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公开(公告)号:US20220336328A1
公开(公告)日:2022-10-20
申请号:US17850819
申请日:2022-06-27
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Deepak C. Sekar , Brian Cronquist
IPC: H01L23/48 , H01L27/06 , H01L27/088 , H01L27/11551 , H01L27/108 , H01L29/732 , H01L27/11526 , H01L27/118 , H01L29/10 , H01L29/808 , H01L27/11573 , H01L29/66 , H01L27/02 , H01L27/11578 , H01L29/78 , H01L21/74 , H01L23/544 , H01L23/34 , H01L23/50
Abstract: A 3D semiconductor device including: a first level including a single crystal silicon layer and a plurality of first transistors each including a single crystal channel; a first metal layer overlaying the plurality of first transistors; a second metal layer overlaying the first metal layer; a third metal layer overlaying the second metal layer; a second level, where the second level overlays the first level and includes a plurality of second transistors; a fourth metal layer overlaying the second level; and a connective path between the fourth metal layer and either the third metal layer or the second metal layer, where the connective path includes a via disposed through the second level and has a diameter of less than 500 nm and greater than 5 nm, where the third metal layer is connected to provide a power or ground signal to at least one of the second transistors.
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公开(公告)号:US20220318477A1
公开(公告)日:2022-10-06
申请号:US17841619
申请日:2022-06-15
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Zeev Wurman
IPC: G06F30/392 , G06F30/394
Abstract: A method of designing 3D Integrated Circuits including: partitioning at least one design into at least two levels, a first and second level, where the first level includes logic, the second level includes memory; and then receiving a first placement of at least portion of the second level, where the first placement includes a placement of a first memory array, where the Circuit includes a plurality of connections between the first level and second level; performing a second placement of the first level based on the first placement, the performing a second placement includes using a placer computer executed, where the placer is a part of a Computer Aided Design tool, where the logic includes a first logic circuit configured to write data to the first memory array, and where performing the second placement includes placing the first logic circuit based on the first placement of the first memory array.
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公开(公告)号:US11437368B2
公开(公告)日:2022-09-06
申请号:US17717094
申请日:2022-04-10
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Deepak C. Sekar , Brian Cronquist
IPC: H01L27/06 , H01L23/66 , H01L27/146 , H01L27/15
Abstract: A multi-level semiconductor device, the device including: a first level including integrated circuits; a second level including a structure designed to conduct electromagnetic waves, where the second level is disposed above the first level, where the first level includes crystalline silicon; and an oxide layer disposed between the first level and the second level, where the second level is bonded to the oxide layer, and where the bonded includes oxide to oxide bonds.
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公开(公告)号:US20220246682A1
公开(公告)日:2022-08-04
申请号:US17718932
申请日:2022-04-12
Applicant: Monolithic 3D Inc.
Inventor: Deepak C. Sekar , Zvi Or-Bach
IPC: H01L27/24 , H01L21/268 , H01L21/683 , H01L21/762 , H01L21/822 , H01L21/84 , H01L27/06 , H01L27/108 , H01L27/11 , H01L27/11529 , H01L27/11551 , H01L27/11578 , H01L27/12 , H01L29/78 , H01L29/423 , H01L27/22
Abstract: A method for producing a 3D semiconductor device, the method comprising: providing a first level, said first level comprising a first single crystal layer; forming first alignment marks and control circuits in and/or on said first level, wherein said control circuits comprise first single crystal transistors, and wherein said control circuits comprise at least two interconnection metal layers; forming at least one second level disposed on top of said control circuits; performing a first etch step into said second level; and performing additional processing steps to form a plurality of first memory cells within said second level, wherein each of said memory cells comprise at least one second transistors, and wherein said additional processing steps comprise depositing a gate electrode for said second transistors.
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公开(公告)号:US20220216070A1
公开(公告)日:2022-07-07
申请号:US17705392
申请日:2022-03-28
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Brian Cronquist , Deepak Sekar
IPC: H01L21/48 , H01L23/498 , H01L23/34 , H01L27/02 , H01L21/8234 , H01L27/06 , H01L27/098 , H01L23/522 , H01L23/367 , H01L27/092 , H01L25/00 , H01L23/60 , H01L25/065
Abstract: A 3D semiconductor device a first level, where the first level includes a first layer which includes first transistors, where the first level includes a second layer, the second layer including first interconnections; a second level overlaying the first level, where the second level includes a third layer which includes second transistors, and where the second level includes a fourth layer, the fourth layer including second interconnections and a plurality of connection paths, where the plurality of connection paths provides connections from a plurality of the first transistors to a plurality of the second transistors, where the second level is bonded to the first level, where the bonded includes oxide to oxide bond regions, where the bonded includes metal to metal bond regions, where the second level includes at least one first ElectroStatic Discharge (ESD) circuit, and where the first level includes at least one second ESD circuit.
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公开(公告)号:US20220208812A1
公开(公告)日:2022-06-30
申请号:US17699099
申请日:2022-03-19
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Deepak C. Sekar
IPC: H01L27/146 , H01L33/16 , H01L25/075 , H01L27/15 , H01L33/62
Abstract: A 3D micro display, the 3D micro display including: a first level including a first single crystal layer, the first single crystal layer includes at least one LED driving circuit; a second level including a first plurality of light emitting diodes (LEDs), the first plurality of LEDs including a second single crystal layer, where the second level is disposed on top of the first level, where the second level includes at least ten individual first LED pixels; and a bonding structure, where the bonding structure includes oxide to oxide bonding.
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公开(公告)号:US20220157983A1
公开(公告)日:2022-05-19
申请号:US17586730
申请日:2022-01-27
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Brian Cronquist
IPC: H01L29/78 , H01L29/66 , H01L29/417
Abstract: A 3D semiconductor device, the device including: a first level, where the first level includes a first layer, the first layer including first transistors, and where the first level includes a second layer, the second layer including first interconnections; a second level overlaying the first level, where the second level includes a third layer, the third layer including second transistors, and where the second level includes a fourth layer, the fourth layer including second interconnections; a plurality of connection paths, where the plurality of connection paths provide first connections from a plurality of the first transistors to a plurality of the second transistors, where the second level is bonded to the first level, where the bonded includes oxide to oxide bond regions, where the bonded includes metal to metal bond regions, where the third layer includes crystalline silicon, and where the second level includes a plurality of capacitors.
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公开(公告)号:US20220130905A1
公开(公告)日:2022-04-28
申请号:US17572550
申请日:2022-01-10
Applicant: Monolithic 3D Inc.
Inventor: Deepak C. Sekar , Zvi Or-Bach
IPC: H01L27/24 , H01L21/268 , H01L21/683 , H01L21/762 , H01L21/822 , H01L21/84 , H01L27/06 , H01L27/108 , H01L27/11 , H01L27/11529 , H01L27/11551 , H01L27/11578 , H01L27/12 , H01L29/78 , H01L29/423 , H01L27/22
Abstract: A semiconductor device, the device including: a plurality of transistors, where at least one of the plurality of transistors includes a first single crystal source, channel, and drain, where at least one of the plurality of transistors includes a second single crystal source, channel, and drain, where the second single crystal source, channel, and drain is disposed above the first single crystal source, channel, and drain, where at least one of the plurality of transistors includes a third single crystal source, channel, and drain, where the third single crystal source, channel, and drain is disposed above the second single crystal source, channel, and drain, where at least one of the plurality of transistors includes a fourth single crystal source, channel, and drain, and where the first single crystal source or drain, and the second single crystal source or drain each include n+ doped regions.
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公开(公告)号:US20220122877A1
公开(公告)日:2022-04-21
申请号:US17566690
申请日:2021-12-31
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Brian Cronquist , Deepak C. Sekar
IPC: H01L21/683 , H01L21/74 , H01L21/762 , H01L21/768 , H01L21/822 , H01L21/8238 , H01L21/84 , H01L23/48 , H01L23/525 , H01L27/02 , H01L27/06 , H01L27/092 , H01L27/10 , H01L27/105 , H01L27/108 , H01L27/11 , H01L27/112 , H01L27/11526 , H01L27/11529 , H01L27/11551 , H01L27/11573 , H01L27/11578 , H01L27/118 , H01L27/12 , H01L29/423 , H01L29/66 , H01L29/78 , H01L29/788 , H01L29/792 , G11C8/16
Abstract: A 3D semiconductor device, the device including: a first level including a first single crystal layer, the first level including first transistors, where the first transistors each include a single crystal channel; first metal layers interconnecting at least the first transistors; and a second level including a second single crystal layer, the second level including second transistors, where the second level overlays the first level, where the second level is bonded to the first level, where the bonded includes oxide to oxide bonds, where the second transistors each include at least two side-gates, and where through the first metal layers power is provided to at least one of the second transistors.
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公开(公告)号:US11309292B2
公开(公告)日:2022-04-19
申请号:US17536019
申请日:2021-11-27
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Brian Cronquist
IPC: H01L23/00 , H01L25/065 , H01L21/768 , H01L23/48 , H01L23/485 , H01L23/522 , H01L27/06 , H01L29/66 , H01L21/74 , H01L25/00 , H01L27/088 , H01L27/092 , H01L29/423 , H01L29/78
Abstract: A semiconductor device, the device including: a first silicon layer including a first single crystal silicon; a first metal layer over the first silicon layer; a second metal layer over the first metal layer; a first level including a plurality of transistors over the second metal layer, where the plurality of transistors include a second single crystal silicon; a third metal layer over the first level; a fourth metal layer over the third metal layer, where the fourth metal layer is aligned to the first metal layer with less than 40 nm alignment error; and a via disposed through the first level, where the via has a diameter of less than 450 nm.
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