公开(公告)号：US20020185612A1

公开(公告)日：2002-12-12

申请号：US10137715

申请日：2002-05-02

Inventor： Alex Chalmers ,  Charles Squires

IPC: G01N023/201

CPC classification number: G01V5/0025 ,  G01V5/02

Abstract: An apparatus for inspecting a physical object in a nautical environment includes a radiation source capable of directing a beam of penetrating radiation toward the physical object, and a detector capable of detecting the reaction of the physical object to the penetrating radiation. In addition to detecting the reaction, the detector is capable of delivering an output signal characterizing the physical object. Accordingly, the output signal is based upon the reaction of the physical object to the penetrating radiation.

Abstract translation: 用于在航海环境中检查物理物体的装置包括能够将穿透辐射束引导到物理物体的辐射源，以及能够检测物理对象与穿透辐射的反应的检测器。 除了检测反应之外，检测器还能够输出表征物理对象的输出信号。 因此，输出信号基于物理对象与穿透辐射的反应。

公开(公告)号：US20020110218A1

公开(公告)日：2002-08-15

申请号：US10124776

申请日：2002-04-17

Inventor： Louis N. Koppel ,  Craig E. Uhrich ,  Jon Opsal

IPC: G01N023/201

CPC classification number: G01N23/20

Abstract: The present invention relates to the calibration and alignment of an X-ray reflectometry (nullXRRnull) system for measuring thin films. An aspect of the present invention describes a method for accurately determining CO for each sample placement and for finding the incident X-ray intensity corresponding to each pixel of a detector array and thus permitting an amplitude calibration of the reflectometer system. Another aspect of the present invention relates to a method for aligning an angle-resolved X-ray reflectometer that uses a focusing optic, which may preferably be a Johansson crystal. Another aspect of the present invention is to validate the focusing optic. Another aspect of the present invention relates to the alignment of the focusing optic with the X-ray source. Another aspect of the present invention concerns the correction of measurements errors caused by the tilt or slope of the sample. Yet another aspect of the present invention concerns the calibration of the vertical position of the sample.

Abstract translation: 本发明涉及用于测量薄膜的X射线反射测量（“XRR”）系统的校准和对准。 本发明的一个方面描述了一种用于精确地确定每个样本放置的CO并且用于找到对应于检测器阵列的每个像素的入射X射线强度并因此允许反射计系统的幅度校准的方法。 本发明的另一方面涉及一种用于对准使用聚焦光学元件的角度分辨X射线反射计的方法，其可以优选地是约翰逊晶体。 本发明的另一方面是验证聚焦光学元件。 本发明的另一方面涉及聚焦光学元件与X射线源的对准。 本发明的另一方面涉及由样品的倾斜或斜率引起的测量误差的校正。 本发明的另一方面涉及对样品的垂直位置的校准。

公开(公告)号：US20010033636A1

公开(公告)日：2001-10-25

申请号：US09760418

申请日：2001-01-16

Inventor： Martin Hartick ,  Frank Cordes

IPC: G01N023/201

CPC classification number: G01V5/0016 ,  G01N23/20 ,  G01V5/0025 ,  G01V5/0041 ,  G21K5/04

Abstract: A method for determining the material of a detected item in objects, especially explosives in luggage, using X-ray diffraction. In this method, wherein scatter radiation deflected at the crystal source of the material is measured and compared to characteristic energy spectra or diffraction spectra of the various explosives, the absorption by the material influences the X-ray diffraction spectrum, so that information is missing, and inaccurate conclusions may be drawn regarding the material. To improve this method, the primary beam of an X-ray source is used for measuring the absorption. The beam passes through the material, and, from the absorption, an average atomic number of the material is determined, and this information additionally is used in the comparison to known diffraction spectra. For this purpose, a collimation/detector arrangement preferably has only one collimator (8) and one detector (9), with the collimator (8) having a conically-expanding circular slot (1), which simulates a predetermined angle of the beam path, and a central blind bore (1) opening toward the X-ray source. First and second detectors (13, 14) are disposed in the bore to detect lower and higher X-ray energy, respectively.

Abstract translation: 使用X射线衍射来确定物体，特别是行李中的爆炸物中检测到的物品的材料的方法。 在该方法中，测量在材料的晶体源处偏转的散射辐射，并与各种爆炸物的特征能谱或衍射光谱进行比较，由该材料的吸收影响X射线衍射光谱，使得信息丢失， 并且可以对材料提供不准确的结论。 为了改善这种方法，使用X射线源的主光束来测量吸收。 光束通过材料，并且从吸收中确定材料的平均原子数，并且该信息另外用于与已知衍射光谱的比较。 为此，准直/检测器装置优选地仅具有一个准直器（8）和一个检测器（9），其中准直器（8）具有锥形扩展的圆形槽（1），其模拟光束路径的预定角度 和朝向X射线源开口的中心盲孔（1）。 第一和第二检测器（13,14）设置在孔中以分别检测较低和较高的X射线能量。