Methods of Forming Integrated Circuit Capacitors Having Sidewall Supports and Capacitors Formed Thereby
    21.
    发明申请
    Methods of Forming Integrated Circuit Capacitors Having Sidewall Supports and Capacitors Formed Thereby 有权
    形成具有侧壁支撑和形成电容器的集成电路电容器的方法

    公开(公告)号:US20110159660A1

    公开(公告)日:2011-06-30

    申请号:US12906184

    申请日:2010-10-18

    IPC分类号: H01L21/02 H01G13/00

    摘要: In a method of forming a capacitor, a first mold layer pattern including a first insulating material may be formed on a substrate. The first mold layer pattern may have a trench. A supporting layer including a second insulating material may be formed in the trench. The second insulating material may have an etching selectivity with respect to the first insulating material. A second mold layer may be formed on the first mold layer pattern and the supporting layer pattern. A lower electrode may be formed through the second mold layer and the first mold layer pattern. The lower electrode may make contact with a sidewall of the supporting layer pattern. The first mold layer pattern and the second mold layer may be removed. A dielectric layer and an upper electrode may be formed on the lower electrode and the supporting layer pattern.

    摘要翻译: 在形成电容器的方法中,可以在基板上形成包括第一绝缘材料的第一模层图案。 第一模层图案可以具有沟槽。 可以在沟槽中形成包括第二绝缘材料的支撑层。 第二绝缘材料可以具有相对于第一绝缘材料的蚀刻选择性。 可以在第一模层图案和支撑层图案上形成第二模层。 可以通过第二模具层和第一模具层图案形成下部电极。 下电极可以与支撑层图案的侧壁接触。 可以去除第一模层图案和第二模层。 电介质层和上电极可以形成在下电极和支撑层图案上。