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公开(公告)号:US20160170197A1
公开(公告)日:2016-06-16
申请号:US14934412
申请日:2015-11-06
Applicant: GENERAL ELECTRIC COMPANY
Abstract: Approaches are disclosed for calibrating a plurality of imaging devices, such as microscopes. In certain implementations, a calibration plate is employed that includes a variety of calibration features. The calibration features comprise a geometric calibration, an illumination calibration, and an optical calibration. Imaging devices calibrated in accordance with the present approaches may be used to generate images having consistent attributes, such as brightness, regardless of which imaging device is employed.
Abstract translation: 公开了用于校准诸如显微镜的多个成像装置的方法。 在某些实施方案中,采用包括各种校准特征的校准板。 校准特征包括几何校准,照明校准和光学校准。 根据本方法校准的成像装置可用于生成具有一致属性(例如亮度)的图像,而不管采用何种成像装置。