BASELINE SIGNAL CALCULATION
    47.
    发明申请

    公开(公告)号:US20220196503A1

    公开(公告)日:2022-06-23

    申请号:US17128676

    申请日:2020-12-21

    Abstract: A baseline unit for use in a sensor system, the sensor system comprising N force sensors which output N sensor signals, respectively, where N≥1, the baseline unit configured to: monitor a measure of a rate of change of a sensor test signal, the sensor test signal being one of said N sensor signals or a signal derived from one or more of said N sensor signals; and in dependence upon the measure of the rate of change, control a stored baseline setting to control how a baseline test signal is calculated from said N sensor signals using a baseline-calculation method, the baseline-calculation method configured by the currently-stored baseline setting.

    SENSOR SIGNAL CORRECTION
    48.
    发明申请

    公开(公告)号:US20220155900A1

    公开(公告)日:2022-05-19

    申请号:US17097384

    申请日:2020-11-13

    Abstract: A correction unit for use in a sensor system, the sensor system comprising a force sensor configured to output a sensor signal indicative of a temporary mechanical distortion of a material under an applied force, the correction unit configured, based on the sensor signal, to: estimate an effect of the applied force on how the material will return towards an undistorted form upon a substantial reduction or removal of the applied force; and generate a corrected signal based on the estimation.

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