公开(公告)号：US20160284977A1

公开(公告)日：2016-09-29

申请号：US15037524

申请日：2014-11-10

Applicant: MITSUI CHEMICALS, INC.

Inventor： Kazuhiro TANIMOTO ,  Mitsunobu YOSHIDA ,  Shigeo NISHIKAWA

IPC: H01L41/193 ,  H01L41/45 ,  H01L41/333 ,  C08G63/06

CPC classification number: H01L41/193 ,  C08G63/06 ,  H01L41/333 ,  H01L41/45

Abstract: There is provided a polymeric piezoelectric material including a helical chiral polymer (A) having a weight-average molecular weight of from 50,000 to 1,000,000 and an optical purity of more than 97.0% ee but less than 99.8% ee as calculated by the following formula, in which a piezoelectric constant d14 measured at 25° C. by a stress-charge method is 1 pC/N or more: optical purity(% ee)=100×|L-form amount−D-form amount|/(L-form amount+D-form amount),   Formula: [in which an amount of L-form (% by mass) and an amount of D-form of an optically active polymer (% by mass) are values obtained by a method using high-performance liquid chromatography (HPLC)].

Abstract translation: [其中L型（质量％）的量和D-型光学活性聚合物的量（质量％）是通过使用高效液相色谱法（HPLC）的方法获得的值。

公开(公告)号：US20160130387A1

公开(公告)日：2016-05-12

申请号：US14896797

申请日：2014-06-17

Applicant: MITSUI CHEMICALS, INC.

Inventor： Keisuke SATO ,  Kazuhiro TANIMOTO

IPC: C08G63/08

CPC classification number: C08G63/08 ,  B29C55/04 ,  C08J5/18 ,  C08J2367/04 ,  G02B5/3083 ,  H01L41/193

Abstract: A film having a molecular orientation; having an absolute difference ΔRe between the maximum and minimum retardations Re of 100 nm or less in a case wherein the retardations Re are measured at every 0.8 mm along a measured length of 10 mm centered at the center of a principal plane of the film and at a wavelength of 550 nm; and having an average Re (ave) of the retardations Re in a range of from 700 nm to 900 nm or in a range of from 1250 nm to 1450 nm.

Abstract translation: 具有分子取向的膜; 在以膜的主平面的中心为中心的测量长度为10mm的每0.8mm测量延迟Re的情况下，在最大和最小延迟之间具有绝对差Dgr; Re为100nm以下的Re 并在波长550nm处; 并且具有在700nm至900nm范围内或1250nm至1450nm范围内的延迟Re的平均Re（ave）。

公开(公告)号：US20160092016A1

公开(公告)日：2016-03-31

申请号：US14891165

申请日：2014-05-16

Applicant: MITSUI CHEMICALS, INC. ,  MURATA MANUFACTURING CO., LTD.

Inventor： Mitsunobu YOSHIDA ,  Kazuhiro TANIMOTO ,  Shigeo NISHIKAWA

IPC: G06F3/041 ,  G01L1/16

CPC classification number: G06F3/0414 ,  C08L67/04 ,  G01L1/16 ,  G06F3/041 ,  G06F2203/04105 ,  H01L41/1132 ,  H01L41/193

Abstract: The invention provides a pressure detecting device containing a pressurized member having a contact surface that is subjected to pressure due to contact with a pressurizing means; and a piezoelectric member that is arranged facing the pressurized member and that includes a polymeric piezoelectric material having a piezoelectric constant d14 of 1 pm/V or more as measured by a displacement method at 25° C., and a ratio IEb/IEa between a product IEb of a cross-sectional secondary moment Ib and a Young's modulus Eb of the pressurized member, and a product IEa of a cross-sectional secondary moment Ia and a Young's modulus Ea of the piezoelectric member, is in a range of from 102 to 1010.

Abstract translation: 本发明提供了一种压力检测装置，其包含加压构件，所述加压构件具有由于与加压装置接触而受到压力的接触面; 以及压电构件，其被布置为面对所述加压构件，并且包括通过在25℃下的置换方法测量的具有1pm / V或更大的压电常数d14的聚合物压电材料和在25℃下的比率IEb / IEa 横截面二次方矩Ib的产物IEb和加压构件的杨氏模量Eb以及压电构件的横截面二次矩Ia和杨氏模量Ea的乘积IEa在102〜 1010。