PROGRAMMABLE MEMORY REPAIR SCHEME
    6.
    发明申请
    PROGRAMMABLE MEMORY REPAIR SCHEME 有权
    可编程存储器维修方案

    公开(公告)号:US20140247678A1

    公开(公告)日:2014-09-04

    申请号:US14150659

    申请日:2014-01-08

    Applicant: RAMBUS INC.

    Abstract: A controller including a non-volatile memory to store a repair address, and a memory control unit operatively coupled with the non-volatile memory. The memory control unit comprising a memory test function configured to detect a malfunctioning address of primary data storage elements within a memory device. The memory device being another semiconductor device separate from the controller. The memory test function configured to store the repair address in the non-volatile memory, the repair address indicating the malfunctioning address of the primary data storage element.

    Abstract translation: 一种包括用于存储修复地址的非易失性存储器的控制器,以及与非易失性存储器可操作地耦合的存储器控​​制单元。 存储器控制单元包括存储器测试功能,其被配置为检测存储器设备内主要数据存储元件的故障地址。 存储器件是与控制器分开的另一个半导体器件。 所述存储器测试功能被配置为将所述修复地址存储在所述非易失性存储器中,所述修复地址指示所述主数据存储元件的故障地址。

    Controller to detect malfunctioning address of memory device
    7.
    发明授权
    Controller to detect malfunctioning address of memory device 有权
    控制器检测存储设备的故障地址

    公开(公告)号:US08670283B2

    公开(公告)日:2014-03-11

    申请号:US13872947

    申请日:2013-04-29

    Applicant: Rambus Inc.

    Abstract: A controller including a non-volatile memory to store a repair address, and a memory control unit operatively coupled with the non-volatile memory. The memory control unit comprising a memory test function configured to detect a malfunctioning address of primary data storage elements within a memory device. The memory device being another semiconductor device separate from the controller. The memory test function configured to store the repair address in the non-volatile memory, the repair address indicating the malfunctioning address of the primary data storage element.

    Abstract translation: 一种包括用于存储修复地址的非易失性存储器的控制器,以及与非易失性存储器可操作地耦合的存储器控​​制单元。 存储器控制单元包括存储器测试功能,其被配置为检测存储器设备内主要数据存储元件的故障地址。 存储器件是与控制器分开的另一个半导体器件。 所述存储器测试功能被配置为将所述修复地址存储在所述非易失性存储器中,所述修复地址指示所述主数据存储元件的故障地址。

    Controller to detect malfunctioning address of memory device

    公开(公告)号:US10446256B2

    公开(公告)日:2019-10-15

    申请号:US16015941

    申请日:2018-06-22

    Applicant: Rambus Inc.

    Abstract: A controller includes an internal memory to store an address and a memory control unit operatively coupled with the internal memory. The memory control unit includes logic to identify a malfunctioning address of primary data storage elements within an external memory device, the external memory device being another semiconductor device separate from the controller, store the malfunctioning address in the internal memory, and transmit, to the external memory device, a command to initiate a repair of the malfunctioning address using redundant data storage elements and an indication of an address associated with the malfunctioning address.

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