摘要:
A memory card includes a non-volatile memory; and a power management unit for receiving an external supply voltage to supply an operating voltage to the non-volatile memory. The power management unit boosts/bypasses the external supply voltage based on whether the external supply voltage is lower than a detection voltage and then outputs the boosted/bypassed voltage as the operating voltage of the non-volatile memory.
摘要:
A method of programming a multilevel cell flash memory includes dividing a memory cell array of the flash memory into a user block and a cache block, programming first LSB data into a page of the user block, programming first MSB data into the page of the user block after programming the first LSB data, programming second LSB data into a page of the cache block, and storing control data for controlling the flash memory in the cache block.
摘要:
A memory card includes a non-volatile memory; and a power management unit for receiving an external supply voltage to supply an operating voltage to the non-volatile memory. The power management unit boosts/bypasses the external supply voltage based on whether the external supply voltage is lower than a detection voltage and then outputs the boosted/bypassed voltage as the operating voltage of the non-volatile memory.
摘要:
A semiconductor memory device having a word line enable sensing block for driving sense amplifiers only when a word line is enabled. In this way, an enable time point of the sense amplifiers is controlled according to variations in operating conditions such as a temperature, process, voltage and size of a memory cell. In addition, the semiconductor memory device can embody an embedded memory logic.
摘要:
The present invention relates to a semiconductor memory device; and, more particular, to DRAM and SRAM having a common pin for address and data signals. A semiconductor memory circuit in accordance with the present invention has at least one common signal input terminal for receiving data signals and address signals, wherein the common signal input terminal is coupled to a plurality signal paths and a signal path selector for selecting one of the plurality signal paths in response to a write enable signal, a read enable and a control signal from a memory controller. The signal path selector has a plurality of buffers on the signal paths and the signal path selector selects one of the buffers in response to a write enable signal, a read enable and a control signal from a memory controller.
摘要:
A repair circuit of a semiconductor memory device includes a programming circuit operating independently from a high voltage supply, to replace a defective cell with a redundant cell using an anti-fuse, by generating a repair value based on an address signal being input to the memory device. The repair circuit includes an operation switch having an output for outputting a charge voltage in response to a charge/discharge signal; at least one programming circuit of a series connection of an anti-fuse and a transistor, connected between the output of the operation switch and ground, to set a programmed state of the anti-fuse according to the address signal; a supply for an externally generating a high voltage to the anti-fuse of the programming circuit; a first buffer, connected between the programming circuit and the operation switch, to transmit the charge voltage output to the programming circuit and to block the externally generated high voltage supplied to the programming circuit; a second buffer, connected between the programming circuit and the high-voltage supply, to transmit the externally generated high voltage and to block the charge voltage output to the programming circuit; and an output unit to output the repair value, the repair value being indicative of the programmed state set by the programming circuit. A bank selector may be connected between the programming circuit and ground, to select one bank of anti-fuses in response to a block address signal.