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公开(公告)号:US20200031014A1
公开(公告)日:2020-01-30
申请号:US16591058
申请日:2019-10-02
Applicant: CORNING INCORPORATED
Inventor: Michael Edward Badding , William Joseph Bouton , Lanrik Wayne Kester , Thomas Dale Ketcham , Andrew Peter Kittleson , Dale Charles Marshall , Gary Edward Merz , Eric Lee Miller , Emmanuel Chima Okpara , Conor James Walsh
IPC: B28B11/24 , C04B35/115 , C04B35/638 , C04B35/486 , C04B35/64
Abstract: A manufacturing system includes a tape advancing through the manufacturing system and a station of the manufacturing system. The tape includes a first portion having grains of an inorganic material bound by an organic binder. The station of the manufacturing system receives the first portion of the tape and prepares the tape for sintering by chemically changing the organic binder and/or removing the organic binder from the first portion of the tape, leaving the grains of the inorganic material, to form a second portion of the tape and, at least in part, prepare the tape for sintering.
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公开(公告)号:US20190169072A1
公开(公告)日:2019-06-06
申请号:US16269121
申请日:2019-02-06
Applicant: CORNING INCORPORATED
Inventor: Daniel Edward McCauley , Maxime Moreno , Conor James Walsh , Stephanie Stoughton Wu
IPC: C04B35/14 , C04B35/185 , C04B35/195 , C04B35/478 , C04B35/565 , C04B35/632 , C04B38/00 , C04B35/10
Abstract: According to embodiments, a batch mixture includes inorganic components, a non-polar carbon chain lubricant, and an organic surfactant having a polar head. The non-polar carbon chain lubricant and the organic surfactant are present in concentrations satisfying the relationship: B(C1(d+d0)+C2(f+f0))=SC, where: d0+d is an amount of non-polar carbon chain lubricant in percent by weight of the inorganic components, by super addition; f0+f is an amount of organic surfactant in percent by weight of the inorganic components, by super addition; B is a scaling factor; C1 is a scaling factor of the concentration of the non-polar carbon chain lubricant; and C2 is a scaling factor of the concentration of the organic surfactant. Embodiments provide that 3.6≤SC≤14.
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公开(公告)号:US20180104848A1
公开(公告)日:2018-04-19
申请号:US15847310
申请日:2017-12-19
Applicant: Corning Incorporated
Inventor: Michael Edward Badding , William Joseph Bouton , Lanrik Wayne Kester , Thomas Dale Ketcham , Andrew Peter Kittleson , Dale Charles Marshall , Gary Edward Merz , Eric Lee Miller , Emmanuel Chima Okpara , Conor James Walsh
IPC: B28B11/24
CPC classification number: B28B11/243 , C04B35/115 , C04B35/486 , C04B35/638 , C04B35/64 , C04B2235/3225 , C04B2235/6025 , C04B2235/612 , C04B2235/65 , C04B2235/656 , C04B2235/9615
Abstract: A manufacturing system includes a tape advancing through the manufacturing system and a station of the manufacturing system. The tape includes a first portion having grains of an inorganic material bound by an organic binder. The station of the manufacturing system receives the first portion of the tape and prepares the tape for sintering by chemically changing the organic binder and/or removing the organic binder from the first portion of the tape, leaving the grains of the inorganic material, to form a second portion of the tape and, at least in part, prepare the tape for sintering.
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公开(公告)号:US20170355102A1
公开(公告)日:2017-12-14
申请号:US15527958
申请日:2015-11-20
Applicant: Corning Incorporated
Inventor: Joseph Henry Citriniti , Conor James Walsh
CPC classification number: B28B17/0072 , B28B3/269 , B28B11/14 , B28B11/243 , B28B2003/203 , B29C48/11 , B29C48/30 , B29C48/302 , B29C48/92 , B29C2948/92114 , B29C2948/92295 , B29C2948/92428 , B29C2948/92514 , B29C2948/92609 , B29C2948/92704 , B29C2948/92904 , B29L2031/608 , G01N21/952 , G01N21/95692 , G01N2201/06113
Abstract: In-line inspection and control system to in-situ monitor an extrudate during extrusion. A light beam illuminates a line on the outside circumference of the extrudate skin recording the curvature. A master profile of the illuminated defect-free skin is recorded and compared to successive monitoring of the illuminated skin. Differences from the comparison indicate skin and/or shape defects. A real-time feedback to automatically adjust process control hardware reduces or eliminates the skin and shape defects based on the monitoring and comparison.
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