公开(公告)号：US07034557B2

公开(公告)日：2006-04-25

申请号：US10820748

申请日：2004-04-09

申请人： Je-hyoung Ryu ,  Tae-gyu Kim ,  Jun-ho Lee ,  Sung-jin Lee ,  Hong-yong Lee

发明人： Je-hyoung Ryu ,  Tae-gyu Kim ,  Jun-ho Lee ,  Sung-jin Lee ,  Hong-yong Lee

IPC分类号： G01R31/26

CPC分类号： G01R1/0458

摘要： An inspecting apparatus for a semiconductor device includes a match plate; a contact module combined with the match plate and including a radiator to radiate heat from the semiconductor device to the outside and a tester to contact the leads of the semiconductor device; and a heat pipe provided in the radiator. The inspecting apparatus performs testing at a constant temperature, regardless of heat from the semiconductor device, by transferring the heat quickly and efficiently, thereby producing more accurate test results. The apparatus also improves productivity and saves expense by removing faulty test results caused by incorrectly identifying a qualified semiconductor device as a defective semiconductor device.

摘要翻译： 半导体装置的检查装置包括：匹配板; 与所述匹配板结合的接触模块，并且包括散热器以将热量从所述半导体器件辐射到外部;以及测试器，以接触所述半导体器件的引线; 以及设置在散热器中的热管。 检查装置通过快速有效地传递热量而与来自半导体装置的热量恒定地进行测试，从而产生更准确的测试结果。 该装置还通过消除由于将合格的半导体器件错误地识别为有缺陷的半导体器件而引起的故障测试结果，从而提高了生产率并节约了费用。

公开(公告)号：US20050012498A1

公开(公告)日：2005-01-20

申请号：US10791629

申请日：2004-03-03

申请人： Soo-Chan Lee ,  Young-Kyun Sun ,  Hyun-Ho Kim ,  Byeong-Chun Lee ,  Jun-Ho Lee ,  Jong-Cheol Lee ,  Je-Hyoung Ryu ,  Tae-Gyu Kim ,  Soon-Kyu Yim

发明人： Soo-Chan Lee ,  Young-Kyun Sun ,  Hyun-Ho Kim ,  Byeong-Chun Lee ,  Jun-Ho Lee ,  Jong-Cheol Lee ,  Je-Hyoung Ryu ,  Tae-Gyu Kim ,  Soon-Kyu Yim

IPC分类号： G01R31/26 ,  G01R31/28 ,  H01L21/66 ,  G01R31/02

CPC分类号： G01R31/2886 ,  G01R31/2893

摘要： A semiconductor device test apparatus includes a main body and a stacker for stacking devices before and after a test. The stacker includes at least one user tray feeder predesignated with a function for stacking un-tested devices and at least one user tray sender predesignated with a function for stacking tested devices, the user tray functions being interchangeable during stacker operation.

摘要翻译： 半导体器件测试装置包括用于在测试之前和之后堆叠器件的主体和堆叠器。 所述堆垛机包括至少一个用户托盘进料器，所述用户托盘进料器具有用于堆叠未测试的装置的功能，并且至少一个用户托盘发送器预先具有用于堆叠测试的装置的功能，所述用户托盘功能在堆叠器操作期间是可互换的。

公开(公告)号：US07792453B2

公开(公告)日：2010-09-07

申请号：US12153271

申请日：2008-05-15

申请人： Sung Ku Baek ,  Sung Hyup Kim ,  Sun Soo Kim ,  Gyu Deok Hwang ,  Jong Woo Kim ,  Hyun Ki Cho ,  Je Hyoung Ryu ,  Tae Hee Kim

发明人： Sung Ku Baek ,  Sung Hyup Kim ,  Sun Soo Kim ,  Gyu Deok Hwang ,  Jong Woo Kim ,  Hyun Ki Cho ,  Je Hyoung Ryu ,  Tae Hee Kim

IPC分类号： G03G15/20

CPC分类号： G03G21/20 ,  G03G15/2064

摘要： An image forming apparatus capable of minimizing a temperature rise of a cover by substantially preventing heat emission from a fusing device to an outside is disclosed. The image forming apparatus includes a main body, a fusing device mounted in the main body, the fusing device having an outlet to discharge paper, an opening/closing member opening and closing the outlet of the fusing device, a cam member moving the opening/closing member between a first position in which the opening/closing member closes the outlet to prevent heat in the fusing device from being emitted through the outlet and a second position in which the opening/closing member opens the outlet to permit the paper to pass through the outlet, a driving part rotating the cam member, and a control unit controlling the driving part to determine a rotational position of the cam member.

摘要翻译： 公开了一种图像形成装置，其能够通过基本上防止从定影装置向外部的热量发射来最小化盖的温度上升。 图像形成装置包括主体，安装在主体中的定影装置，具有排出纸张的出口的定影装置，打开和关闭定影装置的出口的打开/关闭部件，使打开/ 关闭构件，其中所述打开/关闭构件关闭所述出口的第一位置以防止所述定影装置中的热量通过所述出口发射;以及第二位置，所述打开/关闭构件打开所述出口以允许所述纸张通过 所述出口，使所述凸轮构件旋转的驱动部，以及控制所述驱动部，以确定所述凸轮构件的旋转位置的控制单元。

公开(公告)号：US07176704B2

公开(公告)日：2007-02-13

申请号：US10823546

申请日：2004-04-14

申请人： Je-hyoung Ryu ,  Tae-gyu Kim ,  Soon-kyu Yim ,  Sung-jin Lee ,  Jun-ho Lee

发明人： Je-hyoung Ryu ,  Tae-gyu Kim ,  Soon-kyu Yim ,  Sung-jin Lee ,  Jun-ho Lee

IPC分类号： G01R31/02

CPC分类号： G01R1/0458

摘要： An inspecting apparatus for semiconductor devices including: a match plate; a contact module combined with the match plate, and the match plate including a radiation unit radiating heat from the semiconductor devices to the outside, and a test unit contacting leads of the semiconductor; an insert module installed on a bottom of the contact module, and having a semiconductor device accommodator to accommodate the semiconductor device; and an auxiliary radiation member installed on a bottom of the insert module, and radiating the heat from the semiconductor device to the outside. Accordingly, the inspecting apparatus for semiconductor device according to the present invention performs testing at a constant temperature regardless of heat from the semiconductors by radiating the heat from the semiconductors immediately and efficiently, thereby producing more accurate test results. Accurate testing improves productivity and saves expense by removing faulty test results caused by identifying a qualified semiconductor as a defective semiconductor due to heat radiated from the semiconductor device.

摘要翻译： 一种用于半导体器件的检查装置，包括：匹配板; 与所述匹配板组合的接触模块，所述匹配板包括从所述半导体器件向外部辐射热的辐射单元，以及接触所述半导体的引线的测试单元; 插入模块，安装在所述触点模块的底部，并且具有用于容纳所述半导体器件的半导体器件容纳器; 以及安装在所述插入模块的底部上的辅助辐射构件，并且将来自所述半导体器件的热量散发到外部。 因此，根据本发明的半导体装置的检查装置不管来自半导体的热量是恒定的，通过立即有效地辐射来自半导体的热量进行测试，从而产生更准确的测试结果。 通过从半导体器件辐射的热量，通过识别合格的半导体作为有缺陷的半导体而导致的故障测试结果，可以提高生产率并节省成本。

公开(公告)号：US20130246289A1

公开(公告)日：2013-09-19

申请号：US13702798

申请日：2012-06-29

申请人： Je Hyoung Ryu ,  Nam Gu Ryu

发明人： Je Hyoung Ryu ,  Nam Gu Ryu

IPC分类号： G06Q30/00 ,  G06Q50/18

CPC分类号： G06Q30/018 ,  G06Q50/18

摘要： The device and its methods, and how the invention's purpose is to input for electronic contracts using a communications network will be introduced.The present invention uses a communications network as a medium and proves contract application from the service server.When the received contract application is activated, a control medium is used to synchronize the terminals of involved electronic contract parties via the terminal set synchronization code. When the terminals are synchronized, display of notification icons to let the other involved party know of input fields within the electronic contract.

摘要翻译： 将介绍该设备及其方法，以及本发明的目的如何使用通信网络输入电子合同。 本发明使用通信网络作为介质，并从服务服务器证明合同应用。 当接收到的合同申请被激活时，控制介质被用于通过终端机同步码同步所涉及的电子合同方的终端。 当终端同步时，显示通知图标，让对方了解电子合同内的输入字段。

公开(公告)号：US20090052924A1

公开(公告)日：2009-02-26

申请号：US12153271

申请日：2008-05-15

申请人： Sung Ku Baek ,  Sung Hyup Kim ,  Sun Soo Kim ,  Gyu Deok Hwang ,  Jong Woo Kim ,  Hyun Ki Cho ,  Je Hyoung Ryu ,  Tae Hee Kim

发明人： Sung Ku Baek ,  Sung Hyup Kim ,  Sun Soo Kim ,  Gyu Deok Hwang ,  Jong Woo Kim ,  Hyun Ki Cho ,  Je Hyoung Ryu ,  Tae Hee Kim

IPC分类号： G03G15/20

CPC分类号： G03G21/20 ,  G03G15/2064

摘要： An image forming apparatus capable of minimizing a temperature rise of a cover by substantially preventing heat emission from a fusing device to an outside is disclosed. The image forming apparatus includes a main body, a fusing device mounted in the main body, the fusing device having an outlet to discharge paper, an opening/closing member opening and closing the outlet of the fusing device, a cam member moving the opening/closing member between a first position in which the opening/closing member closes the outlet to prevent heat in the fusing device from being emitted through the outlet and a second position in which the opening/closing member opens the outlet to permit the paper to pass through the outlet, a driving part rotating the cam member, and a control unit controlling the driving part to determine a rotational position of the cam member.

摘要翻译： 公开了一种图像形成装置，其能够通过基本上防止从定影装置向外部的热量发射来最小化盖的温度上升。 图像形成装置包括主体，安装在主体中的定影装置，具有排出纸张的出口的定影装置，打开和关闭定影装置的出口的打开/关闭部件，使打开/ 关闭构件，其中所述打开/关闭构件关闭所述出口的第一位置以防止所述定影装置中的热量通过所述出口发射;以及第二位置，所述打开/关闭构件打开所述出口以允许所述纸张通过 所述出口，使所述凸轮构件旋转的驱动部，以及控制所述驱动部，以确定所述凸轮构件的旋转位置的控制单元。

公开(公告)号：US20120285437A1

公开(公告)日：2012-11-15

申请号：US13466654

申请日：2012-05-08

申请人： Kwang Soon KIM ,  Pung Yeun CHO ,  Dong Jin LEE ,  Je Hyoung RYU ,  Dong Jin OH

发明人： Kwang Soon KIM ,  Pung Yeun CHO ,  Dong Jin LEE ,  Je Hyoung RYU ,  Dong Jin OH

IPC分类号： F24C15/04

CPC分类号： F24C15/04

摘要： Disclosed herein is a door of an electric oven, which has an improved configuration to prevent the escape of heat from a cooking compartment to the outside during cooking or self-cleaning of the cooking compartment. The door, which serves to selectively open or close a cooking compartment of an electric oven, includes a front glass installed to a front surface, a rear glass installed behind the front glass, and a porous plate interposed between the front glass and the rear glass. The porous plate serves to prevent the escape of heat from the cooking compartment to the outside and includes a plurality of view holes to enable observation of the cooking compartment from the outside.

摘要翻译： 本文公开了一种电烤炉的门，其具有改进的构造，以防止在烹饪室的烹饪或自清洁期间将热量从烹饪室逸出到外部。 用于选择性地打开或关闭电炉的烹饪室的门包括安装在前表面的前玻璃，安装在前玻璃后面的后玻璃，以及插入在前玻璃和后玻璃之间的多孔板 。 多孔板用于防止热量从烹饪室逸出到外部，并且包括多个观察孔，以使得能够从外部观察烹饪室。

公开(公告)号：US08200115B2

公开(公告)日：2012-06-12

申请号：US12081951

申请日：2008-04-23

申请人： Gyu Deok Hwang ,  Sung Hyuo Kim ,  Sun Soo Kim ,  Jong Woo Kim ,  Sung Ku Baek ,  Hyun Ki Cho ,  Je Hyoung Ryu ,  Tae Hee Kim

发明人： Gyu Deok Hwang ,  Sung Hyuo Kim ,  Sun Soo Kim ,  Jong Woo Kim ,  Sung Ku Baek ,  Hyun Ki Cho ,  Je Hyoung Ryu ,  Tae Hee Kim

IPC分类号： G03G21/20

CPC分类号： G03G21/206 ,  G03G15/206 ,  G03G2221/1645

摘要： An image forming apparatus capable of minimizing a temperature rise of a cover is disclosed. The image forming apparatus includes a main body, a fusing unit mounted in the main body to fuse an image to paper, a cover mounted to the main body to expose the fusing unit, a heat shielding member mounted proximate to an inner side of the cover to block heat transferred from the fusing unit, an external air circulation chamber formed between the heat shielding member and the cover, in which external air circulates by convection, and at least one external air flow hole, through which the air flows into/out of the external air circulation chamber.

摘要翻译： 公开了能够最小化盖的温度上升的图像形成装置。 图像形成装置包括主体，安装在主体中以将图像熔合到纸张上的定影单元，安装到主体以暴露定影单元的盖，靠近盖的内侧安装的隔热构件 以阻挡从定影单元传递的热量;外部空气循环室，形成在隔热构件和盖子之间，外部空气通过对流循环;至少一个外部空气流通孔，空气流入/流出 外部空气循环室。

公开(公告)号：US20080304855A1

公开(公告)日：2008-12-11

申请号：US12081951

申请日：2008-04-23

申请人： Gyu Deok Hwang ,  Sung Hyuo Kim ,  Sun Soo Kim ,  Jong Woo Kim ,  Sung Ku Baek ,  Hyun Ki Cho ,  Je Hyoung Ryu ,  Tae Hee Kim

发明人： Gyu Deok Hwang ,  Sung Hyuo Kim ,  Sun Soo Kim ,  Jong Woo Kim ,  Sung Ku Baek ,  Hyun Ki Cho ,  Je Hyoung Ryu ,  Tae Hee Kim

IPC分类号： G03G21/20

CPC分类号： G03G21/206 ,  G03G15/206 ,  G03G2221/1645

摘要： An image forming apparatus capable of minimizing a temperature rise of a cover is disclosed. The image forming apparatus includes a main body, a fusing unit mounted in the main body to fuse an image to paper, a cover mounted to the main body to expose the fusing unit, a heat shielding member mounted proximate to an inner side of the cover to block heat transferred from the fusing unit, an external air circulation chamber formed between the heat shielding member and the cover, in which external air circulates by convection, and at least one external air flow hole, through which the air flows into/out of the external air circulation chamber.

摘要翻译： 公开了能够最小化盖的温度上升的图像形成装置。 图像形成装置包括主体，安装在主体中以将图像熔合到纸张上的定影单元，安装到主体以暴露定影单元的盖，靠近盖的内侧安装的隔热构件 以阻挡从定影单元传递的热量;外部空气循环室，形成在隔热构件和盖子之间，外部空气通过对流循环;至少一个外部空气流通孔，空气流入/流出 外部空气循环室。

公开(公告)号：US07283931B2

公开(公告)日：2007-10-16

申请号：US10820747

申请日：2004-04-09

申请人： Je-hyoung Ryu ,  Sung-jin Lee ,  Jun-ho Lee ,  Tae-gyu Kim

发明人： Je-hyoung Ryu ,  Sung-jin Lee ,  Jun-ho Lee ,  Tae-gyu Kim

IPC分类号： G06F11/30 ,  G21C17/00 ,  G01R31/00 ,  G01R31/14

CPC分类号： G01R31/2877

摘要： An inspecting apparatus for a semiconductor device having a match plate; a contact module combined with the match plate, including a radiation unit contacting a semiconductor device, and a test unit pressing leads of the semiconductor device; and a thermally conductive pad installed on a contacting face of the radiation unit of the contact module, to transfer heat from the semiconductor device to the radiation unit of the contact module. The present invention provides an inspecting apparatus for semiconductor devices that improves reliability of testing for durability of semiconductor devices against heat, and minimizes damage to the semiconductor devices during testing.

摘要翻译： 一种具有匹配板的半导体器件的检查装置; 与所述匹配板组合的接触模块，包括接触半导体器件的辐射单元和所述半导体器件的压接引线的测试单元; 以及安装在接触模块的辐射单元的接触面上的导热焊盘，以将热量从半导体器件传递到接触模块的辐射单元。 本发明提供一种用于半导体器件的检查装置，其提高半导体器件耐热耐久性的测试的可靠性，并且在测试期间最小化对半导体器件的损坏。