公开(公告)号：US20210193589A1

公开(公告)日：2021-06-24

申请号：US16719984

申请日：2019-12-19

Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.

Inventor： Hao-Jan Pei ,  Ching-Hua Hsieh ,  Hsiu-Jen Lin ,  Wei-Yu Chen ,  Chia-Shen Cheng ,  Chih-Chiang Tsao ,  Jen-Jui Yu ,  Cheng-Shiuan Wong

IPC: H01L23/00 ,  H01L23/31 ,  H01L23/498 ,  H01L21/56

Abstract: Provided is a package structure, including a die, a plurality of through vias, an encapsulant, a plurality of first connectors, a warpage control material and a protection material. The plurality of through vias are disposed around the die. The encapsulant laterally encapsulate the die and the plurality of through vias. The plurality of first connectors are electrically connected to the plurality of through vias. The warpage control material is disposed over a first surface of the die. The protection material is disposed over the encapsulant, around the plurality of first connectors and the warpage control material.