrid nano fiber nonwoven fabric or filaments or the like composed of two or more types of nano fibers different in thermal properties or physical properties because their fiber diameter or polymer type are different from each other.
摘要:
A method of compensating sensor data used in an interlock system comprises setting a predetermined drift upper limit and a predetermined drift lower limit, creating a reference pattern information about a reference model, creating a sensor pattern information about the sensor data, determining whether the sensor pattern information satisfies the drift upper limit and the drift lower limit, calculating a drift offset according to the reference pattern information and the sensor pattern information when the sensor pattern information satisfies the drift upper limit and the drift lower limit, and compensating the sensor data according to the calculated drift offset. Thus, a method of compensating sensor data and a method of evaluating an interlock of an interlock system, in which interlock setting/managing for identical sets of equipment under the interlock system is simplified through a statistic drift compensation algorithm, and an allowable variation between wafers is minimized, thereby enhancing detection reliability of a defective wafer. A method of compensating sensor data and a method of evaluating an interlock of an interlock system, in which an allowable variation between sensors varying depending on a driving time for a set of equipment, an RF time, the number of wafers, etc. is minimized, thereby enhancing detection reliability of a defective wafer.