公开(公告)号：US10242752B2

公开(公告)日：2019-03-26

申请号：US15216702

申请日：2016-07-22

Applicant: Silicon Motion, Inc.

Inventor： Sheng-Yuan Huang ,  Wen-Wu Tseng

IPC: G11C29/00 ,  G11C29/38 ,  G11C29/44 ,  G11C29/36

Abstract: A method for screening bad columns applicable to a data storage medium is disclosed. The method for screening bad columns includes steps of: reading out written data of at least one of the data pages of at least one of the data blocks; comparing the written data with predetermined data to obtain a number of error bits in each of the columns in each of the segments in the at least one of the data pages, and accordingly calculating a total number of error bits in each of the segments; determining a segment having a largest total number of error bits from the segments, and determining and recording a column having a largest number of error bits from the segment having the largest total number of error bits as a bad column. A data storage device saving a bad column summary table is also disclosed.