Abstract:
A semiconductor device has a multilayer comprising a refractory metal silicide and a metal nitride on a silicon layer. The metal nitride prevents the silicon layer from being oxidized so that a good ohmic contact is obtained. A method of manufacturing the semniconductor device comprises steps of forming a polysilicon layer, implanting impurity ions into the polysilicon, removing a self oxidation film from the polysilicon layer, sequentially forming refractory metal and its nitride, patterning, and silicifying the metal. The method provides a semiconductor device having a good ohmic contact, a reduced resistivity of interconnections and high reliability.
Abstract:
A method of manufacturing a semiconductor device, comprises the process of forming first and second well regions, which are of N-type and P-type, respectively, in a silicon body, forming a base layer of P-type in the first well region, forming an emitter layer of N-type in the base layer, forming source and drain layers of N-type in the second well region, forming a polysilicon emitter electrode on the emitter layer, and ion-implanting impurities of N-type into an interface between the emitter layer and the emitter electrode, so as to break down an insulative layer at the interface.
Abstract:
A method of manufacturing a semiconductor device comprises the steps of forming a gate electrode on a silicon substrate of a p-conductivity type and source and in the drain regions of an n-conductivity type substrate so as to interpose the gate electrode therebetween; depositing silicon on the source and drain regions to form a polysilicon wiring layer; and ion-implanting an impurity to an interface between the source and drain regions and the polysilicon wiring layer at acceleration voltage of 40 keV and a dose of 5.times.10.sup.15 cm.sup.-2 to mechanically break down an oxide film formed at said interface.
Abstract translation:一种制造半导体器件的方法包括以下步骤:在p导电类型的硅衬底上形成栅电极,并在n导电型衬底的漏极区域中形成栅电极,以将栅电极插入其间; 在源极和漏极区上沉积硅以形成多晶硅布线层; 并且在40keV的加速电压和5×10 15 cm -2的剂量下将杂质离子注入到源极和漏极区域和多晶硅布线层之间的界面上,以机械地分解形成在所述界面处的氧化膜。
Abstract:
There is disclosed a method of manufacturing a semiconductor device comprising the steps of forming a polysilicon film on a semiconductor substrate through an oxidation film, forming a mask of a predetermined pattern on the polysilicon film, forming a molybdenum film on the polysilicon film, and silicifying those regions of said molybdenum film not covered by the mask so that a structure of the uncovered molybdenum film regions and those regions of the polysilicon film located under the uncovered molybdenum regions have low resistance, while a region of the molybdenum film covered by the mask has high resistance.
Abstract:
A low temperature sinterable oxide magnetic material prepared by adding 0.1 to 5% by weight of glass containing 3 to 50 mol % of Li.sub.2 O, 10 to 97 mol % of B.sub.2 O.sub.3 and 0 to 70 mol % of SiO.sub.2 to ferrite containing at least 0.5 mol % of Li.sub.2 O. Especially, when a glass containing 10-28 mol % of Li.sub.2 O, 34 to 66 mol % of B.sub.2 O.sub.3, and 15 to 45 mol % of SiO.sub.2 is used, the sintering temperature can be reduced to about 1,000.degree. C. or less.
Abstract:
The present invention relates to a slotless, brushless motor comprising a permanent magnet rotor rotationary together with a shaft and a stationary armature coil disposed in opposition to the rotor.The armature coil comprises a coil portion concentrically wound, an adjacent coil portion formed in sequence from the coil portion and concentrically wound, a coil performed on a plane by a plurality of the coil portions, N coils (N is integer) laid on each other and different in a phase respectively, sheets disposed between said N coils and a supporting member supporting the coils and the sheets made integral.