Abstract:
A fusing device and an image forming apparatus having the same. The fusing device can include a fusing belt, a heat source disposed in an interior of the fusing belt, a supporting member to support at least a portion of an inner peripheral surface of the fusing belt, a press member mounted while opposing the fusing belt to form a fusing nip, and a nip forming part formed with an opening portion to enable heat emitted from the heat source to be transferred to the fusing belt at a position corresponding to the fusing nip. The nip forming part can have at least one gap maintaining part to prevent change of a gap of the opening portion. The nip forming part is provided at the supporting member or a nip forming member mounted between the heat source and the supporting member. Accordingly, a temperature of the fusing belt can rise quickly by directly heating the fusing belt, and deterioration of fusing performance due to deformation of the nip forming member can be prevented.
Abstract:
An organic electroluminescence display device capable of reducing a size of a data driver by reducing the channel number of the data driver, and capable of reducing a deviation of electric current flowing in pixels by resetting data lines, and a driving method for the same. The organic electroluminescence display device includes a pixel unit having a plurality of pixels defined by data lines and scan lines and displaying an image to correspond to a data signal and a scan signal; a data driver generating a data signal to supply the data signal to the pixel unit in every channel; a MUX unit to which the data lines are connected to correspond to one channel outputting the data signal from the data driver and selectively supplying the data signal, outputted from the channel according to the control signal, to one of the data lines; and a scan driver generating a scan signal to supply the generated scan signal to the pixel unit, wherein a reset signal transmitting unit supplying a reset signal is connected to the channel of the data driver to connect the reset signal to the data lines through the MUX unit.
Abstract:
A pogo pin of a contact-type of semiconductor test device will not be oxidized and will not damage of a solder ball of a semiconductor package when the pogo pin is brought into contact with the solder ball. The pogo pin includes an electrical contact of a conductive rubber material, and a spring extending from the bottom of the electrical contact. The test device includes an array of the pogo pins, and a housing that supports the array of pogo pins. The housing may include detachable members between which the pogo pins are interposed such that the pogo pins can be individually replaced.
Abstract:
A clock generator, which can be included in an Organic Light Emitting Display (OLED), includes four switching units and two inverters. Each of the switching units includes two transistors. Transistors of two switching units that are connected to a high-level voltage line are PMOS transistors, and transistors of two switching units that are connected to a low-level voltage line are NMOS transistors. The switching units are sequentially turned on/off in response to four control signals so that the clock generator generates a clock signal. Each of the control signals has a duty ratio of 50%, and there is a phase difference of 90° between the control signals. The clock signal alternates between a low level and a high level every ¼ of a cycle of each of the control signals.
Abstract:
An inspecting apparatus for a semiconductor device having a match plate; a contact module combined with the match plate, including a radiation unit contacting a semiconductor device, and a test unit pressing leads of the semiconductor device; and a thermally conductive pad installed on a contacting face of the radiation unit of the contact module, to transfer heat from the semiconductor device to the radiation unit of the contact module. The present invention provides an inspecting apparatus for semiconductor devices that improves reliability of testing for durability of semiconductor devices against heat, and minimizes damage to the semiconductor devices during testing.
Abstract:
A shift register includes a sampling circuit to sample an input signal in response to a start pulse and two clock signals having different duty ratios from each other, a holding circuit to hold the input signal in response to an output signal of the sampling circuit and the two clock signals, an inverter to invert the output signal of the sampling circuit or the holding circuit, and a NAND gate to receive the output signal of the sampling circuit or the holding circuit and the output signal of the inverter and perform a logical operation on the received output signals to output an output signal. The first clock signal has a duty ratio smaller than the second clock signal. The sampling circuit and the holding circuit have a three-stack structure in which three transistors are coupled with one another in series.
Abstract:
A heating apparatus and a method of driving the same. The heating apparatus includes: a heating plate on which an object to be heated is loaded and which is partitioned into a plurality of heating zones; a main heating apparatus that is placed on a lower portion of the heating plate and uniformly heats the entire heating plate; and a plurality of subheaters located below the heating plate and disposed to respectively correspond to the heating zones, such that each of the subheaters heats a corresponding one of the heating zones.
Abstract:
An apparatus and method are provided to rapidly and accurately measure the variation of capacitance in a panel load of a touch sensor and thus increase touch sensitivity and noise resistance. The apparatus includes a panel driver configured to drive a panel load in the touch sensor according to a reference voltage, and a capacitive load detector configured to measure capacitance of the panel load by sensing a panel load driving current that is applied to the panel load by the panel driver.
Abstract:
A fusing device includes a rotatable pressing roller, a fusing belt to rotate by a rotational force transmitted from the rotatable pressing roller, a nip forming member to contact an inner surface of the fusing belt to form a nip on a contact area between the rotatable pressing roller and the fusing belt, a heating member formed in approximately an internal central portion of the fusing belt to heat the nip forming member and the fusing belt, an inner support member formed within the fusing belt to press a nip part of the nip forming member toward the rotatable pressing roller, and an outer support member formed outside the fusing belt, and both ends of the outer support member being engaged with the inner support member to thereby reinforce the strength of the inner support member and form a path for radiation heat to disperse. The support unit includes an inner support member placed within the belt unit, and an outer support member placed outside the belt unit, both ends of the outer support member being engaged with the inner support member to reinforce the strength of the inner support member and to form a path for a radiation heat to disperse.
Abstract:
A fusing device includes a rotatable pressing roller, a fusing belt to rotate by a rotational force transmitted from the rotatable pressing roller, a nip forming member to contact an inner surface of the fusing belt to form a nip on a contact area between the rotatable pressing roller and the fusing belt, a heating member formed in approximately an internal central portion of the fusing belt to heat the nip forming member and the fusing belt, an inner support member formed within the fusing belt to press a nip part of the nip forming member toward the rotatable pressing roller, and an outer support member formed outside the fusing belt, and both ends of the outer support member being engaged with the inner support member to thereby reinforce the strength of the inner support member and form a path for radiation heat to disperse. The support unit includes an inner support member placed within the belt unit, and an outer support member placed outside the belt unit, both ends of the outer support member being engaged with the inner support member to reinforce the strength of the inner support member and to form a path for a radiation heat to disperse.