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    Testing fuse configurations in semiconductor devices
    23.
    发明授权
    Testing fuse configurations in semiconductor devices 有权
    测试半导体器件中的保险丝配置

    公开(公告)号：US09568544B2

    公开(公告)日：2017-02-14

    申请号：US14250191

    申请日：2014-04-10

    Applicant: RAMBUS INC.

    Inventor： Adrian E. Ong ,  Paul Fuller ,  Nick van Heel ,  Mark Thomann

    IPC: G01R31/02 ,  G01R31/28 ,  G01R31/317

    CPC classification number: G01R31/31722 ,  G01R31/2851 ,  G01R31/31723 ,  H01L2224/05554 ,  H01L2224/48137 ,  H01L2224/48145 ,  H01L2924/00012

    Abstract: A system includes a first integrated circuit configured to operate in at least a normal mode and a test mode and a second integrated circuit, where both the first integrated circuit and the second integrated circuit are disposed within a same semiconductor device package. The system further includes a first terminal, external to the semiconductor device package, electronically coupled to the first integrated circuit and the second integrated circuit. The first terminal is electronically coupled to a buffer in the second integrated circuit and used to convey signals to or from the first integrated circuit.

    Abstract translation: 一种系统包括被配置为在至少正常模式和测试模式下工作的第一集成电路和第二集成电路，其中第一集成电路和第二集成电路均设置在相同的半导体器件封装内。 该系统还包括电子耦合到第一集成电路和第二集成电路的半导体器件封装外部的第一端子。 第一端子电耦合到第二集成电路中的缓冲器，并用于将信号传送到第一集成电路或从第一集成电路传送信号。

    Controller to detect malfunctioning address of memory device
    25.
    发明授权
    Controller to detect malfunctioning address of memory device 有权
    控制器检测存储设备的故障地址

    公开(公告)号：US09269460B2

    公开(公告)日：2016-02-23

    申请号：US14840989

    申请日：2015-08-31

    Applicant: RAMBUS INC.

    Inventor： Adrian E. Ong ,  Fan Ho

    IPC: G11C29/00 ,  G11C29/04

    CPC classification number: G11C29/76 ,  G11C11/401 ,  G11C11/4085 ,  G11C29/027 ,  G11C29/04 ,  G11C29/12 ,  G11C29/4401 ,  G11C29/48 ,  G11C29/78 ,  G11C29/789 ,  G11C29/802 ,  G11C2229/743

    Abstract: A controller includes a memory test logic circuit to detect a malfunctioning row of primary data storage elements within an external memory device, an internal memory to store an address corresponding to the malfunctioning row of the external memory device, and a memory setup logic circuit to initiate a repair mode in the external memory device and to end the repair mode in the external memory device. The controller further includes a port to couple to an address line to transmit the address corresponding to the malfunctioning row of the external memory device.

    Abstract translation: 控制器包括：存储器测试逻辑电路，用于检测外部存储器件内主要数据存储元件的故障行;存储与外部存储器件故障行对应的地址的内部存储器;以及存储器设置逻辑电路，以启动 外部存储器件中的修复模式，并结束外部存储器件中的修复模式。 控制器还包括耦合到地址线以传送对应于外部存储器件的故障行的地址的端口。

    CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE
    26.
    发明申请
    CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE 有权
    控制器检测存储器件的故障地址

    公开(公告)号：US20150371722A1

    公开(公告)日：2015-12-24

    申请号：US14840989

    申请日：2015-08-31

    Applicant: RAMBUS INC.

    Inventor： Adrian E. Ong ,  Fan Ho

    IPC: G11C29/00 ,  G11C29/04

    CPC classification number: G11C29/76 ,  G11C11/401 ,  G11C11/4085 ,  G11C29/027 ,  G11C29/04 ,  G11C29/12 ,  G11C29/4401 ,  G11C29/48 ,  G11C29/78 ,  G11C29/789 ,  G11C29/802 ,  G11C2229/743

    Abstract: A controller includes a memory test logic circuit to detect a malfunctioning row of primary data storage elements within an external memory device, an internal memory to store an address corresponding to the malfunctioning row of the external memory device, and a memory setup logic circuit to initiate a repair mode in the external memory device and to end the repair mode in the external memory device. The controller further includes a port to couple to an address line to transmit the address corresponding to the malfunctioning row of the external memory device.

    Abstract translation: 控制器包括：存储器测试逻辑电路，用于检测外部存储器件内主要数据存储元件的故障行;存储与外部存储器件故障行对应的地址的内部存储器;以及存储器设置逻辑电路，以启动 外部存储器件中的修复模式，并结束外部存储器件中的修复模式。 控制器还包括耦合到地址线以传送对应于外部存储器件的故障行的地址的端口。

    CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE
    27.
    发明申请
    CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE 有权
    控制器检测存储器件的故障地址

    公开(公告)号：US20130283110A1

    公开(公告)日：2013-10-24

    申请号：US13872947

    申请日：2013-04-29

    Applicant: RAMBUS INC.

    Inventor： Adrian E. Ong ,  Fan Ho

    IPC: G11C29/44

    CPC classification number: G11C29/76 ,  G11C11/401 ,  G11C11/4085 ,  G11C29/027 ,  G11C29/04 ,  G11C29/12 ,  G11C29/4401 ,  G11C29/48 ,  G11C29/78 ,  G11C29/789 ,  G11C29/802 ,  G11C2229/743

    Abstract: A controller including a non-volatile memory to store a repair address, and a memory control unit operatively coupled with the non-volatile memory. The memory control unit comprising a memory test function configured to detect a malfunctioning address of primary data storage elements within a memory device. The memory device being another semiconductor device separate from the controller. The memory test function configured to store the repair address in the non-volatile memory, the repair address indicating the malfunctioning address of the primary data storage element.

    Abstract translation: 一种包括用于存储修复地址的非易失性存储器的控制器，以及与非易失性存储器可操作地耦合的存储器控​​制单元。 存储器控制单元包括存储器测试功能，其被配置为检测存储器设备内主要数据存储元件的故障地址。 存储器件是与控制器分开的另一个半导体器件。 所述存储器测试功能被配置为将所述修复地址存储在所述非易失性存储器中，所述修复地址指示所述主数据存储元件的故障地址。

    Controller to detect malfunctioning address of memory device
    28.
    发明授权
    Controller to detect malfunctioning address of memory device 有权

    公开(公告)号：US10446256B2

    公开(公告)日：2019-10-15

    申请号：US16015941

    申请日：2018-06-22

    Applicant: Rambus Inc.

    Inventor： Adrian E. Ong ,  Fan Ho

    IPC: G11C29/04 ,  G11C29/00 ,  G11C29/44 ,  G11C29/48 ,  G11C11/401 ,  G11C29/12 ,  G11C11/408 ,  G11C29/02

    Abstract: A controller includes an internal memory to store an address and a memory control unit operatively coupled with the internal memory. The memory control unit includes logic to identify a malfunctioning address of primary data storage elements within an external memory device, the external memory device being another semiconductor device separate from the controller, store the malfunctioning address in the internal memory, and transmit, to the external memory device, a command to initiate a repair of the malfunctioning address using redundant data storage elements and an indication of an address associated with the malfunctioning address.

    CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE
    30.
    发明申请
    CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE 有权
    控制器检测存储器件的故障地址

    公开(公告)号：US20160042812A1

    公开(公告)日：2016-02-11

    申请号：US14918148

    申请日：2015-10-20

    Applicant: RAMBUS INC.

    Inventor： Adrian E. Ong ,  Fan Ho

    IPC: G11C29/00 ,  G11C29/12 ,  G11C11/401

    CPC classification number: G11C29/76 ,  G11C11/401 ,  G11C11/4085 ,  G11C29/027 ,  G11C29/04 ,  G11C29/12 ,  G11C29/4401 ,  G11C29/48 ,  G11C29/78 ,  G11C29/789 ,  G11C29/802 ,  G11C2229/743

    Abstract: A controller includes an internal memory to store an address and a memory control unit operatively coupled with the internal memory. The memory control unit includes logic to identify a malfunctioning address of primary data storage elements within an external memory device, the external memory device being another semiconductor device separate from the controller, store the malfunctioning address in the internal memory, and transmit, to the external memory device, a command to initiate a repair of the malfunctioning address using redundant data storage elements and an indication of an address associated with the malfunctioning address.

    Abstract translation: 控制器包括用于存储地址的内部存储器和与内部存储器可操作地耦合的存储器控​​制单元。 存储器控制单元包括用于识别外部存储器件内的主要数据存储元件的故障地址的逻辑，外部存储器件是与控制器分离的另一个半导体器件，将故障地址存储在内部存储器中，并传输到外部存储器 存储器装置，使用冗余数据存储元件发起故障地址的修复的命令以及与故障地址相关联的地址的指示。

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