公开(公告)号：US20140113229A1

公开(公告)日：2014-04-24

申请号：US14119430

申请日：2012-07-24

申请人： Yutaka Tani ,  Masao Nakano ,  Takayuki Ujifusa ,  Taichi Shintou ,  Kaoru Takahashi ,  Satoshi Saito ,  Takayuki Toyoda ,  Takeshi Miyazaki ,  Masashi Hirose

发明人： Yutaka Tani ,  Masao Nakano ,  Takayuki Ujifusa ,  Taichi Shintou ,  Kaoru Takahashi ,  Satoshi Saito ,  Takayuki Toyoda ,  Takeshi Miyazaki ,  Masashi Hirose

IPC分类号： G03G9/09 ,  G03G9/08

CPC分类号： G03G9/09 ,  G03G9/0804 ,  G03G9/0806 ,  G03G9/0916 ,  G03G9/092

摘要： An object of the present invention is to provide a magenta toner having high dispersibility of a colorant and good spectral characteristics.A magenta toner includes a magenta toner particle including at least a binder resin, a compound represented by the formula (1), and a colorant, wherein the colorant includes a pigment having a quinacridone skeleton: (wherein R1 and R2 each independently represent a hydrogen atom, an alkyl group, an aryl group, or an aralkyl group.)

摘要翻译： 本发明的目的是提供一种具有高着色剂分散性和良好光谱特性的品红色调色剂。 品红色调色剂包括至少包含粘合剂树脂，式（1）表示的化合物和着色剂的品红色调色剂颗粒，其中着色剂包括具有喹吖啶酮骨架的颜料：（其中R 1和R 2各自独立地表示氢 原子，烷基，芳基或芳烷基。）

公开(公告)号：US5024570A

公开(公告)日：1991-06-18

申请号：US403355

申请日：1989-09-06

申请人： Tadashi Kiriseko ,  Hiromichi Tani ,  Noriko Soma ,  Nobuhisa Shigemi ,  Takayuki Toyoda

发明人： Tadashi Kiriseko ,  Hiromichi Tani ,  Noriko Soma ,  Nobuhisa Shigemi ,  Takayuki Toyoda

IPC分类号： B65H85/00 ,  H01L21/00 ,  H01L21/677

CPC分类号： H01L21/67173 ,  H01L21/67276 ,  H01L21/67294 ,  H01L21/67727 ,  Y10S414/135 ,  Y10S414/137 ,  Y10S414/14

摘要： A continuous semiconductor substrate processing system is operated by a system control structure in accordance with a predetermined processing program. A wafer conveying mechanism conveys wafers to and from each of plural process stations, each of which performs a corresponding process step on semiconductor wafers, to and from a stocker and to and from an inspection unit. Carriers, movable by manual or mechanical structure other than the wafer conveying mechanism, provide for alternative conveying of wafers to and from each of the process stations, the stocker and the inspection station. The system control structure monitors and selectively controls each of the wafer conveying mechanism, the process stations and the stocker and issues instructions for movement of the carriers and monitors the positioning of carriers for selective control of the transfer of wafers and the priority sequence of processing of wafers, to maintain continuous performance of plural process steps on plural lots of semiconductor wafers.