公开(公告)号：US07623627B2

公开(公告)日：2009-11-24

申请号：US12369062

申请日：2009-02-11

Applicant: Yoshiki Matoba

Inventor： Yoshiki Matoba

IPC: G01N23/201

CPC classification number: G01N23/223 ,  G01N2223/076

Abstract: Provided are an X-ray analysis apparatus and an X-ray analysis method, in which a measurer can judge an area incapable of being analyzed in a sample with a concave-convex portion. The X-ray analysis apparatus includes: an X-ray tubular bulb for irradiating an arbitrary irradiation point located on the sample with a radiation beam; an X-ray detector for detecting a characteristic X-ray and a scattered X-ray radiated from the sample and outputting a signal containing energy information on the characteristic X-ray and the scattered X-ray; a narrow-range illumination mechanism and a wide-range illumination mechanism for emitting an illumination light to the sample to illuminate the sample; and a narrow-range observation mechanism and a wide-range observation mechanism for obtaining an illumination image of the sample, which is illuminated with the illumination light, as image data, in which the narrow-range observation mechanism and the wide-range observation mechanism include a narrow-range oblique illumination section and a wide-range oblique illumination section, respectively, in which an optical axis of the illumination light at a time of the illuminating is set toward the irradiation point in the same direction as a direction linking the irradiation point with the X-ray detector at a time of the detecting.

Abstract translation: 提供了一种X射线分析装置和X射线分析方法，其中测量器可以判断在具有凹凸部分的样品中不能分析的区域。 X射线分析装置包括：X射线管状灯泡，用于用辐射束照射位于样品上的任意照射点; 用于检测从样本辐射的特征X射线和散射X射线的X射线检测器，并输出包含关于特征X射线和散射X射线的能量信息的信号; 窄范围照明机构和用于向样品发射照明光以照射样品的宽范围照明机构; 以及用于获得被照明光照射的样本的照明图像的窄范围观察机构和宽范围观察机构作为图像数据，其中窄范围观察机构和广范围观察机构 包括窄范围倾斜照明部分和宽范围倾斜照明部分，其中在照射时将照明时的照明光的光轴设置成与照射的方向相同的方向 在检测时与X射线检测器指向。

公开(公告)号：US07587025B2

公开(公告)日：2009-09-08

申请号：US11972337

申请日：2008-01-10

Applicant: Takayuki Fukai ,  Yoshiki Matoba ,  Kiyoshi Hasegawa

Inventor： Takayuki Fukai ,  Yoshiki Matoba ,  Kiyoshi Hasegawa

IPC: G01N23/201

CPC classification number: G01N23/223 ,  G01N2223/076

Abstract: In an X-ray analysis apparatus and an X-ray analysis method, a quantitative analysis is stably performed by stably behaving an X-ray source. There are possessed an X-ray tubular bulb irradiating a primary X-ray to a sample, a primary X-ray adjustment mechanism capable of adjusting an intensity of the primary X-ray, an X-ray detector detecting a characteristic X-ray radiated from the sample, thereby outputting a signal including energy informations of the characteristic X-ray and a scattered X-ray, an analyzer analyzing the above signal, and an incident X-ray adjustment mechanism disposed between the sample and the X-ray detector, and capable of adjusting a total intensity of the characteristic X-ray and the scattered x-ray, which are entered to the X-ray detector.

Abstract translation: 在X射线分析装置和X射线分析方法中，通过稳定地进行X射线源的稳定地进行定量分析。 具有照射原始X射线的X射线管状灯管，能够调整主X射线强度的主X射线调整机构，检测特征X射线的X射线检测器 从样品输出包括特征X射线和散射X射线的能量信息的信号，分析上述信号的分析仪和设置在样品和X射线检测器之间的入射X射线调节机构， 并且能够调整输入到X射线检测器的特征X射线和散射X射线的总强度。

公开(公告)号：US07529337B2

公开(公告)日：2009-05-05

申请号：US11820893

申请日：2007-06-21

Applicant: Yoshiki Matoba ,  Kiyoshi Hasegawa ,  Takayuki Fukai

Inventor： Yoshiki Matoba ,  Kiyoshi Hasegawa ,  Takayuki Fukai

IPC: G01N23/223

CPC classification number: G01N23/223 ,  G01N2223/076

Abstract: To provide an energy dispersion type radiation detecting system and a method of measuring a content of an object element capable of carrying out a measurement by determining an intensity of an incidence radiation to constitute an optimum minimum limit of detection by restraining an influence of a pile up, the energy dispersion type radiation detecting system includes an incidence system of irradiating the incidence radiation to a sample by a predetermined intensity, a detection system of detecting a radiation emitted from the sample by irradiating the incidence radiation for specifying a content of an object element of the sample based on a spectrum of the detected radiation, and the energy dispersion type radiation detecting system includes a control portion capable of irradiating the incidence radiation by an optimum intensity by determining the optimum intensity of the incidence radiation minimizing a minimum limit of detection of the object element based on the spectrum of the detected radiation.

Abstract translation: 为了提供一种能量分散型放射线检测系统和一种能够通过确定入射辐射的强度来测量能够进行测量的物体的内容的方法，以通过抑制堆积的影响来构成最佳的最小检测极限 能量分散型放射线检测系统包括：将入射辐射照射到样品预定强度的入射系统;检测系统，用于通过照射入射辐射来检测从样品发射的辐射，用于指定对象元素的内容 基于检测到的辐射的光谱的样本和能量色散型辐射检测系统包括能够通过确定入射辐射的最佳强度来最大限度地将入射辐射最小化的最佳强度来照射入射辐射的控制部分， 基于dete的光谱的对象元素 电晕辐射。

公开(公告)号：US07428293B2

公开(公告)日：2008-09-23

申请号：US11729247

申请日：2007-03-28

Applicant: Takayuki Fukai ,  Yoshiki Matoba

Inventor： Takayuki Fukai ,  Yoshiki Matoba

IPC: G01N23/223 ,  G21K1/02

CPC classification number: G01N23/223 ,  G01N33/02 ,  G01N2223/076

Abstract: There is provided a fluorescent X-ray analysis apparatus in which a detection lower limit has been improved by reducing an X-ray generating subsidiarily and detected. The fluorescent X-ray analysis apparatus is one which possesses an X-ray source irradiating a primary X-ray, and a detector in which a collimator having a through-hole in its center part has been placed in a front face, and in which, by the detector, there is detected a primary fluorescent X-ray which generates from a sample by irradiating the primary X-ray to a sample, and passes through the through-hole of the collimator. The X-ray source and the detector are disposed while adjoining the sample, and an irradiated face of the X-ray source or the detector, to which a primary scattered ray having generated by the fact that the primary X-ray scatters in the sample and the primary fluorescent X-ray having generated from the sample are irradiated, is covered by a secondary X-ray reduction layer reducing a secondary scattered ray and a secondary fluorescent X-ray, which generate by irradiations of the primary scattered ray and the primary fluorescent X-ray.

Abstract translation: 提供了一种荧光X射线分析装置，其中通过减少辅助地产生X射线并检测到已经提高了检测下限。 荧光X射线分析装置是具有照射初级X射线的X射线源的荧光X射线分析装置和其中央部具有贯通孔的准直仪被放置在正面的检测器，其中 通过检测器检测到通过对样品照射主X射线从样品产生并通过准直器的通孔的初级荧光X射线。 X射线源和检测器在邻接样品的同时被设置，X射线源或检测器的被照射的面由主要X射线散布在样品中而产生的主要散射光线 并且从样品产生的初级荧光X射线被照射的二次X射线减少层被减少通过一次散射光和初级荧光体的照射产生的二次散射光和次级荧光X射线的次级X射线减少层覆盖 荧光X射线。

公开(公告)号：US20070274441A1

公开(公告)日：2007-11-29

申请号：US11805665

申请日：2007-05-24

Applicant: Takayuki Fukai ,  Yoshiki Matoba ,  Masanori Takahashi

Inventor： Takayuki Fukai ,  Yoshiki Matoba ,  Masanori Takahashi

IPC: G01N23/223 ,  G01T1/36

CPC classification number: G01N23/223 ,  G01N2223/076 ,  G01N2223/618 ,  G01N2223/635 ,  G01N2223/639

Abstract: To provide a fluorescent X-ray analysis apparatus, whereby a peak-back ratio is improved by effectively exciting a focused element and a detection limit of the focused element is improved by decreasing a scattered X-ray to be a background. A sample housing has one or more wall surfaces made of a material through which an X-ray transmits and an X-ray source is arranged so that a primary X-ray is irradiated on the wall surface. In addition, the sample housing is arranged so that a wall surface different from a wall surface on which the primary X-ray is irradiated is opposed to an X-ray detector incident window. Further, the primary X-ray from the X-ray source is arranged so as to be able to irradiate the wall surface of the sample housing to which the X-ray detector incident window is opposed. The sample housing has a shape extending in response to extension of a viewing filed that a detection element in the X-ray detector is seen from the X-ray detector incident window. In addition, on the wall of the sample housing, a metal for secondarily exciting the focused element is arranged on an area other than an area through which the primary X-ray transmits and an area where the fluorescent X-ray from the focused element passes to the detector.

Abstract translation: 为了提供一种荧光X射线分析装置，通过有效地激发聚焦元件来提高峰回比，并且通过将散射的X射线减少为背景来提高聚焦元件的检测极限。 样品壳体具有一个或多个由X射线透过的材料制成的壁表面，并且X射线源被布置成使得主壁X射线照射在壁表面上。 另外，样品壳体被布置成使得不同于其上照射有初级X射线的壁表面的壁表面与X射线检测器入射窗口相对。 此外，来自X射线源的主要X射线被布置成能够照射X射线检测器入射窗口相对的样品壳体的壁表面。 样品壳体具有响应于从X射线检测器入射窗看到X射线检测器中的检测元件的观察区域的延伸而延伸的形状。 此外，在样品壳体的壁上，用于次要激发聚焦元件的金属被布置在除了主X射线透射的区域之外的区域和来自聚焦元件的荧光X射线通过的区域 到检测器。

公开(公告)号：US20070269004A1

公开(公告)日：2007-11-22

申请号：US11799992

申请日：2007-05-03

Applicant: Yoshiki Matoba ,  Takayuki Fukai ,  Masanori Takahashi ,  Yutaka Ikku

Inventor： Yoshiki Matoba ,  Takayuki Fukai ,  Masanori Takahashi ,  Yutaka Ikku

IPC: G01N23/223 ,  G01T1/36

CPC classification number: G01N23/223 ,  G01N2223/076

Abstract: A sample sealing vessel 8 includes a plurality of wall faces comprising a material for transmitting X-ray, an X-ray source 1 is arranged at a wall face 11 to irradiate primary X-ray, a face 12 different from the face irradiated with the primary X-ray is arranged to be opposed to an X-ray detector 10, and the primary X-ray from the X-ray source 1 is arranged to be able to irradiate the wall face 12 of the sample sealing vessel to which the X-ray detector 10 is opposed.

Abstract translation: 样品密封容器8包括多个壁面，其包括用于透射X射线的材料，X射线源1设置在壁面11处以照射主X射线，不同于被照射的面的面12 初级X射线被配置为与X射线检测器10相对，并且来自X射线源1的主X射线被布置成能够照射样品密封容器的壁面12，X射线 射线检测器10相对。