公开(公告)号：US09506880B2

公开(公告)日：2016-11-29

申请号：US14311659

申请日：2014-06-23

Applicant: PANalytical B.V.

Inventor： Detlef Beckers ,  Milen Gateshki

IPC: G01N23/207 ,  G01N23/205 ,  G01N23/20

CPC classification number: G01N23/205 ,  G01N23/20008 ,  G01N2223/40

Abstract: A method of imaging phases in an inhomogeneous polycrystalline sample having a plurality of crystallites of at least a first crystalline component includes illuminating an illuminated area extending across a surface of a sample with substantially monochromatic X-rays incident at a Bragg-Brentano parafocussing geometry at first angle θ1 to the surface of the sample. X-rays diffracted by the sample at a second angle θ2 pass through a pinhole. The diffraction angle θ1+θ2 fulfils a Bragg condition for the first crystalline component which is imaged by a detector to provide a two-dimensional image of the first crystalline component at the surface of the sample.

Abstract translation: 在具有至少第一结晶成分的多个晶体的不均匀多晶样品中成像相位的方法包括：首先照射以布拉格 - 布伦塔诺拼搏几何入射的基本上单色X射线的样品表面延伸的照射区域 与样品表面的角度θ1。 由样品以第二角度θ2衍射的X射线穿过针孔。 衍射角θ1+θ2满足由检测器成像的第一结晶成分的布拉格条件，以在样品的表面提供第一结晶成分的二维图像。