公开(公告)号：US20210318361A1

公开(公告)日：2021-10-14

申请号：US17227215

申请日：2021-04-09

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  Josiah A. Bartlett

IPC: G01R19/00 ,  G01R31/319 ,  G01R31/30

Abstract: An isolated differential current shunt measurement probe for a test and measurement system having an isolation barrier between an input side and output side of the probe. The input side is configured to receive a voltage signal across a current shunt connected to a device under test and transmit the voltage signal across the isolation barrier. The output side is configured to receive the voltage signal across the isolation barrier and output the voltage signal to a test and measurement instrument.

公开(公告)号：US11079408B2

公开(公告)日：2021-08-03

申请号：US16165928

申请日：2018-10-19

Applicant: Tektronix, Inc.

Inventor： Julie A. Campbell ,  Josiah A. Bartlett

IPC: G01R1/067

Abstract: A test-probe tip having a tip component, a resistive element, and a compliance member. The tip component is configured to electrically connect to a device under test at a first end of the tip component. The resistive element is electrically connected to a second end of the tip component along a signal-flow axis. The resistive element is configured to provide electrical impedance to an electrical signal passing through the resistive element. The compliance member is configured to allow movement of the tip component in a first direction when a mechanical force applied to the tip component in the first direction and to cause movement of the tip component in an opposite, second direction when the mechanical force applied to the tip component is removed or reduced. Architectures for the resistive element are also described.