NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
    22.
    发明申请
    NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME 审中-公开
    非挥发性半导体存储器件及其制造方法

    公开(公告)号:US20120280303A1

    公开(公告)日:2012-11-08

    申请号:US13366845

    申请日:2012-02-06

    IPC分类号: H01L29/788 H01L21/336

    摘要: According to one embodiment, a first trench extending in a first direction is formed in a stacked structure in which a plurality of spacer films and a plurality of channel semiconductor films are alternately stacked. A first space is formed by forming a recess in the channel semiconductor films from the first trench. A tunnel dielectric film is formed in the first space, and the first space is further filled with a floating gate electrode film. Second trenches that divide the stacked structure at predetermined interval in the first direction are formed so as to divide the floating gate electrode film between memory cells adjacent to each other in the first direction but not to divide the channel semiconductor films.

    摘要翻译: 根据一个实施例,沿着第一方向延伸的第一沟槽以堆叠结构形成,其中多个隔离膜和多个沟道半导体膜交替堆叠。 通过在沟道半导体膜中形成来自第一沟槽的凹部来形成第一空间。 在第一空间中形成隧道电介质膜,并且第一空间进一步填充浮栅电极膜。 形成在第一方向上以预定间隔划分堆叠结构的第二沟槽,以便在第一方向上彼此相邻的存储单元之间划分浮栅电极膜,但不划分沟道半导体膜。