Micrometer
    27.
    发明授权
    Micrometer 有权
    千分尺

    公开(公告)号:US09372059B2

    公开(公告)日:2016-06-21

    申请号:US14473444

    申请日:2014-08-29

    CPC classification number: G01B3/18

    Abstract: A micrometer with good usability is provided. A micrometer has a frame with an anvil at one end and a spindle at another end, the spindle moving closer to or further away from the anvil. The frame is covered with a heat shield cover. The heat shield cover has a first anti-slip part. The first anti-slip part preferably has a plurality of protrusions.

    Abstract translation: 提供了具有良好可用性的千分尺。 千分尺具有在一端具有砧座的框架,另一端具有主轴,主轴移动靠近或远离砧座。 框架覆盖有隔热罩。 隔热罩具有第一防滑部分。 第一防滑部优选具有多个突起。

    Surface roughness measuring unit and coordinate measuring apparatus
    28.
    发明授权
    Surface roughness measuring unit and coordinate measuring apparatus 有权
    表面粗糙度测量单元和坐标测量仪

    公开(公告)号:US09250053B2

    公开(公告)日:2016-02-02

    申请号:US14050553

    申请日:2013-10-10

    Abstract: A surface roughness measuring unit according to the present invention includes a contact pin unit having a contact pin and a displacement detector, the contact pin being provided so as to project and retract through a through-hole of a skid and scanning and moving along a surface of a work piece, the displacement detector detecting displacement of the contact pin in a direction perpendicular to the work piece surface; a driver moving the contact pin unit forward and backward along the surface of the work piece; and a joint coupling the contact pin unit and the driver to a measurement head holder of a coordinate measuring system. The surface roughness measuring unit further includes a contact detector that detects contact of the skid on the surface of the work piece.

    Abstract translation: 根据本发明的表面粗糙度测量单元包括具有接触销和位移检测器的接触针单元,所述接触销设置成通过滑动件的通孔突出和缩回并沿着表面移动 位移检测器检测接触销在垂直于工件表面的方向上的位移; 驱动器沿着工件的表面向前和向后移动接触销单元; 以及将接触针单元和驱动器联接到坐标测量系统的测量头保持器。 所述表面粗糙度测量单元还包括接触检测器,其检测所述工件在所述工件的表面上的接触。

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