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公开(公告)号：US12235291B2
公开(公告)日：2025-02-25
申请号：US17227215
申请日：2021-04-09
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Josiah A. Bartlett
IPC: G01R19/00 , G01R31/30 , G01R31/319
Abstract: An isolated differential current shunt measurement probe for a test and measurement system having an isolation barrier between an input side and output side of the probe. The input side is configured to receive a voltage signal across a current shunt connected to a device under test and transmit the voltage signal across the isolation barrier. The output side is configured to receive the voltage signal across the isolation barrier and output the voltage signal to a test and measurement instrument.
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公开(公告)号：US20240339742A1
公开(公告)日：2024-10-10
申请号：US18613687
申请日：2024-03-22
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim
Abstract: A broadband balun structure has a single-ended port, a balanced port, a first transmission line connected between the single-ended port and one side of the balanced port, and a second transmission line connected to the other side of the balanced port, the first transmission line positioned to allow coupling of a first portion of the first transmission line simultaneously to both a second portion of the first transmission line and a portion of the second transmission line. A broadband balun structure includes a 180° hybrid using coupled-line structures, and a phase-shift network using coupled-line structures, the coupled-line structures positioned to couple at least one line section simultaneously to two other line sections. A test and measurement system and a test and measurement instrument, and at least one balun structure.
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3.发明公开公开(公告)号：US20240027497A1
公开(公告)日：2024-01-25
申请号：US18353638
申请日：2023-07-17
Applicant: Tektronix, Inc.
Inventor： Andy K. Lim , Daniel G. Knierim
CPC classification number: G01R13/0218 , G01R13/029 , G06T1/20
Abstract: A test and measurement instrument has an acquisition system to receive and digitize a batch of waveforms into a batch of digitized waveforms, a memory configured as a raster plane having rows and columns, a graphics processing unit (GPU) capable of processing multiple threads to rasterize the batch of digitized waveforms to the raster plane to form a batch histogram and to group multiple threads into groups of a first type of group, assign each thread group of the first type of group to one column in the raster plane, execute a common instruction per thread group of the first type to populate the raster plane, and transfer the batch histogram upon completion, and a central processing unit (CPU) to receive the batch histogram from the GPU, and display a map of the batch histogram on a display.
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公开(公告)号：US11808786B2
公开(公告)日：2023-11-07
申请号：US17716435
申请日：2022-04-08
Applicant: TEKTRONIX, INC.
Inventor： Julie A. Campbell , Daniel G. Knierim , Barton T. Hickman
CPC classification number: G01R1/0416 , G01R1/0466 , G01R27/28
Abstract: An apparatus has at least substrate having at least two conductive paths, a least two connectors positioned in a first plane, and a movable stage connected to one of the at least one substrate to move the one substrate perpendicular to the first plane form an electrically conductive path between two of the at least two connectors.
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公开(公告)号：US11372025B2
公开(公告)日：2022-06-28
申请号：US17317841
申请日：2021-05-11
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Barton T. Hickman , Joshua J. O'Brien
IPC: G01R13/02 , H03K5/00 , H03L7/08 , G01R31/319
Abstract: A system includes a plurality of oscilloscopes, each oscilloscope having an output port and an input port, a cable connecting the output port of an initial oscilloscope of the plurality of oscilloscopes to the input port of a second oscilloscope of the plurality of oscilloscopes, the initial oscilloscope having a processing element to generate a master run clock, the second oscilloscope having a processing element including a phase-locked loop to lock a slave run clock to the master run clock, wherein the processing element of one of the oscilloscopes executes code to cause the processing element to manipulate one of the run clocks to pass trigger information to another of the plurality of oscilloscopes. A method of synchronizing at least two oscilloscopes including a master oscilloscope and at least one slave oscilloscope includes connecting the at least two oscilloscopes together using output ports and input ports of the at least two oscilloscopes and at least one cable; sending a master run clock from the master oscilloscope to at least one slave oscilloscope; synchronizing a run clock of the at least one slave oscilloscope to the master run clock; recognizing a trigger event at a first oscilloscope of the at least two oscilloscopes; altering the run clock at the first oscilloscope to encode a trigger indication; and receiving the altered run clock at a second oscilloscope of the at least two oscilloscopes, wherein the trigger indication causes the second oscilloscope to recognize the trigger event.
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Patent Agency Ranking
公开(公告)号：US20210148951A1
公开(公告)日：2021-05-20
申请号：US17099701
申请日：2020-11-16
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Josiah A. Bartlett , Amr Haj-Omar , Donald J. Dalebroux , Barton T. Hickman , Alexander Krauska
Abstract: An accessory device has a test port, an instrument port to connect to an instrument having an operating bandwidth, and one or more configurable signal paths connectable between the test port and the instrument port to convert a signal from the test port having a first frequency range to a signal having a second frequency range different than the first frequency range. A test and measurement system has a test and measurement instrument having an operating bandwidth, and an accessory device. The accessory device has a first instrument port to connect the accessory device to the test and measurement instrument, a test port to connect the accessory device to a device under test, and one or more configurable signal paths connectable between the test port and the instrument port to down-convert a signal from the test port having a first frequency range to a signal having a second frequency range lower than the first frequency range.
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公开(公告)号：US20200212922A1
公开(公告)日：2020-07-02
申请号：US16526875
申请日：2019-07-30
Applicant: Tektronix, Inc.
Inventor： Karen Hovakimyan , Gregory A. Martin , Daniel G. Knierim
Abstract: A time-interleaved digital-to-analog converter system, comprising a digital pre-distorter configured to receive an input digital signal and an error signal and output a distorted digital signal based on the input digital signal and the error signal; a time-interleaved digital-to-analog converter having a first sample rate, the time-interleaved digital-to-analog converter configured to convert the distorted digital signal to an analog signal; and a calibration system. The calibration system includes an analog-to-digital converter having a second sample rate equal to or lower than the first sample rate, the analog-to-digital converter configured to receive the analog signal and covert the analog signal to a down-sampled digital signal, a discrete-time linear model configured to receive the input digital signal and the error signal and output a model signal, and a combiner to subtract the down-sampled digital signal from the model signal to generate the error signal.
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公开(公告)号：US20170227581A1
公开(公告)日：2017-08-10
申请号：US15395593
申请日：2016-12-30
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , David L. Kelly , Patrick A. Smith
IPC: G01R13/02
CPC classification number: G01R13/0254 , G01R13/0245
Abstract: This disclosure relates generally to test and measurement instruments structured to detect that a series of events occurred, and structured to generate a trigger signal in response to detecting that a final event in the series of events occurred. The trigger may be generated based on a timeout signal, or based on another event, trigger, or signal. Stored data in the acquisition memory may be marked relative to the detection of the final event. An external forced timeout signal may control which in a series of events is marked as a final event. The triggering on final event may be enabled after another trigger is satisfied, and may be used as one of many different types of triggers.
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公开(公告)号：US20170201239A1
公开(公告)日：2017-07-13
申请号：US14995008
申请日：2016-01-13
Applicant: Tektronix, Inc.
Inventor： Patrick A. Smith , Daniel G. Knierim
Abstract: Methods of triggering a test and measurement instrument having a plurality of inputs include the step of generating a trigger signal in response to every occurrence of any one of a plurality of specified trigger events. A first specified trigger event occurs in at least a first one of the inputs and a second specified trigger event occurs in at least a second one of the plurality of inputs. A specified trigger event may include at least one selected input from the plurality of inputs and a selected activity type. Some methods include configuring each of a plurality of event activity detectors to produce a pulse in a logic signal in response to every occurrence of one of the specified trigger events. The plurality of logic signals are combined in a logical OR circuit to generate the trigger signal. Trigger circuits configured according to these methods are also disclosed.
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公开(公告)号：US20160077128A1
公开(公告)日：2016-03-17
申请号：US14949562
申请日：2015-11-23
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , William A. Hagerup , Barton T. Hickman , Ira G. Pollock
CPC classification number: G01R1/06788 , G01R1/06766 , G01R1/06794 , G01R31/024 , G01R31/026
Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.
Abstract translation: 测试系统可以包括适于耦合在测试测量设备和被测设备（DUT）之间的探头。 探头可以包括用于从DUT接收有效信号的信号输入和用于向测试测量装置提供有源信号的信号输出。 探头还可以包括一个连接到DUT地的输入接地和一个连接到测试测量设备地的输出地。 探头接地连接检查装置可以自动确定探头接地与DUT接地和测试测量设备接地是否牢固。
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